System Hardware Monitor with
Remote Diode Thermal Sensing
ADM1024
FEATURES
Up to 9 Measurement Channels
Inputs Programmable-to-Measure Analog Voltage, Fan
Speed, or External Temperature
External Temperature Measurement with Remote
Diode (2 Channels)
On-Chip Temperature Sensor
5 Digital Inputs for VID Bits
LDCM Support
System Management Bus (SMBus)
Chassis Intrusion Detect
Interrupt and Overtemperature Outputs
Programmable
RESET
Input Pin
Shutdown Mode to Minimize Power Consumption
Limit Comparison of All Monitored Values
APPLICATIONS
Network Servers and Personal Computers
Microprocessor Based Office Equipment
Test Equipment and Measuring Instruments
GENERAL DESCRIPTION
The ADM1024 is a complete system hardware monitor for
microprocessor based systems, providing measurement and limit
comparison of various system parameters. Eight measurement
inputs are provided; three are dedicated to monitoring 5 V and
12 V power supplies and the processor core voltage. The
ADM1024 can monitor a fourth power supply voltage by mea-
suring its own V
CC
. One input (two pins) is dedicated to a
remote temperature-sensing diode. Two more pins can be
(continued on page 7)
FUNCTIONAL BLOCK DIAGRAM
V
CC
VID0/IRQ0
VID1/IRQ1
VID2/IRQ2
VID3/IRQ3
100k
PULL-UPS
VID4/IRQ4
VID4 AND
DEVICE ID
REGISTER
FAN SPEED
COUNTER
ADDRESS
POINTER
REGISTER
VID0–3 AND
FAN DIVISOR
REGISTER
ADM1024
NTEST OUT/ADD
SERIAL BUS
INTERFACE
SDA
SCL
CHANNEL
MODE
REGISTER
VALUE AND
LIMIT
REGISTERS
FAN1/AIN1
FAN2/AIN2
+V
CCP1
+2.5V
IN
/D2+
+5V
IN
+12V
IN
V
CCP2
/D2–
D1+
D1–
POWER TO CHIP
V
CC
BAND GAP
TEMPERATURE
SENSOR
INPUT
ATTENUATORS
AND
ANALOG
MULTIPLEXER
LIMIT
COMPARATORS
INTERRUPT
STATUS
REGISTERS
INT
MASK
REGISTERS
INTERRUPT
MASKING
100k
CONFIGURATION
REGISTERS
INT
100k
THERM
V
CC
TEMPERATURE
CONFIGURATION
REGISTER
CI
V
CC
10-BIT ADC
ANALOG
OUTPUT
REGISTER AND
8-BIT DAC
CHASSIS
INTRUSION
CLEAR
REGISTER
100k
NTEST IN/AOUT
V
CC
2.5V
BAND GAP
REFERENCE
RESET
GND
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
www.analog.com
Fax: 781/326-8703
© 2004 Analog Devices, Inc. All rights reserved.
ADM1024–SPECIFICATIONS
1, 2
(T = T
A
MIN
to T
MAX
, V
CC
= V
MIN
to V
MAX
, unless otherwise noted.)
Max
5.5
3.5
145
±
3
±
2
±
5
150
9
Unit Test Conditions/Comments
V
mA
mA
µA
°C
°C
°C
°C
°C
°C
µA
µA
Parameter
POWER SUPPLY
Supply Voltage, V
CC
Supply Current, I
CC
Min
2.8
Typ
3.30
1.4
1.0
45
Interface Inactive, ADC Active
ADC Inactive, DAC Active
Shutdown Mode
0°C
≤
T
A
≤
100°C
T
A
= 25°C
0°C
≤
T
A
≤
100°C
25°C
High Level
Low Level
TEMPERATURE-TO-DIGITAL CONVERTER
Internal Sensor Accuracy
Resolution
External Diode Sensor Accuracy
Resolution
Remote Sensor Source Current
ANALOG-TO-DIGITAL CONVERTER
(INCLUDING MUX AND ATTENUATORS)
Total Unadjusted Error, TUE (12 V
IN
)
3
TUE (AIN, V
CCP
, 2.5 V
IN
, 5 V
IN
)
Differential Nonlinearity, DNL
Power Supply Sensitivity
Conversion Time (Analog Input or Int. Temp.)
