5962-9690002HMA datasheet, PDF

Datasheet> All Categories > storage> storage> 5962-9690002HMA

5962-9690002HMA: DescriptionMemory Circuit, 128KX16, CMOS, CQMA68,; Categorystorage storage; File Size222KB，29 Pages; ManufacturerWhite Microelectronics

Download Datasheet Parametric View All

5962-9690002HMA Overview

Memory Circuit, 128KX16, CMOS, CQMA68,

5962-9690002HMA Parametric

Parameter Name	Attribute value
Reach Compliance Code	unknown
Other features	ALSO CONFIGURABLE AS 256KX8
JESD-30 code	S-CQMA-G68
JESD-609 code	e0
memory density	2097152 bit
Memory IC Type	MEMORY CIRCUIT
memory width	16
Number of functions	1
Number of terminals	68
word count	131072 words
character code	128000
Operating mode	ASYNCHRONOUS
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
organize	128KX16
Package body material	CERAMIC, METAL-SEALED COFIRED
Package shape	SQUARE
Package form	MICROELECTRONIC ASSEMBLY
Certification status	Not Qualified
Maximum supply voltage (Vsup)	5.5 V
Minimum supply voltage (Vsup)	4.5 V
Nominal supply voltage (Vsup)	5 V
surface mount	YES
technology	CMOS
Temperature level	MILITARY
Terminal surface	TIN LEAD
Terminal form	GULL WING
Terminal location	QUAD
Base Number Matches	1

Preview

Download Datasheet

View All

REVISIONS

LTR

DESCRIPTION

Changes to V

OLS

and V

OHS

tests for device type 02.

Table I; Changed I

CC1

max limit from 250 mA to 310 mA. -sld

Table I; Changed the SRAM supply current (I

CC1

) max limit from 310

mA to 360 mA. -sld

Added case outline 9. Table I; changed the V

test condition I

from 12.0 mA to 8.0 mA . Added note to paragraph 1.2.2 and table I

regarding the 4 transistor design. -sld

Added case outline Y. Updated drawing to reflect current

requirements of MIL-PRF-38534. -sld

Added case outline B. Added note to paragraph 1.2.4. -sld

DATE (YR-MO-DA)

97-09-16

98-06-26

99-08-23

00-09-20

APPROVED

K. A. Cottongim

Raymond Monnin

03-03-14

03-11-10

Raymond Monnin

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

SHEET

PREPARED BY

Gary Zahn

CHECKED BY

Michael C. Jones

STANDARD

MICROCIRCUIT

DRAWING

THIS DRAWING IS

AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DEFENSE SUPPLY CENTER COLUMBUS

P. O. BOX 3990

COLUMBUS, OHIO 43216-5000

APPROVED BY

Kendall A. Cottongim

MICROCIRCUIT, HYBRID, MEMORY, DUAL, DIGITAL,

SINGLE 128K x 16 BIT STATIC RANDOM ACCESS

MEMORY, WITH SEPARATE DATA BUS AND SINGLE, 128K

x 16-BIT FLASH ERASABLE/PROGRAMMABLE READ ONLY

MEMORY WITH SEPARATE DATA BUS

DRAWING APPROVAL DATE

97-01-27

AMSC N/A

REVISION LEVEL

SIZE

SHEET

CAGE CODE

67268

1 OF

5962-96900

DSCC FORM 2233

APR 97

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

5962-E014-04

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a

part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in

the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the

solitation.

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.

STANDARDS

DEPARTMENT OF DEFENSE

MIL-STD-883 - Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Microcircuit Case Outlines.

HANDBOOKS

DEPARTMENT OF DEFENSE

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in

accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as

designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.

Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).

Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not

perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device

class.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38534 and herein.

3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.

3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3.

3.2.4 Timing diagram(s). The timing diagram(s) shall be as specified on figures 4, 5, 6, 7, 8 and 9.

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

SIZE

REVISION LEVEL

5962-96900

SHEET

DSCC FORM 2234

APR 97

3.2.5 Block diagram(s). The block diagram(s) shall be as specified on figure 10.

3.2.6 Output load circuit. The output load circuit shall be as specified on figure 11.

3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are

as specified in table I and shall apply over the full specified operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical

tests for each subgroup are defined in table I.

3.5 Programming procedure. The programming procedure shall be as specified by the manufacturer and shall be available

upon request.

3.6 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked

with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.

