REVISIONS
LTR
A
B
C
DESCRIPTION
Table I, change Capacitive load maximum limit.
Add device type 02, case outline Y, and vendor CAGE 51651.
Table I, Input ripple current test for device type 02: Add new note 3
and new test limits. Renumber remaining notes to table I in sequence
after note 3.
Added footnote 1 to table II, under group C end-point electricals.
Updated drawing paragraphs. -sld
DATE (YR-MO-DA)
98-11-09
04-04-02
04-08-23
APPROVED
K. A. Cottongim
Raymond Monnin
Raymond Monnin
D
12-11-01
Charles F. Saffle
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
SHEET
PREPARED BY
Steve L. Duncan
CHECKED BY
Michael Jones
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
10
D
11
D
12
STANDARD
MICROCIRCUIT
DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil/
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
APPROVED BY
Kendall Cottongim
MICROCIRCUIT, HYBRID, LINEAR, 12 VOLT,
SINGLE CHANNEL, DC/DC CONVERTER
DRAWING APPROVAL DATE
97-05-15
REVISION LEVEL
D
SIZE
A
SHEET
CAGE CODE
67268
1 OF
12
5962-94631
5962-E032-13
DSCC FORM 2233
APR 97
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A
choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When
available, a choice of radiation hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
Federal
stock class
designator
\
-
RHA
designator
(see 1.2.1)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
02
Generic number
ASA2812S/CH
DAC2812SH
Circuit function
DC/DC converter, 5 W, 12 V output
DC/DC converter, 5.4 W, 12 V output
94631
01
Device
type
(see 1.2.2)
/
H
Device
class
designator
(see 1.2.3)
X
Case
outline
(see 1.2.4)
X
Lead
finish
(see 1.2.5)
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level.
All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
and E) or QML Listing (Class G and D). The product assurance levels are as follows:
Device class
K
Device performance documentation
Highest reliability class available. This level is intended for use in space
applications.
Standard military quality class level. This level is intended for use in applications
where non-space high reliability devices are required.
Reduced testing version of the standard military quality class. This level uses the
Class H screening and In-Process Inspections with a possible limited temperature
range, manufacturer specified incoming flow, and the manufacturer guarantees (but
may not test) periodic and conformance inspections (Group A, B, C, and D).
Designates devices which are based upon one of the other classes (K, H, or G)
with exception(s) taken to the requirements of that class. These exception(s) must
be specified in the device acquisition document; therefore the acquisition document
should be reviewed to ensure that the exception(s) taken will not adversely affect
system performance.
Manufacturer specified quality class. Quality level is defined by the manufacturers
internal, QML certified flow. This product may have a limited temperature range.
H
G
E
D
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
X
Y
Descriptive designator
See figure 1
See figure 1
Terminals
8
8
Package style
Dual-in-line
Dual-in-line
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
A
REVISION LEVEL
D
5962-94631
SHEET
2
DSCC FORM 2234
APR 97
1.3 Absolute maximum ratings. 1/
Input voltage range ....................................................................
Power dissipation (P
D
) ...............................................................
Lead soldering temperature (10 seconds) .................................
Storage temperature range ........................................................
1.4 Recommended operating conditions.
Input voltage range:
Device type 01........................................................................
Device type 02........................................................................
Output power: 2/
Device type 01........................................................................
Device type 02........................................................................
Case operating temperature range (T
C
) .....................................
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
https://assist.dla.mil/quicksearch/
or from the Standardization Document
Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The
manufacturer may eliminate, modify, or optimize the tests and inspections herein, however, the performance requirements as
defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
affect the form, fit, or function of the device for the applicable device class.
-0.5 V dc to +50 V dc (continuous) 80 V (100 ms)
4W
+300°C
-65°C to +150°C
+16 V dc to +40 V dc
+11 V dc to +50 V dc
≤
5W
≤
5.4 W
-55°C to +125°C
1/
2/
Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
Derate output power linearly above case temperature +125°C to 0 at +135°C.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-94631
SHEET
3
DSCC FORM 2234
APR 97
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime -VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the
manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
Pre-seal burn-in test, method 1030 of MIL-STD-883. (optional for class H)
(1)
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in method 1030 of MIL-STD-883.
T
A
as specified in accordance with table I of method 1015 of MIL-STD-883.
(2)
b.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in method 1015 of MIL-STD-883.
T
A
as specified in accordance with table I of method 1015 of MIL-STD-883.
(2)
c.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-94631
SHEET
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
-55°C
≤
T
C
≤
+125°C
V
IN
= 28 V dc
±5%,
C
L
= 0
unless otherwise specified
I
OUT
= 0
Group A
subgroups
Device
types
Min
Limits
Max
Unit
Output voltage
V
OUT
1
2,3
01,02
11.88
11.76
12.12
12.24
417
450
200
290
V
Output current 1/
I
OUT
V
IN
= 16, 28, and 40 V dc
1,2,3
01
02
mA
Output ripple voltage 2/
V
RIP
V
IN
= 16, 28, and 40 V dc,
B.W. = 20 Hz to 2 MHz,
1
2,3
01,02
mVp-p
Line regulation
VR
LINE
V
IN
= 16, 28, and 40 V dc,
I
OUT
= 0, 208, and 417 mA
1
2,3
01,02
±25
±50
mV
Load regulation
VR
LOAD
V
IN
= 16, 28, and 40 V dc,
I
OUT
= 0, 208, and 417 mA
1
2,3
01,02
±25
±50
mV
Input current
I
IN
I
OUT
= 0 , Inhibit (pin 5) tied
to input return (pin 7)
1,2,3
01
02
18
2.5
50
mA
I
OUT
= 0 ,
Inhibit (pin 5) = open
Input ripple current 2/ 3/
I
RIP
I
OUT
= 417 mA,
B.W. = 20 Hz to 2 MHz
1,2,3
1
2,3
Efficiency
Eff
I
OUT
= 417 mA
1
01,02
01
02
100
125
200
mAp-p
01
02
71
62
68
60
100
%
2,3
01
02
Isolation
ISO
Input to output or any pin
to case (except pin 8) at
500V dc, T
C
= +25°C
No effect on dc
performance, T
C
= +25°C
1
01,02
MΩ
Capacitive load 4/ 5/
See footnotes at end of table.
C
L
4
01,02
100
µF
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
D
5962-94631
SHEET
5
DSCC FORM 2234
APR 97
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