FAST CMOS
18-BIT REGISTERED
TRANSCEIVER
Integrated Device Technology, Inc.
IDT54/74FCT16501AT/CT/ET
IDT54/74FCT162501AT/CT/ET
IDT54/74FCT162H501AT/CT/ET
CMOS technology. These high-speed, low-power 18-bit reg-
istered bus transceivers combine D-type latches and D-type
• Common features:
flip-flops to allow data flow in transparent, latched and clocked
– 0.5 MICRON CMOS Technology
modes. Data flow in each direction is controlled by output-
– High-speed, low-power CMOS replacement for
enable (OEAB and
OEBA
), latch enable (LEAB and LEBA)
ABT functions
and clock (CLKAB and CLKBA) inputs. For A-to-B data flow,
–
Typical t
SK
(o) (Output Skew) < 250ps
the device operates in transparent mode when LEAB is HIGH.
– Low input and output leakage
≤
1µA (max.)
When LEAB is LOW, the A data is latched if CLKAB is held at
– ESD > 2000V per MIL-STD-883, Method 3015;
a HIGH or LOW logic level. If LEAB is LOW, the A bus data
> 200V using machine model (C = 200pF, R = 0)
is stored in the latch/flip-flop on the LOW-to-HIGH transition of
– Packages include 25 mil pitch SSOP, 19.6 mil pitch
TSSOP, 15.7 mil pitch TVSOP and 25 mil pitch Cerpack CLKAB. OEAB is the output enable for the B port. Data flow
from the B port to the A port is similar but requires using
OEBA
,
– Extended commercial range of -40°C to +85°C
LEBA and CLKBA. Flow-through organization of signal pins
• Features for FCT16501AT/CT/ET:
simplifies layout. All inputs are designed with hysteresis for
– High drive outputs (-32mA I
OH
, 64mA I
OL
)
improved noise margin.
– Power off disable outputs permit “live insertion”
The FCT16501AT/CT/ET are ideally suited for driving
– Typical V
OLP
(Output Ground Bounce) < 1.0V at
high-capacitance loads and low-impedance backplanes. The
V
CC
= 5V, T
A
= 25°C
output buffers are designed with power off disable capability
• Features for FCT162501AT/CT/ET:
to allow "live insertion" of boards when used as backplane
– Balanced Output Drivers:
±24mA
(commercial),
drivers.
±16mA
(military)
The FCT162501AT/CT/ET have balanced output drive
– Reduced system switching noise
with current limiting resistors. This offers low ground bounce,
– Typical V
OLP
(Output Ground Bounce) < 0.6V at
minimal undershoot, and controlled output fall times–reducing
V
CC
= 5V,T
A
= 25°C
the need for external series terminating resistors. The
• Features for FCT162H501AT/CT/ET:
FCT162501AT/CT/ET are plug-in replacements for the
– Bus Hold retains last active bus state during 3-state
FCT16501AT/CT/ET and ABT16501 for on-board bus inter-
– Eliminates the need for external pull up resistors
face applications.
The FCT162H501AT/CT/ET have "Bus Hold" which re-
DESCRIPTION:
tains the input's last state whenever the input goes to high
The FCT16501AT/CT/ET and FCT162501AT/CT/ET 18- impedance. This prevents "floating" inputs and eliminates the
bit registered transceivers are built using advanced dual metal need for pull-up/down resistors.
FEATURES:
FUNCTIONAL BLOCK DIAGRAM
OEAB
CLKBA
LEBA
OEBA
CLKAB
LEAB
C
A
1
D
C
B
1
D
C
D
C
D
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
TO 17 OTHER CHANNELS
2547 drw 01
MILITARY AND COMMERCIAL TEMPERATURE RANGES
©1996
Integrated Device Technology, Inc.
