EEWORLDEEWORLDEEWORLD

Part Number

Search

NB4N527SMNEVB

Description
Other Development Tools BBG NB4N527SMN EVAL BOARD
CategoryDevelopment board/suite/development tools   
File Size313KB,8 Pages
ManufacturerON Semiconductor
Websitehttp://www.onsemi.cn
Download Datasheet Parametric View All

NB4N527SMNEVB Online Shopping

Suppliers Part Number Price MOQ In stock  
NB4N527SMNEVB - - View Buy Now

NB4N527SMNEVB Overview

Other Development Tools BBG NB4N527SMN EVAL BOARD

NB4N527SMNEVB Parametric

Parameter NameAttribute value
Product CategoryOther Development Tools
ManufacturerON Semiconductor
RoHSDetails
ProductEvaluation Boards
TypeVoltage Level Translators
Tool Is For Evaluation OfNB4N527S
PackagingBulk
Description/FunctionDual AnyLevel to LVDS Reciever/Driver/Buffer/Translator w/ Input Termination Evaluation Board
Operating Supply Voltage3.3 V
Factory Pack Quantity1
NB4N527SMNEVB
Evaluation Board User's
Manual for NB4N527S
http://onsemi.com
EVAL BOARD USER’S MANUAL
INTRODUCTION
ON Semiconductor has developed an evaluation board for
the NB4N527S device as a convenience for the customers
interested in performing their own device engineering
assessment. This board provides a high bandwidth 50
W
controlled impedance environment. The pictures in Figure 1
show the top and bottom view of the evaluation board, which
can be configured in several different ways.
This evaluation board manual contains:
Information on 16−lead QFN Evaluation Board
Assembly Instructions
Appropriate Lab Setup
Bill of Materials
This manual should be used in conjunction with the
NB4N527S device data sheet, which contains full technical
details on the device specifications and operation.
Board Lay−Up
The 16−lead QFN evaluation board is implemented in
four layers with split (dual) power supplies (Figure 2,
Evaluation Board Lay−up). For standard lab setup, a split
(dual) power supply is essential to enable the 50
W
internal
impedance in the oscilloscope as a device termination. The
first layer or primary trace layer is 0.005, thick Rogers
RO6002 material, which is designed to have equal electrical
length on all signal traces from the device under the test
(DUT) to the sense output. The second layer is the 1.0 oz.
copper ground plane. The FR4 dielectric material is placed
between the second and third layer, and between the third
and fourth layer. The third layer is also a 1.0 oz copper
ground plane. The fourth layer is the secondary trace layer.
Top View
Bottom View
Figure 1. Top and Bottom View of the 16 QFN Evaluation Board
©
Semiconductor Components Industries, LLC, 2012
February, 2012
Rev. 2
1
Publication Order Number:
EVBUM2077/D

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 304  91  1139  705  1826  7  2  23  15  37 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号