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EMD22

Description
Small Signal Bipolar Transistor
CategoryDiscrete semiconductor    The transistor   
File Size246KB,2 Pages
ManufacturerJCET
Websitehttp://www.cj-elec.com/

Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); ​​QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

 

 

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EMD22 Overview

Small Signal Bipolar Transistor

EMD22 Parametric

Parameter NameAttribute value
MakerJCET
package instructionSMALL OUTLINE, R-PDSO-F6
Reach Compliance Codeunknown
Other featuresBUILT IN BIAS RESISTANCE RATIO IS 10
Maximum collector current (IC)0.1 A
Collector-emitter maximum voltage50 V
ConfigurationSEPARATE, 2 ELEMENTS WITH BUILT-IN RESISTOR
Minimum DC current gain (hFE)80
JESD-30 codeR-PDSO-F6
Number of components2
Number of terminals6
Maximum operating temperature150 °C
Package body materialPLASTIC/EPOXY
Package shapeRECTANGULAR
Package formSMALL OUTLINE
Polarity/channel typeNPN AND PNP
surface mountYES
Terminal formFLAT
Terminal locationDUAL
Transistor component materialsSILICON
Nominal transition frequency (fT)250 MHz

EMD22 Preview

JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD
SOT-563 Plastic-Encapsulate Transistors
EMD22
General purpose transistors (dual transistors)
SOT-563
FEATURES
Both the DTA143Z chip and DTC143Z chip in a package.
Mounting possible with SOT-563 automatic mounting machines.
Transistor elements are independent, eliminating interference.
Mounting cost and area be cut in half.
Marking: D22
Equivalent circuit
1
DTr1 Absolute maximum ratings(T
a
=25℃ unless otherwise specified)
Symbol
V
CC
V
IN
I
O
I
C(MAX)
P
D
T
J
T
STG
Power Dissipation
Junction Temperature
Storage Temperature
Parameter
Supply Voltage
Input Voltage
Output Current
Value
50
-5~+30
100
100
150
150
-55~+150
Unit
V
V
mA
mA
mW
ELECTRICAL CHARACTERISTICS (T
a
=25℃ unless otherwise specified)
Parameter
Symbol
V
I(off)
Input voltage
V
I(on)
Output voltage
Input current
Output current
DC current gain
Input resistance
Resistance ratio
Transition frequency
V
O(on)
I
I
I
O(off)
G
I
R
1
R
2
/ R
1
f
T
V
O
=10V, I
O
=5mA, f=100MHz
V
O
=0.3V, I
O
=5mA
I
O
=5mA, I
I
=0.25mA
V
I
=5V
V
CC
=50V, V
I
=0
V
O
=5V, I
O
=10mA
-
80
3.29
8
250
6.11
12
MHz
KΩ
1.3
0.3
1.8
0.5
V
V
mA
μA
Test
conditions
Min
0.5
Typ
Max
Unit
V
V
CC
=5V, I
O
=100μA
A,Dec,2010
DTr2 Absolute maximum ratings(T
a
=25℃ unless otherwise specified)
Symbol
V
CC
V
IN
I
O
I
C(MAX)
P
D
T
J
T
STG
Supply Voltage
Input Voltage
Output Current
Power Dissipation
Junction Temperature
Storage Temperature
Parameter
Value
-50
-30~+5
-100
-100
150
150
-55~+150
Unit
V
V
mA
mA
mW
Electrical characteristics (T
a
=25℃ unless otherwise specified)
Parameter
Symbol
V
I(off)
Input voltage
V
I(on)
Output voltage
Input current
Output current
DC current gain
Input resistance
Resistance ratio
Transition frequency
V
O(on)
I
I
I
O(off)
G
I
R
1
R
2
/ R
1
f
T
V
O
=-10V, I
O
=-5mA, f=100MHz
V
O
=-0.3V, I
O
=-5mA
I
O
=-5mA, I
I
=-0.25mA
V
I
=-5V
V
CC
=-50V, V
I
=0
V
O
=-5V, I
O
=-10mA
-
80
3.29
8
250
6.11
12
MHz
KΩ
-1.3
-0.3
-1.8
-0.5
V
V
mA
μA
Test
conditions
Min
-0.5
Typ
Max
Unit
V
V
CC
=-5V, I
O
=-100μA
A,Dec,2010
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