AUGUST 1996
DSC-2547/8
5.10
1
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
OEAB
LEAB
A
1
GND
A
2
A
3
V
CC
A
4
A
5
A
6
GND
A
7
A
8
A
9
A
10
A
11
A
12
GND
A
13
A
14
A
15
V
CC
A
16
A
17
GND
A
18
OEBA
LEBA
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
56
55
54
53
52
51
50
49
48
47
46
45
44
SO56-1 43
SO56-2
SO56-3 42
41
40
39
38
37
36
35
34
33
32
31
30
29
GND
CLKAB
B
1
GND
B
2
B
3
V
CC
B
4
B
5
B
6
GND
B
7
B
8
B
9
B
10
B
11
B
12
GND
B
13
B
14
B
15
V
CC
B
16
B
17
GND
B
18
CLKBA
GND
2547 drw 02
OEAB
LEAB
A
1
GND
A
2
A
3
V
CC
A
4
A
5
A
6
GND
A
7
A
8
A
9
A
10
A
11
A
12
GND
A
13
A
14
A
15
V
CC
A
16
A
17
GND
A
18
OEBA
LEBA
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
E56-1
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
2547 drw 03
GND
CLKAB
B
1
GND
B
2
B
3
V
CC
B
4
B
5
B
6
GND
B
7
B
8
B
9
B
10
B
11
B
12
GND
B
13
B
14
B
15
V
CC
B
16
B
17
GND
B
18
CLKBA
GND
SSOP/
TSSOP/TVSOP
TOP VIEW
CERPACK
TOP VIEW
5.10
2
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION
Pin Names
OEAB
Description
A-to-B Output Enable Input
B-to-A Output Enable Input (Active LOW)
A-to-B Latch Enable Input
B-to-A Latch Enable Input
A-to-B Clock Input
B-to-A Clock Input
A-to-B Data Inputs or B-to-A 3-State Outputs
(1)
B-to-A Data Inputs or A-to-B 3-State Outputs
(1)
FUNCTION TABLE
(1,4)
Inputs
LEAB
CLKAB
X
H
H
L
L
L
L
X
X
X
↑
↑
L
H
Outputs
Bx
Z
L
H
L
H
B
(2)
B
(3)
OEBA
LEAB
LEBA
CLKAB
CLKBA
Ax
Bx
OEAB
L
H
H
H
H
H
H
Ax
X
L
H
L
H
X
X
NOTE:
2547 tbl 01
1. On FCT16xH501T these pins have “Bus Hold”. All other pins are standard
inputs, outputs or I/Os.
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Description
Max.
V
TERM(2)
Terminal Voltage with Respect to –0.5 to +7.0
GND
V
TERM(3)
Terminal Voltage with Respect to
–0.5 to
GND
V
CC
+0.5
T
STG
Storage Temperature
–65 to +150
I
OUT
DC Output Current
–60 to +120
Unit
V
V
°C
mA
NOTES:
2547 tbl 02
1. A-to-B data flow is shown. B-to-A data flow is similar but uses
OEBA
,
LEBA, and CLKBA.
2. Output level before the indicated steady-state input conditions were
established.
3. Output level before the indicated steady-state input conditions were
established, provided that CLKAB was HIGH before LEAB went LOW.
4. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
Z = High-impedance
↑ =
LOW-to-HIGH Transition
2547 lnk 03
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. All device terminals except FCT162XXXT Output and I/O terminals.
3. Output and I/O terminals for FCT162XXXT.
CAPACITANCE
(T
A
= +25°C, f = 1.0MHz)
Symbol
Parameter
(1)
C
IN
Input
Capacitance
C
I/O
I/O
Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
3.5
Max. Unit
6.0
pF
8.0
pF
2547 lnk 04
NOTE:
1. This parameter is measured at characterization but not tested.
5.10
3
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (STANDARD PARTS)
Following Conditions Apply Unless Otherwise Specified:
Commercial: T
A
= –40°C to +85°C, V
CC
= 5.0V
±
10%; Military: T
A
= –55°C to +125°C, V
CC
= 5.0V
±
10%
Symbol
V
IH
V
IL
I
I H
I
I L
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current (Input pins)
(5)
Input HIGH Current (I/O pins)
(5)
Input LOW Current (Input pins)
(5)
Input LOW Current (I/O pins)
(5)
High Impedance Output Current
(3-State Output pins)
(5)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
V
I
= GND
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
Min.
