EEWORLDEEWORLDEEWORLD

Part Number

Search

IS42VM32200G-75BLI-TR

Description
DRAM 64M (2Mx32) 133MHz Mobile SDRAM 1.8v
Categorystorage   
File Size276KB,27 Pages
ManufacturerISSI(Integrated Silicon Solution Inc.)
Websitehttp://www.issi.com/
Download Datasheet Parametric View All

IS42VM32200G-75BLI-TR Online Shopping

Suppliers Part Number Price MOQ In stock  
IS42VM32200G-75BLI-TR - - View Buy Now

IS42VM32200G-75BLI-TR Overview

DRAM 64M (2Mx32) 133MHz Mobile SDRAM 1.8v

IS42VM32200G-75BLI-TR Parametric

Parameter NameAttribute value
Product CategoryDRAM
ManufacturerISSI(Integrated Silicon Solution Inc.)
RoHSDetails
TypeSDRAM Mobile
Data Bus Width32 bit
Organization2 M x 32
Package / CaseBGA-90
Memory Size64 Mbit
Maximum Clock Frequency133 MHz
Access Time7.5 ns
Supply Voltage - Max1.95 V
Supply Voltage - Min1.7 V
Supply Current - Max75 mA
Minimum Operating Temperature- 40 C
Maximum Operating Temperature+ 85 C
PackagingReel
PackagingCut Tape
Moisture SensitiveYes
Mounting StyleSMD/SMT
Operating Supply Voltage1.8 V
Factory Pack Quantity2500
IS42VM32200G
512K
x
32Bits
x
4Banks Low Power Synchronous DRAM
Description
These IS42VM32200G are Low Power 67,108,864 bits CMOS Synchronous DRAM organized as 4 banks of 524,288 words x 32 bits.
These products are offering fully synchronous operation and are referenced to a positive edge of the clock. All inputs and outputs are
synchronized with the rising edge of the clock input. The data paths are internally pipelined to achieve high bandwidth. All input and
output voltage levels are compatible with LVCMOS.
Features
JEDEC standard 1.8V power supply.
• Auto refresh and self refresh.
• All pins are compatible with LVCMOS interface.
• 4K refresh cycle / 64ms.
y
• Programmable Burst Length and Burst Type.
- 1, 2, 4, 8 or Full Page for Sequential Burst.
- 4 or 8 for Interleave Burst.
• Programmable CAS Latency : 2,3 clocks.
• Programmable Driver Strength Control
- Full Strength or 1/2, 1/4 of Full Strength
• Deep Power Down Mode
Mode.
• All inputs and outputs referenced to the positive edge of the
system clock.
• Data mask function by DQM.
• Internal 4 banks operation
operation.
• Burst Read Single Write operation.
• Special Function Support.
- PASR(Partial Array Self Refresh)
- Auto TCSR(Temperature Compensated Self Refresh)
• Automatic precharge, includes CONCURRENT Auto Precharge
Mode and controlled Precharge.
Copyright © 2010 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its
products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services
described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information
and before placing orders for products.
Integrated S
Silicon S
Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or
f
f
f
f
malfunction of the product can reasonably be expected to cause failure of the life support system or to significantly affect its safety or
effectiveness. Products are not authorized for use in such applications unless Integrated Silicon Solution, Inc. receives written assurance to
its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Rev. A | July 2010
www.issi.com
- DRAM@issi.com
1

Recommended Resources

I'm a novice asking a simple question about how to call a driver. Please give me some advice.
I am developing peripheral drivers for Nios 2. The software architecture (HAL) of Nios 2 supports common device models such as character devices and file subsystems. Recently, I analyzed a simple LCD ...
94179411 MCU
atmeage168 Chinese information
atmeage8, 48, 88, 168 Chinese information...
dmxyzk Microchip MCU
SPARQ Series Review 5
SPARQ Series Review 5 - About S parameters (Part 2)...
安_然 Test/Measurement
[Discussion] What do you think? The failure rate of mobile phones with large-capacity batteries and fast charging technology is increasing?
[i=s]This post was last edited by qwqwqw2088 on 2016-9-22 17:59[/i] [size=4] The Samsung Note7 battery explosion incident caused an uproar. 60% of Samsung's mobile phone battery supply comes from Sams...
qwqwqw2088 Analogue and Mixed Signal
Hangzhou, embedded project development cooperation, if you are interested, come and have a look
I am preparing to start a project, but I am short of manpower. I am looking for someone to cooperate with. I have product experience in Hangzhou, spare time, and I am familiar with industrial-grade AR...
wc8114994 Embedded System
Automated test setup
How to use automated testing in the RFID industry? Ask for help...
422050253 RF/Wirelessly

Popular Articles

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 630  2321  2545  1138  2822  13  47  52  23  57 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号