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-1-
K4T28163QP
datasheet
History
- Target SPEC. Release
- Preliminary SPEC. Release
- First SPEC. Release
- Corrected Typo.
Draft Date
Feb. 2011
Apr. 2011
May. 2011
Jul. 2011
Rev. 1.1
DDR2 SDRAM
Revision History
Revision No.
0.0
0.5
1.0
1.1
Remark
-
-
-
-
Editor
J.Y.Lee
J.Y.Lee
J.Y.Lee
J.Y.Lee
-2-
K4T28163QP
datasheet
Rev. 1.1
DDR2 SDRAM
Table Of Contents
128Mb P-die DDR2 SDRAM
1. Ordering Information ..................................................................................................................................................... 4
6. Absolute Maximum Ratings .......................................................................................................................................... 9
7. AC & DC Operating Conditions..................................................................................................................................... 9
7.1 Recommended DC operating Conditions (SSTL_1.8)............................................................................................. 9
7.2 Operating Temperature Condition ........................................................................................................................... 10
7.3 Input DC Logic Level ............................................................................................................................................... 10
7.4 Input AC Logic Level ............................................................................................................................................... 10
7.5 AC Input Test Conditions......................................................................................................................................... 10
7.6 Differential input AC logic Level............................................................................................................................... 11
7.7 Differential AC output parameters ........................................................................................................................... 11
8. ODT DC electrical characteristics ................................................................................................................................. 11
10. IDD Specification Parameters and Test Conditions .................................................................................................... 13
13. Electrical Characteristics & AC Timing for DDR2-1066/800/667 ................................................................................ 16
13.1 Refresh Parameters by Device Density................................................................................................................. 16
13.2 Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin ................................................................ 16
13.3 Timing Parameters by Speed Grade ..................................................................................................................... 17
14. General notes, which may apply for all AC parameters .............................................................................................. 19
15. Specific Notes for dedicated AC parameters .............................................................................................................. 21
• Bi-directional Differential Data-Strobe (Single-ended data-strobe is an
optional feature)
• Off-Chip Driver(OCD) Impedance Adjustment
• On Die Termination
• Special Function Support
-50ohm ODT
-High Temperature Self-Refresh rate enable
• Average Refresh Period 15.6us at lower than T
CASE
85°C, 7.8us at
85°C < T
CASE
< 95
°C
• All of products are Lead-Free, Halogen-Free, and RoHS compliant
The 128Mb DDR2 SDRAM is organized as a 2Mbit x 16 I/Os x 4 banks
device. This synchronous device achieves high speed double-data-rate
transfer rates of up to 1066Mb/sec/pin (DDR2-1066) for general applica-
tions.
The chip is designed to comply with the following key DDR2 SDRAM fea-
tures such as posted CAS with additive latency, write latency = read latency
-1, Off-Chip Driver(OCD) impedance adjustment and On Die Termination.
All of the control and address inputs are synchronized with a pair of exter-
nally supplied differential clocks. Inputs are latched at the crosspoint of dif-
ferential clocks (CK rising and CK falling). All I/Os are synchronized with a
pair of bidirectional strobes (DQS and DQS) in a source synchronous fash-
ion. The address bus is used to convey row, column, and bank address
information in a RAS/CAS multiplexing style. For example, 128Mb(x16)
device receive 12/9/2 addressing.
The 128Mb DDR2 device operates with a single 1.8V ± 0.1V power supply
and 1.8V ± 0.1V VDDQ.
The 128Mb DDR2 device is available in 84ball FBGAs(x16).
NOTE
:
1. This data sheet is an abstract of full DDR2 specification and does not cover the common features which are described in “DDR2 SDRAM Device Operation & Timing Dia-
gram”.
2. The functionality described and the timing specifications included in this data sheet are for the DLL Enabled mode of operation.
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