2.0
—
—
—
—
—
—
—
—
–80
—
—
Typ.
(2)
—
—
—
—
—
—
—
—
–
0.7
–
140
Max.
—
Unit
V
V
µA
0.8
±1
±1
±1
±1
±1
±1
–
1.2
–
225
—
µA
V
mA
mV
µA
100
5
V
CC
= Max., V
IN
= GND or V
CC
500
2547 lnk 05
OUTPUT DRIVE CHARACTERISTICS FOR FCT16501T
Symbol
I
O
V
OH
Parameter
Output Drive Current
Output HIGH Voltage
Test Conditions
(1)
V
CC
= Max., V
O
= 2.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –3mA
I
OH
= –12mA MIL.
I
OH
= –15mA COM'L.
I
OH
= –24mA MIL.
I
OH
= –32mA COM'L.
(4)
I
OL
= 48mA MIL.
I
OL
= 64mA COM'L.
≤
4.5V
Min.
–50
2.5
2.4
2.0
—
—
Typ.
(2)
—
Max.
–
180
—
—
—
0.55
±1
Unit
mA
V
V
V
V
µA
2547 lnk 06
3.5
3.5
3.0
0.2
—
V
OL
I
OFF
Output LOW Voltage
Input/Output Power Off Leakage
(5)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= 0V, V
IN
or V
O
OUTPUT DRIVE CHARACTERISTICS FOR FCT162501T
Symbol
I
ODL
I
ODH
V
OH
V
OL
Parameter
Output LOW Current
Output HIGH Current
Output HIGH Voltage
Output LOW Voltage
Test Conditions
(1)
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
OUT
= 1.5V
(3)
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
OUT
= 1.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –16mA MIL.
I
OH
= –24mA COM'L.
I
OL
= 16mA MIL.
I
OL
= 24mA COM'L.
Min.
60
–60
2.4
—
Typ.
(2)
115
–115
3.3
0.3
Max.
200
–200
—
0.55
Unit
mA
mA
V
V
2547 lnk 07
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is
±
5µA at T
A
= –55°C.
5.10
4
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (BUS HOLD)
Following Conditions Apply Unless Otherwise Specified:
Commercial: T
A
= –40°C to +85°C, V
CC
= 5.0V
±
10%; Military: T
A
= –55°C to +125°C, V
CC
= 5.0V
±
10%
Symbol
V
IH
V
IL
I
I H
Parameter
Input HIGH Level
Input LOW Level
Input
HIGH
Current
(4)
I
I L
Input
LOW
Current
(4)
I
BHH
I
BHL
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
Bus Hold
Standard Input
(5)
Standard I/O
(5)
Bus-Hold Input
Bus-Hold I/O
Standard Input
(5)
Standard I/O
(5)
Bus-Hold Input
Bus-Hold I/O
Bus-Hold Input
V
CC
= Min.
V
I
= 2.0V
V
I
= 0.8V
V
CC
= Max.
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
Min.
2.0
—
—
—
—
—
Typ.
(2)
—
—
—
—
—
—
—
—
—
—
—
—
—
—
–
0.7
–
140
Max.
—
Unit
V
V
0.8
±
1
±
1
±
100
±
100
±
1
±
1
±
100
±
100
—
—
µ
A
V
I
= GND
—
—
—
—
–50
+50
—
—
—
–80
—
—
µ
A
Sustain
Current
(4)
High Impedance Output Current
(3-State Output pins)
(5,6)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
O
= 2.7V
V
O
= 0.5V
±
1
±
1
–
1.2
–
225
—
µ
A
V
mA
mV
100
5
V
CC
= Max., V
IN
= GND or V
CC
500
µ
A
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Pins with Bus Hold are identified in the pin description.
5. The test limit for this parameter is
±
5µA at T
A
= –55°C.
6. Does not include Bus Hold I/O pins.
2547 lnk 08
5.10
5
Embedded System
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