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ispLSI2128VL-135LT100I

Description
2.5V In-System Programmable SuperFAST⑩ High Density PLD
CategoryProgrammable logic devices    Programmable logic   
File Size164KB,17 Pages
ManufacturerLattice
Websitehttp://www.latticesemi.com
Download Datasheet Parametric View All

ispLSI2128VL-135LT100I Overview

2.5V In-System Programmable SuperFAST⑩ High Density PLD

ispLSI2128VL-135LT100I Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerLattice
Parts packaging codeQFP
package instructionTQFP-100
Contacts100
Reach Compliance Code_compli
ECCN codeEAR99
Other featuresYES
maximum clock frequency95 MHz
In-system programmableYES
JESD-30 codeS-PQFP-G100
JESD-609 codee0
JTAG BSTYES
length14 mm
Humidity sensitivity level3
Dedicated input times4
Number of I/O lines64
Number of macro cells128
Number of terminals100
Maximum operating temperature85 °C
Minimum operating temperature-40 °C
organize4 DEDICATED INPUTS, 64 I/O
Output functionMACROCELL
Package body materialPLASTIC/EPOXY
encapsulated codeLFQFP
Encapsulate equivalent codeQFP100,.63SQ,20
Package shapeSQUARE
Package formFLATPACK, LOW PROFILE, FINE PITCH
Peak Reflow Temperature (Celsius)240
power supply2.5 V
Programmable logic typeEE PLD
propagation delay10 ns
Certification statusNot Qualified
Maximum seat height1.6 mm
Maximum supply voltage2.7 V
Minimum supply voltage2.3 V
Nominal supply voltage2.5 V
surface mountYES
technologyCMOS
Temperature levelINDUSTRIAL
Terminal surfaceTin/Lead (Sn/Pb)
Terminal formGULL WING
Terminal pitch0.5 mm
Terminal locationQUAD
Maximum time at peak reflow temperature30
width14 mm
ispLSI 2128VL
2.5V In-System Programmable
SuperFAST™ High Density PLD
Features
• SuperFAST HIGH DENSITY IN-SYSTEM
PROGRAMMABLE LOGIC
6000 PLD Gates
128 and 64 I/O Pin Versions, Eight Dedicated Inputs
128 Registers
High Speed Global Interconnect
Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
— 100% Functional, JEDEC and Pinout Compatible
with ispLSI 2128V and 2128VE Devices
• 2.5V LOW VOLTAGE 2128 ARCHITECTURE
— Interfaces with Standard 3.3V Devices (Inputs and
I/Os are 3.3V Tolerant)
— 125 mA Typical Active Current
• HIGH PERFORMANCE E
2
CMOS
®
TECHNOLOGY
®
Functional Block Diagram*
Output Routing Pool (ORP)
D7
D6
D5
D4
Output Routing Pool (ORP)
D3
D2
D1
D0
C7
Output Routing Pool (ORP)
A0
A1
C6
A2
D
Q
C5
A3
D
Q
C4
Output Routing Pool (ORP)
A4
D
Q
GLB
C3
A5
D
Q
C2
A6
C1
A7
B0
B1
Global Routing Pool (GRP)
B2
B3
B4
B5
B6
B7
C0
f
max
= 150 MHz Maximum Operating Frequency
t
pd
= 6.0 ns Propagation Delay
Electrically Erasable and Reprogrammable
Non-Volatile
100% Tested at Time of Manufacture
Unused Product Term Shutdown Saves Power
Output Routing Pool (ORP)
Output Routing Pool (ORP)
*128 I/O version shown
CLK 0
CLK 1
CLK 2
0139A/2128VL
Description
The ispLSI 2128VL is a High Density Programmable
Logic Device available in 128 and 64 I/O-pin versions.
The device contains 128 Registers, eight Dedicated
Input pins, three Dedicated Clock Input pins, two dedi-
cated Global OE input pins and a Global Routing Pool
(GRP). The GRP provides complete interconnectivity
between all of these elements. The ispLSI 2128VL fea-
tures in-system programmability through the Boundary
Scan Test Access Port (TAP) and is 100% IEEE 1149.1
Boundary Scan Testable. The ispLSI 2128VL offers non-
volatile reprogrammability of the logic, as well as the
interconnect to provide truly reconfigurable systems.
The basic unit of logic on the ispLSI 2128VL device is the
Generic Logic Block (GLB). The GLBs are labeled A0, A1
.. D7 (see Figure 1). There are a total of 32 GLBs in the
ispLSI 2128VL device. Each GLB is made up of four
macrocells. Each GLB has 18 inputs, a programmable
AND/OR/Exclusive OR array, and four outputs which can
be configured to be either combinatorial or registered.
Inputs to the GLB come from the GRP and dedicated
inputs. All of the GLB outputs are brought back into the
GRP so that they can be connected to the inputs of any
GLB on the device.
• IN-SYSTEM PROGRAMMABLE
— 2.5V In-System Programmability (ISP™) Using
Boundary Scan Test Access Port (TAP)
— Open-Drain Output Option for Flexible Bus Interface
Capability, Allowing Easy Implementation of Wired-
OR Bus Arbitration Logic
— Increased Manufacturing Yields, Reduced Time-to-
Market and Improved Product Quality
— Reprogram Soldered Devices for Faster Prototyping
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE
• THE EASE OF USE AND FAST SYSTEM SPEED OF
PLDs WITH THE DENSITY AND FLEXIBILITY OF FPGAS
Enhanced Pin Locking Capability
Three Dedicated Clock Input Pins
Synchronous and Asynchronous Clocks
Programmable Output Slew Rate Control
Flexible Pin Placement
Optimized Global Routing Pool Provides Global
Interconnectivity
• ispDesignEXPERT™ – LOGIC COMPILER AND COM-
PLETE ISP DEVICE DESIGN SYSTEMS FROM HDL
SYNTHESIS THROUGH IN-SYSTEM PROGRAMMING
— Superior Quality of Results
— Tightly Integrated with Leading CAE Vendor Tools
— Productivity Enhancing Timing Analyzer, Explore
Tools, Timing Simulator and ispANALYZER™
— PC and UNIX Platforms
Copyright © 2000 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
September 2000
2128vL_02
1
Output Routing Pool (ORP)
Logic
Array
Output Routing Pool (ORP)
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