MCH02
Ceramic capacitors
Multi-layer ceramic chip capacitors
MCH02
(0402 (01005) size, chip capacitor)
Features
1) The world's smallest (0.4mm x 0.2mm), Ultra thin (0.2mm), Ultra light (0.08mg)
2) Suitable for mobile end products
3) Lead-free plating terminal
4) No polarity
Quick Reference
The design and specifications are subject to change without prior notice. Please check the most recent technical
specifications prior to placing orders or using the product. For more detail information regarding packaging style code,
please check product designation.
Thermal compensation
Part No.
Size code
Temperature characteristics
code (ppm/°C)
0
±
250(CK)
MCH02
0402
A
0
±
120(CJ)
0
±
60(CH)
Operating temp. range
(°C)
Rated voltage
(V)
Capacitance(pF)
Capacitance
tolerance
C(±0.25pF)
D(±0.5pF)
Thickness
(mm)
0.5 to 2.0
−55
to
+125
25
3.0
4.0 to 5.0
6.0 to 7.0
0.2
±
0.02
External dimensions
(Unit : mm)
0.05Min.
0.12Min.
0.4
±
0.02
0.2
±
0.02
0.2
±
0.02
1/6
MCH02
Ceramic capacitors
Product designation
Code Prduct thickness
K
0.2mm
Packing specification
Paper tape(width 8mm, pitch 2mm)
Reel
φ180mm
(7in.)
Basic ordering unit(pcs.)
15,000
Part No.
Packaging Style
M C H
Rated voltage
Code Voltage
2
25V
0 2
2
A
4 R 7
C
K
Nominal
capacitance
3-digit designation
according to IEC
Temperature characteristic code
:Refer to quick reference table.
Capacitance tolerance
Code
Tolerance
C
D
±
0.25pF(0.5 to 5pF)
±
0.5pF(6.0to 7pF)
Product No. list
Capacitance range
Thermal compensation
Capacitance
(pF)
0.5
1.0
2.0
3.0
4.0
5.0
6.0
7.0
Temperature
Rated voltage (V)
Tolerance Product thickness (mm)
C(
±
0.25PF)
0.2
±
0.02
D(
±
0.5PF)
A (CH) (CJ) (CK)Characteristics
25V
Product No.
MCH022A 0R5CK
MCH022A 010CK
MCH022A 020CK
MCH022A 030CK
MCH022A 040CK
MCH022A 050CK
MCH022A 060DK
MCH022A 070DK
2/6
MCH02
Ceramic capacitors
Performance and test method
No.
1
Items
Appearance and
dimensions
Performance
No marked defects shall be allowed
for appearance.
Dimensions shall be as specified in
the clause 4.
No dielectrical breakdown or other
damage shall be allowed.
Test Method
(As per JIS C 5101-1, JIS C 5101-10)
As per 4.4 of JIS C 5101-1.
As per 4.5 of JIS C 5101-10
Using a Magnifier.
As per 4.6 of JIS C 5101-1.
As per 4.6.4 of JIS C 5101-10
Voltage shall be applied as per Table1.
Table 1
Voltage
300% Rated voltage
Voltage shall be applied for 1 to 5s with
50mA charging and discharging curent.
3
Insulation resistance
More than 10000MΩ
As per 4.5 of JIS C 5101-1.
As per 4.6.3 of JIS C 5101-10
Measurements shall be made after
60+/−5s period of the rated voltage
applied.
As per 4.7 of JIS C 5101-1.
As per 4.6.1 of JIS C 5101-10
Measurements shall be made under the
conditions specified in Table 2.
Table 2
Frequency
1+/−0.1MHz
1+/−0.1Vrms.
Voltage
2
Withstanding voltage
4
Capacitance
Capacitance shall be
within specified tolerance range.
5 Dielectric loss tangent
tan
δ
< 100/(400+20 C)
−
∗
C=Capacitance(pF)
As per 4.8 of
JIS C 5101-1
As per 4.6.2 of
JIS C 5101-10
Measurements shall be made under the
conditions specified in Table 2.
As per 4.24 of JIS C 5101-1.
As per 4.7 of JIS C 5101-10
Temperature coefficient shall be calculated
at 20°C and 85°C.
6 Temperature
characteristic
0+/−250ppm /
°C
(0.5 to
+2pF)
0+/−120ppm /
°C
(3pF)
0+/−60ppm /
°C
(4 to
+7pF)
(−55°C to
+125°CpF)
7 Solderability
More than 3/4 of each end
termination shall be covered with
new solder.
As per 4.15.2 of JIS C 5101-1.
As per 4.11 of JIS C 5101-10
The solder specified in JIS Z 3282 H63A
shall be used. And the flux containing 25%
rosin and ethanol solution shall be used.
The specimens shall be immersed into the
solder at 235+/−5°C
for 2+/−0.5s
So that both end terminations are
completely under solder.
3/6
MCH02
Ceramic capacitors
No.