Conversion Time (External Temperature)
4
Input Resistance (2.5 V, 5 V, 12 V, V
CCP1
, V
CCP2
)
Input Resistance (AIN1, AIN2)
ANALOG OUTPUT
Output Voltage Range
Total Unadjusted Error, TUE
Full-Scale Error
Zero-Scale Error
Differential Nonlinearity, DNL
Integral Nonlinearity
Output Source Current
Output Sink Current
FAN RPM-TO-DIGITAL CONVERTER
Accuracy
Full-Scale Count
FAN1 and FAN2 Nominal Input RPM
5
±
1
±
3
±
1
110
6.5
80
4
80
±
1
754.8
9.6
140
5
±
4
±
3
±
1
856.8
200
%
%
LSB
%/V
µs
ms
kΩ
MΩ
0°C
≤
T
A
≤
100°C
4
0
±
1
2
±
1
2
1
2.5
±
3
±
5
±
1
V
%
I
L
= 2 mA
%
LSB No Load
LSB Monotonic by Design
LSB
mA
mA
%
rpm
rpm
rpm
rpm
kHz
V
V
0°C
≤
T
A
≤
100°C
Divisor = 1, Fan Count = 153
Divisor = 2, Fan Count = 153
Divisor = 3, Fan Count = 153
Divisor = 4, Fan Count = 153
0°C
≤
T
A
≤
100°C
I
OUT
= +3.0 mA, V
CC
= 2.85 V – 3.60 V
I
OUT
= –3.0 mA, V
CC
= 2.85 V – 3.60 V
±
12
255
8800
4400
2200
1100
22.5
Internal Clock Frequency
DIGITAL OUTPUTS NTEST_OUT
Output High Voltage, V
OH
Output Low Voltage, V
OL
OPEN-DRAIN DIGITAL OUTPUTS
6
(INT,
THERM, RESET)
Output Low Voltage, V
OL
High Level Output Current, I
OH
RESET
and CI Pulsewidth
OPEN-DRAIN SERIAL DATA BUS OUTPUT (SDA)
Output Low Voltage, V
OL
High Level Output Current, I
OH
19.8
2.4
25.2
0.4
20
0.1
45
0.4
100
V
µA
ms
V
µA
I
OUT
= –3.0 mA, V
CC
= 3.60 V
V
OUT
= V
CC
0.1
0.4
100
I
OUT
= –3.0 mA, V
CC
= 2.85 V – 3.60 V
V
OUT
= V
CC
–2–
REV. B
ADM1024
Parameter
SERIAL BUS DIGITAL INPUTS
(SCL, SDA)
Input High Voltage, V
IH
Input Low Voltage, V
IL
Hysteresis
Glitch Immunity
DIGITAL INPUT LOGIC LEVELS
7
(ADD, CI,
RESET,
VID0–VID4, FAN1, FAN2)
Input High Voltage, V
IH
Input Low Voltage, V
IL
NTEST_IN
Input High Voltage, V
IH
DIGITAL INPUT CURRENT
Input High Current, I
IH
Input Low Current, I
IL
Input Capacitance, C
IN
SERIAL BUS TIMING
8
Clock Frequency, f
SCLK
Glitch Immunity, t
SW
Bus Free Time, t
BUF
Start Setup Time, t
SU; STA
Start Hold Time, t
HD; STA
SCL Low Time, t
LOW
SCL High Time, t
HIGH
SCL, SDA Rise Time, t
r
SCL, SDA Fall Time, t
f
Data Setup Time, t
SU; DAT
Data Hold Time, t
HD; DAT
Min
Typ
Max
Unit Test Conditions/Comments
2.2
0.8
500
100
V
V
mV
ns
2.2
0.8
2.2
–1
1
20
400
50
1.3
600
600
1.3
0.6
300
300
100
900
V
V
V
µA
µA
pF
kHz
ns
µs
ns
ns
µs
µs
ns
ns
ns
ns
V
CC
= 2.85 V – 5.5 V
V
CC
= 2.85 V – 5.5 V
V
CC
= 2.85 V – 5.5 V
V
IN
= V
CC
V
IN
= 0
See Figure 1
See Figure 1
See Figure 1
See Figure 1
See Figure 1
See Figure 1
See Figure 1
See Figure 1
See Figure 1
See Figure 1
See Figure 1
NOTES
1
All voltages are measured with respect to GND, unless otherwise specified.
