V
CE
I
C
=
=
2500 V
50 A
IGBT-Die
5SMX12L2505
Die size: 12.4 * 12.4 mm
Doc. No. 5SYA1610-00 Aug. 01
Low on-state IGBT die
Highly rugged design
• •
Maximum Rated Values
Parameter
Collector-Emitter Voltage
DC Collector Current
Electro Static Discharge
Symbol
V
CES
I
C
ESD
(T
vj
= 25°C, unless specified otherwise)
Conditions
Values
2500
50
Device Sensitive to ESD
Unit
V
A
IGBT Characteristic Values
Parameter
Collector-Emitter Sat.Voltage
Collect.-Emit. leakage Current
Gate-Emitter leakage Current
Gate-Emitter Threshold Voltage
Internal gate resistance
Symbol
V
CE(sat)
I
CES
I
GES
V
GE(TO)
R
Gint
(T
j
= 25°C, unless specified otherwise)
Conditions
I
C
= I
crated
, V
GE
= 15 V
V
CE
= 2500V, V
GE
= 0V, T
vj
=125°C
V
CE
= 0V ,V
GE
=
±20
V
I
C
= 10 mA, V
CE
= V
GE
6
min. typ. max.
1.8
2.65
1
±500
9
Unit
V
mA
nA
V
Ω
Mechanical Characteristics
Parameter
Overall die
Dimensions
L*W
12.4 * 12.4
9.0 * 9.0
1.5 * 1.5
310 +/- 20
AISi1/Al
AISi1 / Ti / Ni / Ag
12
3
Exposed
L*W (except gate pad)
Front metal
Gate pad
Thickness
Metallization
Front
Back
L*W
Unit
mm
mm
mm
µm
µm
µm
ABB Switzerland Ltd, Semiconductors reserves the right to change specifications without notice.
5SMX12L2505
Outline Drawing
Note: All dimensions are shown in mm
Positioning tolerance of emitter contact area (shaded area) to the die centre :
±
0.3mm
ABB Switzerland Ltd, Semiconductors reserves the right to change specifications without notice.
ABB Switzerland Ltd
Semiconductors
Fabrikstrasse 3
CH-5600 Lenzburg, Switzerland
Doc. No. 5SYA1610-00 Aug. 01
Telephone +41 (0)58 586 1419
Fax
+41 (0)58 586 1306
Email
abbsem@ch.abb.com
Internet
www.abbsem.com