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DF3A5.6FU(F)

Description
5.6V, 0.1W, SILICON, UNIDIRECTIONAL VOLTAGE REGULATOR DIODE
CategoryDiscrete semiconductor    diode   
File Size121KB,3 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Environmental Compliance
Download Datasheet Parametric View All

DF3A5.6FU(F) Overview

5.6V, 0.1W, SILICON, UNIDIRECTIONAL VOLTAGE REGULATOR DIODE

DF3A5.6FU(F) Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
MakerToshiba Semiconductor
package instructionR-PDSO-G3
Reach Compliance Codeunknown
ECCN codeEAR99
ConfigurationCOMMON ANODE, 2 ELEMENTS
Diode component materialsSILICON
Diode typeZENER DIODE
Maximum dynamic impedance40 Ω
JESD-30 codeR-PDSO-G3
Number of components2
Number of terminals3
Maximum operating temperature125 °C
Package body materialPLASTIC/EPOXY
Package shapeRECTANGULAR
Package formSMALL OUTLINE
polarityUNIDIRECTIONAL
Maximum power dissipation0.1 W
Nominal reference voltage5.6 V
surface mountYES
technologyZENER
Terminal formGULL WING
Terminal locationDUAL
Maximum voltage tolerance6.19%
Working test current5 mA
Base Number Matches1
DF3A5.6FU
TOSHIBA Diodes for Protecting against ESD Epitaxial Planar Type
DF3A5.6FU
Diodes for Protecting against ESD
Unit: mm
The mounting of two devices on an ultra-compact package allows the
number of parts and the mounting cost to be reduced.
The zener voltage corresponds to the E24 Series.
Maximum Ratings
(Ta = 25°C)
Characteristics
Power dissipation
Junction temperature
Storage temperature range
Symbol
P
T
j
T
stg
Rating
100
125
−55~125
Unit
mW
°C
°C
JEDEC
JEITA
TOSHIBA
1-2P1A
Electrical Characteristics
(Ta = 25°C)
Characteristics
Zener voltage
Dynamic impedance
Reverse current
Terminal capacitance
(between Cathode and Anode)
Symbol
V
Z
Z
Z
I
R
C
T
I
Z
=
5 mA
I
Z
=
5 mA
V
R
=
2.5 V
V
R
= 0, f = 1 MHz
Test Condition
Weight: 0.006 g (typ.)
Min
5.3
Typ.
5.6
65
Max
6.0
40
1.0
Unit
V
µA
pF
Guaranteed Level of ESD Immunity
Test Condition
IEC61000-4-2
(Contact discharge)
ESD Immunity Level
±30 kV
Criterion: No damage to device elements
Marking
Equivalent Circuit
(top view)
5.6
1
2004-09-06

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