2
Typicals are at T
A
= 25°C and represent most likely parametric norm. Shutdown current typ is measured with V
CC
= 3.3 V.
3
TUE (Total Unadjusted Error) includes Offset, Gain, and Linearity errors of the ADC, multiplexer, and on-chip input attenuators, including an external series input
protection resistor value between 0 kΩ and 1 kΩ.
4
Total monitoring cycle time is nominally
m
×
755
µs
+
n
×
33244
µs,
where
m
is the number of channels configured as analog inputs, plus 2 for the internal V
CC
measurement and internal temperature sensor, and
n
is the number of channels configured as external temperature channels (D1 and D2).
5
The total fan count is based on two pulses per revolution of the fan tachometer output.
6
Open-drain digital outputs may have an external pull-up resistor connected to a voltage lower or higher than V
CC
(up to 6.5 V absolute maximum).
7
All logic inputs except ADD are tolerant of 5 V logic levels, even if V
CC
is less than 5 V. ADD is a three-state input that may be connected to V
CC
, GND, or left
open-circuit.
8
Timing specifications are tested at logic levels of V
IL
= 0.8 V for a falling edge and V
IH
= 2.2 V for a rising edge.
Specifications subject to change without notice.
t
R
t
LOW
SCL
t
F
t
HD:STA
t
HD:STA
SDA
t
HD:DAT
t
HIGH
t
SU:DAT
t
SU:STA
t
SU:STO
t
BUF
P
S
S
P
Figure 1. Diagram for Serial Bus Timing
REV. B
–3–
ADM1024
ABSOLUTE MAXIMUM RATINGS*
PIN CONFIGURATION
NTEST OUT/ADD
THERM
SDA
SCL
FAN1/AIN1
FAN2/AIN2
CI
GND
V
CC
1
2
3
4
5
6
24
VID0/IRQ0
23
VID1/IRQ1
22
VID2/IRQ2
21
VID3/IRQ3
Positive Supply Voltage (V
CC
) . . . . . . . . . . . . . . . . . . . . . 6.5 V
Voltage on 12 V V
IN
Pin . . . . . . . . . . . . . . . . . . . . . . . . . 20 V
Voltage on AOUT, N TEST_OUT ADD,
2.5 V
IN
/D2+ . . . . . . . . . . . . . . . . . . –0.3 V to (V
CC
+ 0.3 V)
Voltage on Any Other Input or Output Pin . . –0.3 V to +6.5 V
Input Current at Any Pin . . . . . . . . . . . . . . . . . . . . . . .
±
5 mA
Package Input Current . . . . . . . . . . . . . . . . . . . . . . .
±
20 mA
Maximum Junction Temperature (T
J
max) . . . . . . . . . . 150°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature, Soldering
Vapor Phase 60 sec . . . . . . . . . . . . . . . . . . . . . . . . . . 235°C
Infrared 15 sec . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 200°C
ESD Rating All Pins . . . . . . . . . . . . . . . . . . . . . . . . . . 2000 V
*Stresses
above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
19
+V
CCP1
TOP VIEW
7
(Not to Scale)
18
+2.5V
IN
/D2+
8
9
17
V
CCP2
/D2–
16
+5V
IN
15
+12V
IN
14
D1+
13
D1–
ADM1024
20
VID4/IRQ4
INT
10
NTEST IN/AOUT
11
RESET
12
THERMAL CHARACTERISTICS
24-Lead, Small Outline Package:
JA
= 50°C/W,
JC
= 10°C/W
ORDERING GUIDE
Model
ADM1024ARU
ADM1024ARU-REEL
ADM1024ARU-REEL7
ADM1024ARUZ*
ADM1024ARUZ-REEL*
ADM1024ARUZ-REEL7*
EVAL-ADM1024EB
*Z
= Pb-free part.