Items
Performance
Test Method
(As per JIS C 5101-1, JIS C 5101-10)
As per 4.14 of
JIS C 5101-1.
As per 4.10 of
JIS C 5101-10
The solder specified in JIS Z 3282. H63A
shall be used.
The specimens shall be immersed into the
solder at 260+/−5
°C
for
5+/−0.5s so that
both end terminations are completely
under the solder.
Pre-heating at 150+/−10
°C
for 1 to 2min
Initial measurements prior to test shall be
performed after the thermal
Pre-conditioning specified in Remarks (1).
Final measurements shall be made after the
specimens have been left at room
temperature as per Table3.
Table3
Time
24+/−2 h
9 End termination
adherence
8 Resistance
to solderin
heat
Appearance Without mechanical damage.
Change
rate from
initial value
Dielectric
loss
tangent
Insulation
resistance
Within
+/−0.25pF
Within specified initial value.
Within specified initial value.
Withstanding No defects shall be allowed.
voltage
Without peeling or sign of
peeling shall be allowed
on the end terminations.
As per 4.13 of JIS C 5101-1.
As per 4.8 ofJIS C 5101-10
A 1N weight for
10+/−1s shall be applied
to the soldered specimens as shown by the
arrow mark in the below sketch.
Applied pressure
Substrate
Capacitor
10
Bending
strength
Appearance
Change
rate from
initial value
Without mechanical damage.
Within
+/−0.5pF
As per 4.35 of JIS C 5101-1.
As per 4.9 of JIS C 5101-10
Glass epoxy board with soldered
specimens shall be bent till 1mm by
1.0mm/s.
As per 4.17 of
JIS C 5101-1.
The specimens shall be soldered on the
specified test jig.
Final measurements shall be made after the
specimens have been left at room
temperature as per Table3.
[Condition]
Directions : 2h each X, Y and Z directions
Total : 6h
Frequency range : 10 to 55 to 10Hz(1min)
Applitude : 1.5mm
(shall not exceed acceleration196m/s
2
)
Table3
Time
24+/−2 h
11 Vibration
Appearance
Change
rate from
initial value
Dielectric
loss
tangent
Without mechanical damage.
Within
+/−0.25pF
Within specified initial value.
4/6
MCH02
Ceramic capacitors
No.
Items
Performance
Test Method
(As per JIS C 5101-1, JIS C 5101-10)
As per 4.16 of JIS C 5101-1.
As per 4.12 of JIS C 5101-10
The specimens shall be soldered on the test
jig shown in Remarks.
Temperature cycle : 100cycles.
Final measurements shall be made after the
specimens have been left at room
temperature as per Table3.
Test condition
Step
Temp. (°C)
Min operating temp.
Room temp.
Max operating temp.
Room temp.
Table3
Time
24+/−2 h
Time (min)
30+/−3
<
3
−
30+/−3
<
3
−
12 Temperature
Appearance Without mechanical damage.
cycling
Change
rate from
initial value
Dielectric
loss
tangent
Insulation
resistance
Withstanding
voltage
Within
+/−0.25pF
Within specified initial value.
Within specified initial value.
1
2
3
4
No defects shall be allowed.
13 Humidity
(Steady)
Appearance Without mechanical damage.
Change
rate from
initial value
Dielectric
tangent
Insulation
resistance
Within
+/−5.0pF
tan
δ <
100/(200+10 C)
−
∗
C=Capacitance(pF)
As per 4.22 of
JIS C 5101-1
JIS C 5101-10
Test temperature : 60+/−2°C
Relative humidity : 90 to 95%
Test time
: 500
+24/−0
h
Final measurements have been left at
room temperature as per Table3.
Table3
More than 1000MΩ
Time
24+/−2 h
14 Humidity
life test
Appearance Without mechanical damage.
Change
rate from
initial value
Dielectric
tangent
Insulation
resistance
Within
+/−0.75pF
tan
δ <
100/(100+10 C/3)
−
∗
C=Capacitance(pF)
More than 500MΩ
As per 4.22 of JIS C 5101-1
As per 4.14 of JIS C 5101-10
Test temperature : 60+/−2°C
Relative humidity : 90 to 95%
Voltage
: Rated voltage
: 500
+24/−0
h
Test time
Final measurements shall be made after
the specimens have been left at room
temperature as per Table3.
Table3
Time
24+/−2 h
15 Heat life
test
Appearance Without mechanical damage.
Change
rate from
initial value
Dielectric
tangent
Insulation
resistance
Within
+/−0.3pF
As per 4.23 of JIS C 5101-1.
As per 4.15 of JIS C 5101-10
Test
Voltage
temperature(
°C
)
Test
time (h)
tan
δ <
100/(100+10 C)
−
∗
C=Capacitance(pF)
125
200%
1000
Rated
+48/−0
voltage
More than 1000MΩ
Final measurements shall be made after
the specimens have been left at room
temperature
Table3
Time
24+/−2 h
5/6
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