M383L2828CT1
184pin Registered DDR SDRAM MODULE
1GB DDR SDRAM MODULE
(128Mx72 ((64Mx72)*2)based on 64Mx4 DDR SDRAM)
Registered 184pin DIMM
72-bit ECC/Parity
Revision 0.1
Dec. 2001
- -1 -
Rev. 0.1 Dec. 2001
M383L2828CT1
Revision History
Revision 0.0 (August. 2000)
1.First release for internal usage.
184pin Registered DDR SDRAM MODULE
Revision 0.1 (Dec. 2001)
- Add derating values for the specifications if the single-ended clock skew rate is less than 1.0V/ns in page 47.
- Revised "Absolute maximum rating" table in page 38.
. Changed "Voltage on VDDQ supply relative to VSS" value from -0.5~3.6V to -1~3.6V
. Changed "power dissipation" value from 1.0W to 1.5W.
- Revised AC parameter table
From
DDR266A
Min.
tHZ
tACmin
-400ps
tACmin
-400ps
0.25
10ns
Max.
tACmax
-400ps
tACmax
-400ps
DDR266B
Min.
tACmin
-400ps
tACmin
-400ps
0.25
10ns
Max.
tACmax
-400ps
tACmax
-400ps
DDR200
Min.
tACmin
-400ps
tACmin
-400ps
0.25
10ns
Max.
tACmax
-400ps
tACmax
-400ps
DDR266A
Min.
-0.75
Max.
+0.75
To
DDR266B
Min.
-0.75
Max.
+0.75
DDR200
Min.
-0.8
Max.
+0.8
tLZ
tWPST
(tCK)
tPDEX
-0.75
+0.75
-0.75
+0.75
-0.8
+0.8
0.4
7.5ns
0.6
0.4
7.5ns
0.6
0.4
10ns
0.6
-
Deleted typical current in IDD spec. table
-
Included address and control input setup/hold time(tIS/tIH) at slow slew rate in DDR200/266 AC specification
-
Deleted Exit self refresh to write command(tXSW) in DDR200/266 AC specification
-
Rename tXSA(exit self refresh to bank active command) to tXSNR(exit self refresh to non read command) at DDR200/266
-
Rename tXSR(exit self refresh to read command) to tXSRD at DDR200/266
-
Rename tWPREH(DQS in hold time) to tWPRE at DDR200/266
-
Rename tREF(Refresh interval time) to tREFI at DDR200/266
- Changed tWR value from 2tCK to 15ns.
--Rename tCDLR(Write data out to Read command) t0 tWTR
- Added tDAL(tWR+tRP)
-0-
Rev. 0.1 Dec. 2001
M383L2828CT1
184pin Registered DDR SDRAM MODULE
M383L2828CT1 DDR SDRAM 184pin DIMM 128Mx72 DDR SDRAM
184pin DIMM based on Stacked 64Mx4, 4bank, 8K refresh with SPD
GENERAL DESCRIPTION
The Samsung M383L2828CT1 is 128M bit x 72 Double Data
Rate SDRAM high density memory modules. The Samsung
M383L2828CT1 consists of thirty-six CMOS 64M x 4 bit with
4banks Double Data Rate SDRAMs in 66pin TSOP-II(400mil)
packages, mounted on a 184pin glass-epoxy substrate. Four
0.1uF decoupling capacitors are mounted on the printed circuit
board in parallel for each DDR SDRAM. The M383L2828CT1
is Dual In-line Memory Modules and intend-ed for mounting
into 184pin edge connector sockets.
Synchronous design allows precise cycle control with the use
of system clock. Data I/O transactions are possible on both
edges of DQS. Range of operating frequencies, programmable
latencies and burst lengths allow the same device to be useful
for a variety of high bandwidth, high performance memory sys-
tem applications.
FEATURE
• Performance range
Part No.
Max Freq.
