EEWORLDEEWORLDEEWORLD

Part Number

Search

EN29F512-70PCP

Description
Flash, 64KX8, 70ns, PDIP32, DIP-32
Categorystorage    storage   
File Size427KB,35 Pages
ManufacturerESMT
Websitehttp://www.esmt.com.tw/
Environmental Compliance
Elite Semiconductor Memory Technology Inc. (ESMT) is a professional IC design company founded by Dr. Hu Zhao in June 1998. Its headquarters is located in Hsinchu Science Park, Taiwan. The company's main business includes research, development, manufacturing, sales and related technical services of IC products. It was listed on the Taiwan Stock Exchange in March 2002.
Download Datasheet Parametric View All

EN29F512-70PCP Overview

Flash, 64KX8, 70ns, PDIP32, DIP-32

EN29F512-70PCP Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
MakerESMT
package instructionDIP, DIP32,.6
Reach Compliance Codeunknown
Maximum access time70 ns
command user interfaceYES
Data pollingYES
JESD-30 codeR-PDIP-T32
length41.91 mm
memory density524288 bit
Memory IC TypeFLASH
memory width8
Number of functions1
Number of departments/size4
Number of terminals32
word count65536 words
character code64000
Operating modeASYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize64KX8
Package body materialPLASTIC/EPOXY
encapsulated codeDIP
Encapsulate equivalent codeDIP32,.6
Package shapeRECTANGULAR
Package formIN-LINE
Parallel/SerialPARALLEL
power supply5 V
Programming voltage5 V
Certification statusNot Qualified
Department size16K
Maximum standby current0.000005 A
Maximum slew rate0.03 mA
Maximum supply voltage (Vsup)5.5 V
Minimum supply voltage (Vsup)4.5 V
Nominal supply voltage (Vsup)5 V
surface mountNO
technologyCMOS
Temperature levelCOMMERCIAL
Terminal formTHROUGH-HOLE
Terminal pitch2.54 mm
Terminal locationDUAL
switch bitYES
typeNOR TYPE
width15.24 mm

