IDT49FCT3805D/E
3.3V CMOS DUAL 1-TO-5 CLOCK DRIVER
INDUSTRIAL TEMPERATURE RANGE
3.3V CMOS DUAL
1-TO-5 CLOCK DRIVER
IDT49FCT3805D/E
FEATURES:
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Advanced CMOS Technology
Guaranteed low skew < 200ps (max.)
Very low propagation delay < 2.5ns (max)
Very low duty cycle distortion < 270ps (max)
Very low CMOS power levels
Operating frequency up to 166MHz
TTL compatible inputs and outputs
Inputs can be driven from 3.3V or 5V components
Two independent output banks with 3-state control
1:5 fanout per bank
"Heartbeat" monitor output
V
CC
= 3.3V ± 0.3V
Available in SSOP and QSOP packages
DESCRIPTION:
The FCT3805 is a 3.3 volt clock driver built using advanced CMOS
technology. The device consists of two banks of drivers, each with a 1:5 fanout
and its own output enable control. The device has a "heartbeat" monitor for
diagnostics and PLL driving. The MON output is identical to all other outputs
and complies with the output specifications in this document. The FCT3805 offers
low capacitance inputs.
The FCT3805 is designed for high speed clock distribution where signal
quality and skew are critical. The FCT3805 also allows single point-to-point
transmission line driving in applications such as address distribution, where one
signal must be distributed to multiple recievers with low skew and high signal
quality.
For more information on using the FCT3805 with two different input
frequencies on bank A and B, please see AN-236.
FUNCTIONAL BLOCK DIAGRAM
PIN CONFIGURATION
V
CCA
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
V
CCB
OB
1
OB
2
OB
3
GND
B
OB
4
OB
5
MON
OE
B
IN
B
OE
A
IN
A
5
OA
1
- OA
5
OA
1
OA
2
OA
3
GND
A
OA
4
IN
B
OE
B
5
OA
5
OB
1
- OB
5
GND
Q
OE
A
MON
IN
A
SSOP/ QSOP
TOP VIEW
INDUSTRIAL TEMPERATURE RANGE
1
c
2004 Integrated Device Technology, Inc.
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
SEPTEMBER 2004
DSC-5864/19
IDT49FCT3805D/E
3.3V CMOS DUAL 1-TO-5 CLOCK DRIVER
INDUSTRIAL TEMPERATURE RANGE
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
CC
V
I
V
O
T
J
T
STG
Description
Input Power Supply Voltage
Input Voltage
Output Voltage
Junction Temperature
Storage Temperature
Max
–0.5 to +4.6
–0.5 to +5.5
–0.5 to V
CC
+0.5
150
–65 to +165
Unit
V
V
V
°C
°C
PIN DESCRIPTION
Pin Names
OE
A
,
OE
B
IN
A
, IN
B
OAn, OBn
MON
Clock Inputs
Clock Outputs
Monitor Output
Description
3-State Output Enable Inputs (Active LOW)
NOTE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
FUNCTION TABLE
(1)
Inputs
OE
A
,
OE
B
L
L
H
H
IN
A
, IN
B
L
H
L
H
OAn, OBn
L
H
Z
Z
Outputs
MON
L
H
L
H
CAPACITANCE
(T
A
= +25
O
C, f = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3
—
Max.
4
6
Unit
pF
pF
NOTE:
1. H = HIGH
L = LOW
Z = High-Impedance
NOTE:
1. This parameter is measured at characterization but not tested.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified
Industrial: T
A
= -40°C to +85°C, V
CC
= 3.3V ± 0.3V
Symbol
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
V
IK
I
ODH
I
ODL
I
OS
V
OH
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current
Input LOW Current
High Impedance Output Current
(3-State Outputs Pins)
Clamp Diode Voltage
Output HIGH Current
Output LOW Current
Short Circuit Current
Output HIGH Voltage
V
CC
= Min., I
IN
= –18mA
V
CC
= 3.3V, V
IN
= V
IH
or V
IL
, V
O
= 1.5V
(3,4)
V
CC
= 3.3V, V
IN
= V
IH
or V
IL
, V
O
= 1.5V
(3,4)
V
CC
= Max., V
O
= GND
(3,4)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
OL
Output LOW Voltage
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –12mA
I
OH
= –8mA
I
OH
= –100μA
I
OL
= 12mA
I
OL
= 8mA
I
OL
= 100μA
V
CC
= Max.
V
CC
= Max.
V
CC
= Max.
V
I
= 5.5V
V
I
= GND
V
O
= V
CC
V
O
= GND
Test Conditions
(1)
Min.
2
–0.5
—
—
—
—
—
–45
50
–60
2.4
(5)
2.4
(5)
V
CC
- 0.2
—
—
—
Typ.
(2)
—
—
—
—
—
—
–0.7
–74
90
–135
3
3
—
0.3
0.2
—
Max.
5.5
0.8
±1
±1
±1
±1
–1.2
–180
200
–240
—
—
—
0.4
0.4
0.2
V
V
V
mA
mA
mA
µA
Unit
V
V
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 3.3V, 25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This parameter is guaranteed but not tested.
5. V
OH
= Vcc -0.6V at rated current.
2
IDT49FCT3805D/E
3.3V CMOS DUAL 1-TO-5 CLOCK DRIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol
I
CCL
I
CCH
I
CCZ
ΔI
CC
I
CCD
Power Supply Current per Input HIGH
Dynamic Power Supply Current
per Output
(3)
I
C
Total Power Supply Current
(4)
V
CC
= Max.
V
IN
= V
CC –
0.6V
V
CC
= Max.
C
L
= 15pF
All Outputs Toggling
V
CC
= Max.