Interface
SSTL_2
M383L2828CT1-C(L)A2 133MHz(7.5ns@CL=2)
M383L2828CT1-C(L)B0 133MHz(7.5ns@CL=2.5)
M383L2828CT1-C(L)A0 100MHz(10ns@CL=2)
• Power supply : Vdd: 2.5V
±
0.2V, Vddq: 2.5V
±
0.2V
•
Double-data-rate architecture; two data transfers per clock cycle
• Bidirectional data strobe(DQS)
• Differential clock inputs(CK and CK)
• DLL aligns DQ and DQS transition with CK transition
• Programmable Read latency 2, 2.5 (clock)
• Programmable Burst length (2, 4, 8)
• Programmable Burst type (sequential & interleave)
• Edge aligned data output, center aligned data input
• Auto & Self refresh, 7.8us refresh interval(8K/64ms refresh)
• Serial presence detect with EEPROM
• PCB :
Height 1700 mil
, double sided component
PIN CONFIGURATIONS (Front side/back side)
Pin Front Pin Front Pin
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
VREF
DQ0
VSS
DQ1
DQS0
DQ2
VDD
DQ3
NC
/RESET
VSS
DQ8
DQ9
DQS1
VDDQ
*CK1
*/CK1
VSS
DQ10
DQ11
CKE0
VDDQ
DQ16
DQ17
DQS2
VSS
A9
DQ18
A7
VDDQ
DQ19
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
A5
DQ24
VSS
DQ25
DQS3
A4
VDD
DQ26
DQ27
A2
VSS
A1
CB0
CB1
VDD
DQS8
A0
CB2
VSS
CB3
BA1
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
PIN DESCRIPTION
Pin
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
181
182
183
184
Front
VDDQ
/WE
DQ41
/CAS
VSS
DQS5
DQ42
DQ43
VDD
*/CS2
DQ48
DQ49
VSS
*/CK2
*CK2
VDDQ
DQS6
DQ50
DQ51
VSS
VDDID
DQ56
DQ57
VDD
DQS7
DQ58
DQ59
VSS
NC
SDA
SCL
Pin
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
Back
VSS
DQ4
DQ5
VDDQ
DQS9
DQ6
DQ7
VSS
NC
NC
NC
VDDQ
DQ12
DQ13
DQS10
VDD
DQ14
DQ15
CKE1
VDDQ
*BA2
DQ20
A12
VSS
DQ21
A11
DQS11
VDD
DQ22
A8
DQ23
Pin
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
148
149
150
151
152
153
Back
VSS
A6
DQ28
DQ29
VDDQ
DQS12
A3
DQ30
VSS
DQ31
CB4
CB5
VDDQ
CK0
/CK0
VSS
DQS17
A10
CB6
VDDQ
CB7
Back
/RAS
DQ45
VDDQ
/CS0
/CS1
DQS14
VSS
DQ46
DQ47
*/CS3
VDDQ
DQ52
DQ53
*A13
VDD
DQS15
DQ54
DQ55
VDDQ
NC
DQ60
DQ61
VSS
DQS16
DQ62
DQ63
VDDQ
SA0
SA1
SA2
VDDSPD
Pin Name
A0 ~ A12
BA0 ~ BA1
DQ0 ~ DQ63
CB0 ~ CB7
DQS0 ~ DQS17
CK0, CK0
CKE0,CKE1
CS0, CS1
RAS
CAS
WE
VDD
VDDQ
VSS
VREF
VDDSPD
SDA
SCL
SA0 ~ 2
VDDID
RESET
NC
Function
Address input (Multiplexed)
Bank Select Address
Data input/output
Check bit(Data-in/data-out)
Data Strobe input/output
Clock input
Clock enable input
Chip select input
Row address strobe
Column address strobe
Write enable
Power supply (2.5V)
Power Supply for DQS(2.5V)
Ground
Power supply for reference
Serial EEPROM Power
Supply (
2.3V to 3.6V
)
Serial data I/O
Serial clock
Address in EEPROM
VDD identification flag
Reset enable
No connection
KEY
DQ32
VDDQ
DQ33
DQS4
DQ34
VSS
BA0
DQ35
DQ40
KEY
VSS
DQ36
DQ37
VDD
DQS13
DQ38
DQ39
VSS
DQ44
* These pins are not used in this module.
SAMSUNG ELECTRONICS CO., Ltd. reserves the right to change products and specifications without notice.
-1-
Rev. 0.1 Dec. 2001
M383L2828CT1
Functional Block Diagram
V
SS
RS1
RS0
DQS0
DQ0
DQ1
DQ2
DQ3
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
184pin Registered DDR SDRAM MODULE
DM0/DQS9
DM
DQ4
DQ5
DQ6
DQ7
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
D0
D18
D9
D27
DQS1
DQ8
DQ9
DQ10
DQ11
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DM1/DQS10
DQ12
DQ13
DQ14
DQ15
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
D1
D19
D10
D28
DQS2
DQ16
DQ17
DQ18
DQ19
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DM2/DQS11
DQ20
DQ21
DQ22
DQ23
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
D2
D20
D11
D29
DQS3
DQ24
DQ25
DQ26
DQ27
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DM3/DQS12
DQ28
DQ29
DQ30
DQ31
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
D3
D21
D12
D30
DQS4
DQ32
DQ33
DQ34
DQ35
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DM4/DQS13
DQ36
DQ37
DQ38
DQ39
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
D4
D22
D13
D31
DQS5
DQ40
DQ41
DQ42
DQ43
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DM5/DQS14
DQ44
DQ45
DQ46
DQ47
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
D5
D23
D14
D32
DQS6
DQ48
DQ49
DQ50
DQ51
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DM6/DQS15
DQ52
DQ53
DQ54
DQ55
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
D6
D24
D15
D33
DQS7
DQ56
DQ57
DQ58
DQ59
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DM7/DQS16
DQ60
DQ61
DQ62
DQ63
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
S
DM
D7
D25
D16
D34
DQS8
CB0
CB1
CB2
CB3
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DM8/DQS17
CB4
CB5
CB6
CB7
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
DQS
I/O 3
I/O 2
I/O 1
I/O 0
S
DM
D8
D26
D17
D35
V
DDSPD
Serial PD
SCL
WP
A0
SA0
CS0
CS1
BA0-BAN
A0-A12
RAS
CAS
CKE0
CKE1
WE
SPD
D0 - D35
D0 - D35
V
D D
/V
DDQ
SDA
A1
SA1
A2
SA2
VREF
V
SS
D0 - D35
D0 - D35
CK0,CK0
R
E
G
I
S
T
E
R
RCS0
RCS1
RBA0 - RBAn
RA0 - RA12
RRAS
RCAS
RCKE0
RCKE1
RWE
BA0-BAn: SDRAMs D0 - D35
A0-An: SDRAMs D0 - D35
RAS : SDRAMs D0 - D35
CAS : SDRAMs D0 - D35
CKE: SDRAMs D0 - D17
CKE: SDRAMs D18 - D35
W E: S D R A M s D 0 - D 3 5
PLL
Notes:
