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LL101A

Description
Rectifier Diode, Schottky, 1 Element, 60V V(RRM), Silicon, DO-213AA, GLASS, MINIMELF-2
Categorydiode    Rectifier diode   
File Size282KB,3 Pages
ManufacturerExcel(Suzhou) Semiconductor Co., Ltd.
Websitehttp://www.excel-semi.com/
Download Datasheet Parametric View All

LL101A Overview

Rectifier Diode, Schottky, 1 Element, 60V V(RRM), Silicon, DO-213AA, GLASS, MINIMELF-2

LL101A Parametric

Parameter NameAttribute value
MakerExcel(Suzhou) Semiconductor Co., Ltd.
package instructionO-LELF-R2
Reach Compliance Codeunknown
ECCN codeEAR99
Is SamacsysN
Other featuresHIGH RELIABILITY
Shell connectionISOLATED
ConfigurationSINGLE
Diode component materialsSILICON
Diode typeRECTIFIER DIODE
Maximum forward voltage (VF)0.41 V
JEDEC-95 codeDO-213AA
JESD-30 codeO-LELF-R2
Maximum non-repetitive peak forward current2 A
Number of components1
Number of terminals2
Maximum operating temperature150 °C
Package body materialGLASS
Package shapeROUND
Package formLONG FORM
Maximum power dissipation0.4 W
Maximum repetitive peak reverse voltage60 V
Maximum reverse recovery time0.001 µs
surface mountYES
technologySCHOTTKY
Terminal formWRAP AROUND
Terminal locationEND
Base Number Matches1

LL101A Preview

Download Datasheet
LL101A/LL101B/LL101C
Schottky Barrier Diode
Features
1. Small surface mounting type.
2. High reliability.
3. Low reverse current and low forward voltage.
4. This diode is also available in the DO-35 case
with type designation SD101A, B, C.
Applications
HF-Detector, protection circuit, small battery charger,
power supplies, DC/DC converter for notebooks, etc.
Absolute Maximum Ratings
T
j
=25℃
Parameter
Peak inverse voltage
Test Conditions
Type
LL101A
LL101B
LL101C
Maximum single cycle surge
10
μS
square wave
Power dissipation
Storage temperature range
T
amb
=25℃
Symbol
V
RRM
V
RRM
V
RRM
I
FSM
P
V
T
stg
Value
60
50
40
2
400
-55~+150
Unit
V
V
V
A
mW
Stresses exceeding maximum ratings may damage the device. Maximum ratings are stress ratings only. Functional operation above the
recommended operating conditions is not implied. Extended exposure to stresses above the recommended operating conditions may
affect device reliability.
Excel Semiconductor
www.excel-semi.com
FaxBack +86-512-67606917
Rev. 3g, 1-Sep-2009
1/3
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