If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
CC
)
DC Input Diode Current (I
IK
)
V
I
= −0.5V
V
I
= V
CC
+ 0.5V
DC Input Voltage (V
I
)
DC Output Diode Current (I
OK
)
V
O
= −0.5V
V
O
= V
CC
+ 0.5V
DC Output Voltage (V
O
)
DC Output Source
or Sink Current (I
O
)
DC V
CC
or Ground Current
per Output Pin (I
CC
or I
GND
)
Storage Temperature (T
STG
)
DC Latch-Up Source or
Sink Current
Junction Temperature (T
J
)
CDIP
−0.5V to +7.0V
−20 mA
+20 mA
−0.5V to V
CC
+ 0.5V
−20 mA
+20 mA
−0.5V to V
CC
+ 0.5V
Recommended Operating
Conditions
Supply Voltage (V
CC
)
’ACQ
’ACTQ
Input Voltage (V
I
)
Output Voltage (V
O
)
Operating Temperature (T
A
)
54ACQ/ACTQ
Minimum Input Edge Rate
∆V/∆t
’ACQ Devices
V
IN
from 30% to 70% of V
CC
V
CC
@
3.0V, 4.5V, 5.5V
Minimum Input Edge Rate
∆V/∆t
’ACTQ Devices
V
IN
from 0.8V to 2.0V
V
CC
@
4.5V, 5.5V
2.0V to 6.0V
4.5V to 5.5V
0V to V
CC
0V to V
CC
−55˚C to +125˚C
125 mV/ns
±
50 mA
±
50 mA
−65˚C to +150˚C
±
300 mA
175˚C
125 mV/ns
Note 1:
Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT
®
circuits outside databook specifications.
Note 2:
All commercial packaging is not recommended for applications re-
quiring greater than 2000 temperature cycles from −40˚C to +125˚C.
DC Characteristics for ’ACQ Family Devices
Symbol
Parameter
V
CC
(V)
V
IH
Minimum High Level
Input Voltage
V
IL
Maximum Low Level
Input Voltage
V
OH
Minimum High Level
Output Voltage
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
54ACQ
T
A
=
−55˚C to +125˚C
Guaranteed Limits
2.1
3.15
3.85
0.9
1.35
1.65
2.9
4.4
5.4
(Note 3)
V
IN
= V
IL
or V
IH
3.0
4.5
5.5
V
OL
Maximum Low Level
Output Voltage
3.0
4.5
5.5
2.4
3.7
4.7
0.1
0.1
0.1
(Note 3)
V
IN
= V
IL
or V
IH
3.0
4.5
5.5
I
IN
Maximum Input
Leakage Current
5.5
0.50
0.50
0.50
V
µA
I
OL
= 12 mA
I
OL
= 24 mA
I
OL
= 24 mA
V
I
= V
CC
, GND
(Note 5)
V
V
I
OH
= −12 mA
I
OH
= −24 mA
I
OH
= −24 mA
I
OUT
= 50 µA
V
I
OUT
= −50 µA
V
V
OUT
= 0.1V
or V
CC
− 0.1V
V
V
OUT
= 0.1V
or V
CC
− 0.1V
Units
Conditions
±
1.0
3
www.national.com
DC Characteristics for ’ACQ Family Devices
Symbol
Parameter
V
CC
(V)
I
OLD
I
OHD
I
CC
I
OZ
Minimum Dynamic
(Note 4)
Output Current
Maximum Quiescent
Supply Current
Maximum TRI-STATE
Leakage Current
V
OLP
V
OLV
Quiet Output
Maximum Dynamic V
OL
Quiet Output
Minimum Dynamic V
OL
5.5
5.5
5.5
5.5
(Continued)
54ACQ
T
A
=
−55˚C to +125˚C
Guaranteed Limits
50
−50
80.0
Units
Conditions
mA
mA
µA
V
OLD
= 1.65V Max
V
OHD
= 3.85V Min
V
IN
= V
CC
or GND (Note 5)
V
I
(OE) = V
IL
, V
IH
±
5.0
1.5V
−1.2V
µA
V
I
= V
CC
, GND
V
O
= V
CC
, GND
(Notes 6, 7)
(Notes 6, 7)
5.0
5.0
V
V
Note 3:
All outputs loaded; thresholds on input associated with output under test.