3.7 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described

herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot

sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for

those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer

and be made available to the preparing activity (DSCC-VA) upon request.

3.8 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this

drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets

the performance requirements of MIL-PRF-38534 and herein.

3.9 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of

microcircuits delivered to this drawing.

3.10 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This

reprogrammability test shall be done for the initial characterization and after any design process changes which may affect the

reprogrammability of the device. The methods and procedures may be vendor specific, but shall guarantee the number of

program/erase cycles listed in section 1.3 herein over the full military temperature range. The vendor's procedure shall be kept

under document control and shall be made available upon request of the acquiring or preparing activity.

3.11 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall

be done for initial characterization and after any design process change which may affect data retention. The methods and

procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military

temperature range. The vendor's procedure shall be kept under document control and shall be made available upon request of

the acquiring or preparing activity.

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

SIZE

REVISION LEVEL

5962-96900

SHEET

DSCC FORM 2234

APR 97

Recommended Resources

Analog switching circuit

Forty variable oscillators with single control.gif

Type ADXL05 monolithic acceleration sensor circuit with signal conditioning ±1g to ±5g

Simple and practical charger circuit diagram

Variable pulse width generator circuit diagram up to 12.85MHZ

DC motor follow-up control circuit

Have you ever thought about using webench to solve the power supply problem in the national competition? Woohaha, what prize will you get?: [font=微软雅黑][size=4][b] Understand | Don’t understand [/b]WEBENCH? If you don’t understand, click to open it and have a look ([/size][/font][url=http://www.ti.com.cn/lsds/ti_zh/analog/webench/overview....; nmg Electronics Design Contest

What is the phase relationship between the primary and secondary of three-phase electricity?: Could anyone tell me what the phase relationship is between the primary and secondary of three-phase electricity (the primary is connected in a triangle and the secondary is connected in a Y type)? Th...; 佳佳 Test/Measurement

Are there any components or materials that can be used?: I want to make an electronic cigarette lighter. Please don't tell me to use a lighter (although there are electronic components in it). I want to use only electricity, no gas. I used a resistor, but i...; jitao_0001 Creative Market

Seamless communication: the backbone of Industry 4.0: The digital transformation of manufacturing, known as Industry 4.0, brings together multiple categories of technologies, but competitive advantage comes from whether they work together.On the factory ...; Jacktang Wireless Connectivity

MSP430FR2433 peripheral reference driver code: ...; 江长活 Microcontroller MCU

(Reposted) Texas Instruments experts talk about using transconductance amplifiers to develop oscillators: [align=left][color=#000][font=宋体][size=12px]Author: [color=rgb(51, 51, 51)][url=http://e2e.ti.com/members/28101/default.aspx][u][color=#0066cc]Xavier Ramus[/color][/u][/url][/color] Texas Instruments[...; qwqwqw2088 Analogue and Mixed Signal

Shortcut: S0 S1 S2 S3 S4 S5 S6 S7 S8 S9 SA SB SC SD SE SF SG SH SI SJ SK SL SM SN SO SP SQ SR SS ST SU SV SW SX SY SZ T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 TA TB TC TD TE TF TG TH TI TJ TK TL TM TN TO TP TQ TR TS TT TU TV TW TX TY TZ U0 U1 U2 U3 U4 U6 U7 U8 UA UB UC UD UE UF UG UH UI UJ UK UL UM UN UP UQ UR US UT UU UV UW UX UZ V0 V1 V2 V3 V4 V5 V6 V7 V8 V9 VA VB VC VD VE VF VG VH VI VJ VK VL VM VN VO VP VQ VR VS VT VU VV VW VX VY VZ W0 W1 W2 W3 W4 W5 W6 W7 W8 W9 WA WB WC WD WE WF WG WH WI WJ WK WL WM WN WO WP WR WS WT WU WV WW WY X0 X1 X2 X3 X4 X5 X7 X8 X9 XA XB XC XD XE XF XG XH XK XL XM XN XO XP XQ XR XS XT XU XV XW XX XY XZ Y0 Y1 Y2 Y4 Y5 Y6 Y9 YA YB YC YD YE YF YG YH YK YL YM YN YP YQ YR YS YT YX Z0 Z1 Z2 Z3 Z4 Z5 Z6 Z8 ZA ZB ZC ZD ZE ZF ZG ZH ZJ ZL ZM ZN ZP ZR ZS ZT ZU ZV ZW ZX ZY

Popular Components