Temperature
Range
0°C to 100°C
0°C to 100°C
0°C to 100°C
0°C to 100°C
0°C to 100°C
0°C to 100°C
Package
Description
24-Lead TSSOP
24-Lead TSSOP
24-Lead TSSOP
24-Lead TSSOP
24-Lead TSSOP
24-Lead TSSOP
Evaluation Board
Package
Option
RU-24
RU-24
RU-24
RU-24
RU-24
RU-24
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
ADM1024 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
–4–
REV. B
ADM1024
PIN FUNCTION DESCRIPTIONS
Pin
No.
1
2
3
4
5
6
7
Mnemonic
NTEST_OUT/ADD
THERM
SDA
SCL
FAN1/AIN1
FAN2/AIN2
CI
Description
Digital I/O. Dual function pin. This is a three-state input that controls the two LSBs of the Serial
Bus Address. This pin functions as an output when doing a NAND test.
Digital I/O. Dual function pin. This pin functions as an interrupt output for temperature interrupts
only, or as an interrupt input for fan control. It has an on-chip 100 kΩ pull-up resistor.
Digital I/O. Serial bus bidirectional data. Open-drain output.
Digital Input. Serial bus clock.
Programmable Analog/Digital Input. 0 V to 2.5 V analog input or digital (0 to V
CC
) amplitude fan
tachometer input.
Programmable Analog/Digital Input. 0 V to 2.5 V analog input or digital (0 to V
CC
) amplitude fan
tachometer input.
Digital I/O. An active high input from an external latch that captures a Chassis Intrusion event.
This line can go high without any clamping action, regardless of the powered state of the ADM1024.
The ADM1024 provides an internal open drain on this line, controlled by Bit 6 of Register 40h or
Bit 7 of Register 46h, to provide a minimum 20 ms pulse on this line to reset the external Chassis
Intrusion Latch.
System Ground
Power (2.8 V to 5.5 V). Typically powered from 3.3 V power rail. Bypass with the parallel combi-
nation of 10
µF
(electrolytic or tantalum) and 0.1
µF
(ceramic) bypass capacitors.
Digital Output. Interrupt request (open-drain). The output is enabled when Bit 1 of Register 40h is
set to 1. The default state is disabled. It has an on-chip 100 kΩ pull-up resistor.
Digital Input/Analog Output. An active-high input that enables NAND Test mode board-level
connectivity testing. Refer to the section on NAND testing. Also functions as a programmable
analog output when NAND Test is not selected.
Digital I/O. Master Reset, 5 mA driver (open drain), active low output with a 45 ms minimum
pulsewidth. Set using Bit 4 in Register 40h. Also acts as reset input when pulled low (e.g., power-
on reset). It has an on-chip 100 kΩ pull-up resistor.
Analog Input. Connected to cathode of first external temperature-sensing diode.
Analog Input. Connected to anode of first external temperature-sensing diode.
Programmable Analog Input. Monitors 12 V supply.
Analog Input. Monitors 5 V supply.
Programmable Analog Input. Monitors second processor core voltage or cathode of second external
temperature-sensing diode.
Programmable Analog Input. Monitors 2.5 V supply or anode of second external temperature-
sensing diode.
Analog Input. Monitors first processor core voltage (0 V to 3.6 V).
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID4
Status Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up
resistor.
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID0–VID3
Status Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up
resistor.
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID0–VID3
Status Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up
resistor.
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID0–VID3
Status Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up
resistor.
Digital Input. Core Voltage ID readouts from the processor. This value is read into the VID0–VID3
Status Register. Can also be reconfigured as an interrupt input. It has an on-chip 100 kΩ pull-up
resistor.
8
9
10
11
GND
V
CC
INT
NTEST_IN/AOUT
12
RESET
13
14
15
16
17
18
19
20
D1–
D1+
+12 V
IN
+5 V
IN
V
CCP2
/D2–
+2.5 V
IN
/D2+
+V
CCP1
VID4/IRQ4
21
VID3/IRQ3
22
VID2/IRQ2
23
VID1/IRQ1
24
VID0/IRQ0
REV. B
–5–
NXP MCU
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