1. DQ-to-I/O wiring is shown as recommended but may be changed.
2. DQ/DQS/DM/CKE/CS relationships must be maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms.
PCK
PCK
RESET
-2-
Rev. 0.1 Dec. 2001
M383L2828CT1
Absolute Maximum Rate
Parameter
Voltage on any pin relative to V
SS
Voltage on V
DD
& V
DDQ
supply relative to V
SS
Storage temperature
Power dissipation
Short circuit current
184pin Registered DDR SDRAM MODULE
Symbol
V
IN
, V
OUT
V
DD
, V
DDQ
T
STG
P
D
I
OS
Value
-0.5 ~ 3.6
-1.0 ~ 3.6
-55 ~ +150
54
50
Unit
V
V
°C
W
mA
Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
POWER & DC OPERATING CONDITIONS (SSTL_2 In/Out)
Recommended operating conditions(Voltage referenced to V
SS
=0V, T
A
=0 to 70°C)
Parameter
Supply voltage(for device with a nominal V
DD
of 2.5V)
I/O Supply voltage
I/O Reference voltage
I/O Termination voltage(system)
Input logic high voltage
Input logic low voltage
Input Voltage Level, CK and CK inputs
Input Differential Voltage, CK and CK inputs
Input crossing point voltage, CK and CK inputs
Input leakage current
Output leakage current
Output High Current(Normal strengh driver)
;V
OUT
= V
TT
+ 0.84V
Output High Current(Normal strengh driver)
;V
OUT
= V
TT
- 0.84V
Output High Current(Half strengh driver)
;V
OUT
= V
TT
+ 0.45V
Output High Current(Half strengh driver)
;V
OUT
= V
TT
- 0.45V
Symbol
V
DD
V
DDQ
V
R E F
V
TT
V
IH
(DC)
V
IL
(DC)
V
IN
(DC)
V
ID
(DC)
V
IX
(DC)
I
I
I
O Z
I
O H
I
OL
I
O H
I
OL
Min
2.3
2.3
VDDQ/2-50mV
V
REF
-0.04
V
R E F
+0.15
-0.3
-0.3
0.3
1.15
-2
-5
-16.8
16.8
-9
9
Max
2.7
2.7
VDDQ/2+50mV
V
R E F
+0.04
V
DDQ
+0.3
V
REF
-0.15
V
DDQ
+0.3
V
DDQ
+0.6
1.35
2
5
Unit
Note
V
V
V
V
V
V
V
V
uA
uA
mA
mA
mA
mA
3
5
1
2
4
4
Notes
1. Includes
±
25mV margin for DC offset on V
REF
, and a combined total of
±
50mV margin for all AC noise and DC offset on V
REF
,
bandwidth limited to 20MHz. The DRAM must accommodate DRAM current spikes on V
REF
and internal DRAM noise coupled
TO V
REF
, both of which may result in V
REF
noise. V
REF
should be de-coupled with an inductance of
≤
3nH.
2.V
TT
is not applied directly to the device. V
TT
is a system supply for signal termination resistors, is expected to be set equal to
V
REF
, and must track variations in the DC level of V
R E F
3. V
ID
is the magnitude of the difference between the input level on CK and the input level on CK.
4. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in
simulation. The AC and DC input specifications are relative to a VREF envelop that has been bandwidth limited to 200MHZ.
5. The value of V
IX
is expected to equal 0.5*V
DDQ
of the transmitting device and must track variations in the dc level of the same.
6. These charactericteristics obey the SSTL-2 class II standards.
-3-
Rev. 0.1 Dec. 2001