EN29F512-70PCP Preview

EN29F512
EN29F512
512 Kbit (64K x 8-bit) 5V Flash Memory
FEATURES
5.0V operation for read/write/erase
operations
Fast Read Access Time
- 45ns, 55ns, 70ns, and 90ns
-
-
-
-
Sector Architecture:
4 uniform sectors of 16Kbytes each
Supports full chip erase
Individual sector erase supported
Sector protection:
Hardware locking of sectors to prevent
program or erase operations within
individual sectors
High performance program/erase speed
Byte program time: 7µs typical
Sector erase time: 300ms typical
Chip erase time: 1.5s typical
JEDEC Standard program and erase
commands
JEDEC standard
DATA
polling and toggle
bits feature
Single Sector and Chip Erase
Sector Unprotect Mode
Embedded Erase and Program Algorithms
Erase Suspend / Resume modes:
Read and program another Sector during
Erase Suspend Mode
0.23 µm triple-metal double-poly
triple-well CMOS Flash Technology
Low Vcc write inhibit < 3.2V
100K endurance cycle
Package Options
- 32-pin PDIP
- 32-pin PLCC
- 32-pin 8mm x 20mm TSOP (Type 1)
- 32-pin 8mm x 14mm TSOP (Type 1)
Commercial and Industrial Temperature
Ranges
-
-
-
Low Standby Current
- 1µA CMOS standby current-typical
- 1mA TTL standby current
Low Power Active Current
- 12mA typical active read current
- 30mA program/erase current
GENERAL DESCRIPTION
The EN29F512 is a 512-Kbit, electrically erasable, read/write non-volatile flash memory. Organized
into 64K bytes with 8 bits per byte, the 512K of memory is arranged in four uniform sectors of
16Kbytes each. Any byte can be programmed typically in 7µs. The EN29F512 features 5.0V
voltage read and write operation, with access times as fast as 45ns to eliminate the need for WAIT
states in high-performance microprocessor systems.
The EN29F512 has separate Output Enable (
OE
), Chip Enable (
CE
), and Write Enable (
W E
)
controls, which eliminate bus contention issues. This device is designed to allow either single
Sector or full chip erase operation, where each Sector can be individually protected against
program/erase operations or temporarily unprotected to erase or program. The device can sustain a
minimum of 100K program/erase cycles on each Sector.
This Data Sheet may be revised by subsequent versions
1
or modifications due to changes in technical specifications.
©2003 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. A, Issue Date: 2003/10/20
EN29F512
TABLE 1. PIN DESCRIPTION
Pin Name
A0-A16
DQ0-DQ7
Function
Addresses
Data Inputs/Outputs
Chip Enable
Output Enable
Write Enable
Supply Voltage
(5V
±
10% )
Ground
Vss
A0 - A15
EN29F512
16
8
DQ0 - DQ7
FIGURE 1. LOGIC DIAGRAM
Vcc
CE
OE
WE
Vcc
Vss
CE
OE
WE
TABLE 2. SECTOR ARCHITECTURE
Sector
3
2
1
0
ADDRESSES
0C000h – 0FFFFh
08000h – 0BFFFh
04000h - 07FFFh
00000h - 03FFFh
SIZE (Kbytes)
16
16
16
16
A15
1
1
0
0
A14
1
0
1
0
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
2
©2003 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. A, Issue Date: 2003/10/20
EN29F512
BLOCK DIAGRAM
Vcc
Vss
Block Protect Switches
DQ0-DQ7
Erase Voltage Generator
State
Control
Program Voltage
Generator
Chip Enable
Output Enable
Logic
STB
Input/Output Buffers
WE
Command
Register
CE
OE
Data Latch
Y-Decoder
Address Latch
STB
Y-Gating
Vcc Detector
Timer
X-Decoder
Cell Matrix
A0-A15
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
3
©2003 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. A, Issue Date: 2003/10/20
EN29F512
FIGURE 2. PDIP
FIGURE 3. PLCC
FIGURE 4. TSOP
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
4
©2003 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. A, Issue Date: 2003/10/20
EN29F512
TABLE 3. OPERATING MODES
512K FLASH USER MODE TABLE
USER MODE
STANDBY
READ
OUTPUT DISABLE
READ
MANUFACTURE ID
READ DEVICE ID
VERIFY SECTOR
PROTECTION
SECTOR
PROTECTION
VERIFY SECTOR
UNPROTECTION
SECTOR
UNPROTECTION
WRITE
CE
H
L
L
L
L
L
L
L
L
L
WE
X
H
H
H
H
H
Pulse
L
H
Pulse
L
L
OE
X
L
H
L
L
L
VID
L
VID
H
A9
X
A9
X
VID
VID
VID
VID
VID
VID
A9
A8
X
A8
X
L/H
X
X
X
X
X
A8
A6
X
A6
X
L
L
L
L
H
H
A6
A1
X
A1
X
L
L
H
X
H
H
A1
A0
X
A0
X
L
H
L
X
L
L
A0
Ax/y
X
Ax/y
Ax/y
X
X
X
X
X
X
Ax/y
DQ(0-7)
HI-Z
DQ (0-7)
HI-Z
MANUFACTURE
ID
DEVICE ID
CODE
X
CODE
X
DIN (0-7)
NOTES:
1) L = V
IL
, H = V
IH
, V
ID
= 11.0V
±
0.5V
2) X = Don’t care, either V
IH
or V
IL
3) Ax/y: Ax = Addr(x), Ay = Addr(y)
TABLE 4. DEVICE IDENTIFICTION
512K FLASH MANUFACTURER/DEVICE ID TABLE
A8
READ
MANUFACTURER ID
READ
DEVICE ID
H
X
(1)
A6
L
L
A1
L
L
A0
L
H
(2)
DQ(7-0)
HEX
MANUFACTURER ID
1C
DEVICE ID
21
NOTES:
1) If a Manufacturing ID is read with A8 = L, the chip will output a configuration code 7Fh. A further
Manufacturing ID must be read with A8 = H.
2) X = Don’t care
This Data Sheet may be revised by subsequent versions
or modifications due to changes in technical specifications.
5
©2003 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. A, Issue Date: 2003/10/20
Power Tips: Where to connect the frequency analyzer reference leads for Bode plot measurements - Part 1
Reprinted from: deyisupport Whenever a system contains a negative feedback loop, loop gain T becomes an important performance parameter to measure and optimize stability, output regulation, and transi...
okhxyyo Analogue and Mixed Signal
Cadence Circuit Design Case Analysis
The book "Cadence Circuit Design Case Analysis" is based on Cadence SPB 16.0 version of Cadence. Through a large number of typical examples, it introduces in detail the operation and use of Cadence's ...
arui1999 Download Centre
Oscillation circuit anti-interference problem
I have been struggling with this thing for a while, but overall the improvement is limited, and the optimization of quantity has not yet brought about qualitative optimization. In the figure [color=#f...
qq849682862 Analog electronics
"Fully Digital Controlled TI Solution Power Supply" Project Division of Work and Progress Report
The following is the division of labor among project team members:Division of Labor Person in charge (sorted by internal code) Job DescriptionAuxiliary power supply jishuaihu, lyzhangxiang Input 310V,...
dontium DIY/Open Source Hardware
How to extract the basic signal of digital sampling signal?
In power applications, digital signal sampling, filtering and fundamental extraction are commonly used methods in design. How to extract the fundamental signal contained in the digital sampling signal...
eeleader Industrial Control Electronics
Electronics Contest Topic Analysis
[i=s]This post was last edited by paulhyde on 2014-9-15 09:23[/i] Analysis of the topic of the electronic competition...
dtcxn Electronics Design Contest

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

About Us Customer Service Contact Information Datasheet Sitemap LatestNews

Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190

Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号