C
L
= 15pF
All Outputs Toggling
fi = 133MHz
V
CC
= Max.
C
L
= 15pF
All Outputs Toggling
fi = 166MHz
NOTES:
1.
2.
3.
4.
For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
Typical values are at V
CC
= 3.3V, +25°C ambient.
This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
ΔI
CC
D
H
N
T
+ I
CCD
(f
O
N
O
)
I
CC
= Quiescent Current (I
CCL
, I
CCH
and I
CCZ
)
ΔI
CC
= Power Supply Current for a TTL High Input (V
I
N
= V
CC
-0.6V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f
O
= Output Frequency
N
O
= Number of Outputs at f
O
Parameter
Quiescent Power Supply Current
V
CC
= Max.
Test Conditions
(1)
V
IN
= GND or V
CC
Min.
—
Typ.
(2)
0.1
Max.
30
Unit
µA
—
V
IN
= V
CC
V
IN
= GND
V
IN
= V
CC
V
IN
= GND
V
IN
= V
CC –
0.6V
V
IN
= GND
V
IN
= V
CC
V
IN
= GND
V
IN
= V
CC –
0.6V
V
IN
= GND
—
—
—
—
—
45
80
300
120
µA
µ A/MHz
125
125
155
160
150
150
mA
195
195
3
IDT49FCT3805D/E
3.3V CMOS DUAL 1-TO-5 CLOCK DRIVER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE - 3805D
(3,4)
Symbol
t
PLH
t
PHL
t
R
t
F
t
SK(O)
t
SK(P)
t
SK(PP)
t
PZL
t
PZH
t
PLZ
t
PHZ
f
MAX
Parameter
Propagation Delay
IN
A
to OAn, IN
B
to OBn
Output Rise Time (0.8V to 2V)
Output Fall Time (2V to 0.8V)
Same device output pin to pin skew
(5)
Pulse skew
(6,9)
Part to part skew
(7)
Output Enable Time
OE
A
to OAn,
OE
B
to OBn
Output Disable Time
OE
A
to OAn,
OE
B
to OBn
Input Frequency
—
133
MHz
—
5.2
ns
Conditions
(1)
C
L
= 15pF
f
≤
133MHz
—
—
—
—
—
—
1.5
1.5
270
270
550
5.2
ns
ns
ps
ps
ps
ns
Min
.
(2)
1
Max
.
3
Unit
ns
SWITCHING CHARACTERISTICS OVER OPERATING RANGE - 3805E
(3,4)
Symbol
t
PLH
t
PHL
t
R
t
F
t
SK(O)
t
SK(P)
t
SK(PP)
t
PZL
t
PZH
t
PLZ
t
PHZ
f
MAX
Parameter
Propagation Delay
IN
A
to OAn, IN
B
to OBn
Output Rise Time (0.8V to 2V)
Output Fall Time (2V to 0.8V)
Same device output pin to pin skew
(5)
Pulse skew
(6,9)
Part to part skew
(7)
Output Enable Time
OE
A
to OAn,
OE
B
to OBn
Output Disable Time
OE
A
to OAn,
OE
B
to OBn
Input Frequency
—
166
MHz
—
5.2
ns
Conditions
(1,8)
C
L
= 15pF
f
≤
166MHz
—
—
—
—
—
—
1
1
200
270
550
5.2
ns
ns
ps
ps
ps
ns
Min
.
(2)
0.5
Max
.
2.5
Unit
ns
NOTES:
1. See test circuits and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. t
PLH
, t
PHL
, t
SK
(
P
), and t
SK
(
O
) are production tested. All other parameters guaranteed but not production tested.
4. Propagation delay range indicated by Min. and Max. limit is due to V
CC
, operating temperature and process parameters. These propagation delay limits do not imply skew.
5. Skew measured between all outputs under identical transitions and load conditions.
6. Skew measured is difference between propagation delay times t
PHL
and t
PLH
of same outputs under identical load conditions.
7. Part to part skew for all outputs given identical transitions and load conditions at identical V
CC
levels and temperature.
8. Airflow of 1m/s is recommended for frequencies above 133MHz.
9. This parameter is measured using f = 1MHz.
4
IDT49FCT3805D/E
3.3V CMOS DUAL 1-TO-5 CLOCK DRIVER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
6V
V
CC
O pen
G ND
500
Ω
V
IN
Pulse
Generator
R
T
D.U.T
R
L
C
L
500
Ω
V
O UT
Enable and Disable Time Circuit
V
CC
INPUT
t
PLH1
t
PH L1
3V
1.5V
0V
V
OH
1.5V
V
OL
V
IN
Pulse
Generator
R
T
D.U.T
R
L
V
O UT
C
L
OUTPUT 1
t
SK(o)
OUTPUT 2
t
PLH2
t
PH L2
t
SK(o)
V
OH
1.5V
V
OL
t
SK(o)
= |t
PLH2 -
t
PLH1
|
or
|t
P HL2 -
t
PHL1
|
C
L
= 15pF Test Circuit
Output Skew - t
SK(O)
SWITCH POSITION
Test
Disable Low
Enable Low
Disable High
Enable High
Switch
6V
GND
TEST CONDITIONS
Symbol
C
L
R
T
R
L
t
R
/ t
F
V
CC
= 3.3V ±0.3V
15
Z
OUT
of pulse generator
33
1 (0V to 3V or 3V to 0V)
Unit
pF
Ω
Ω
ns
DEFINITIONS:
C
L
= Load capacitance: includes jig and probe capacitance.
R
T
= Termination resistance: should be equal to Z
OUT
of the Pulse Generator.
t
R
/ t
F
= Rise/Fall time of the input stimulus from the Pulse Generator.
5
Embedded System
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