Note 4:
Maximum test duration 2.0 ms, one output loaded at a time.
Note 5:
I
IN
and I
CC
@
3.0V are guaranteed to be less than or equal to the respective limit
@
5.5V V
CC
.
I
CC
for 54ACQ
@
25˚C is identical to 74ACQ
@
25˚C.
Note 6:
Plastic DIP package.
Note 7:
Max number of outputs defined as (n). Data inputs are driven 0V to 5V. One output
@
GND.
Note 8:
Max number of data inputs (n) switching. (n −1) inputs switching 0V to 5V (’ACQ). Input-under-test switching: 5V to threshold (V
ILD
), 0V to threshold (V
IHD
),
f = 1 MHz.
DC Characteristics for ’ACTQ Family Devices
Symbol
Parameter
V
CC
(V)
54ACTQ
T
A
=
−55˚C to +125˚C
Guaranteed
Limits
V
IH
V
IL
V
OH
Minimum High Level
Input Voltage
Maximum Low Level
Input Voltage
Minimum High Level
Output Voltage
4.5
5.5
4.5
5.5
4.5
5.5
2.0
2.0
0.8
0.8
4.4
5.4
(Note 9)
V
IN
= V
IL
or V
IH
4.5
5.5
V
OL
Maximum Low Level
Output Voltage
4.5
5.5
3.70
4.70
0.1
0.1
(Note 9)
V
IN
= V
IL
or V
IH
4.5
5.5
I
IN
I
OZ
Maximum Input
Leakage Current
Maximum TRI-STATE
Leakage Current
5.5
5.5
0.50
0.50
V
µA
µA
I
OL
= 24 mA
I
OL
= 24 mA
V
I
= V
CC
, GND
V
I
= V
IL
, V
IH
V
O
= V
CC
, GND
V
V
I
OH
= −24 mA
I
OH
= −24 mA
I
OUT
= 50 µA
V
V
V
V
OUT
= 0.1V
or V
CC
− 0.1V
V
OUT
= 0.1V
or V
CC
− 0.1V
I
OUT
= −50 µA
Units
Conditions
±
1.0
±
5.0
www.national.com
4
DC Characteristics for ’ACTQ Family Devices
Symbol
Parameter
V
CC
(V)
54ACTQ
T
A
=
(Continued)
Units
Conditions
−55˚C to +125˚C
Guaranteed
Limits
I
CCT
I
OLD
I
OHD
I
CC
V
OLP
V
OLV
Maximum
I
CC
/Input
Minimum Dynamic
(Note 10)
Output Current
Maximum Quiescent
Supply Current
Quiet Output Maximum
Dynamic V
OL
Quiet Output Minimum
Dynamic V
OL
5.5
5.5
5.5
5.5
1.6
50
−50
80.0
1.5V
−1.2V
mA
mA
mA
µA
V
I
= V
CC
− 2.1V
V
OLD
= 1.65V Max
V
OHD
= 3.85V Min
V
IN
= V
CC
or GND (Note 11)
(Notes 12, 13)
(Notes 12, 13)
5.0
5.0
V
V
Note 9:
All outputs loaded; thresholds on input associated with output under test.
Note 10:
Maximum test duration 2.0 ms, one output loaded at a time.
Note 11:
I
CC
for 54ACTQ
@
25˚C is identical to 74ACTQ
@
25˚C.
Note 12:
Plastic DIP package.
Note 13:
Max number of Data Inputs defined as (n). n−1 Data Inputs are driven 0V to 3V. One Data Input
@
V
IN
= GND.
Note 14:
Max number of Data Inputs (n) switching. (n−1) Inputs switching 0V to 3V (’ACTQ). Input-under-test switching: 3V to threshold (V
ILD
), 0V to threshold
(V
IHD
), f = 1 MHz.
AC Electrical Characteristics
V
CC
Symbol
Parameter
(V)
(Note 15)
t
PHL
, t
PLH
t
PZL
, t
PZH
t
PHZ
, t
PLZ
Propagation Delay
Data to Output
Output Enable Time
Output Disable Time
3.3
5.0
3.3
5.0
3.3
5.0
Note 15:
Voltage Range 5.0 is 5.0V
±
0.5V
Voltage Range 3.3 is 3.3
±
0.3V.
Note 16:
Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The speci-
fication applies to any outputs switching in the same direction, either HIGH to LOW (t
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