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T497H157K010AH

Description
Tantalum Capacitors - Solid SMD 150.UF 10.0V
CategoryPassive components    capacitor   
File Size1MB,19 Pages
ManufacturerKEMET
Websitehttp://www.kemet.com
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T497H157K010AH Overview

Tantalum Capacitors - Solid SMD 150.UF 10.0V

T497H157K010AH Parametric

Parameter NameAttribute value
Is it lead-free?Contains lead
Is it Rohs certified?incompatible
MakerKEMET
package instruction, 2915
Reach Compliance Codecompliant
ECCN codeEAR99
capacitance150 µF
Capacitor typeTANTALUM CAPACITOR
dielectric materialsTANTALUM (DRY/SOLID)
JESD-609 codee0
leakage current0.015 mA
Manufacturer's serial numberT497
Installation featuresSURFACE MOUNT
negative tolerance10%
Number of terminals2
Maximum operating temperature125 °C
Minimum operating temperature-55 °C
Package shapeRECTANGULAR PACKAGE
method of packingTR, 7/13 INCH
polarityPOLARIZED
positive tolerance10%
Rated (DC) voltage (URdc)25 V
size code2915
surface mountYES
Delta tangent0.1
Terminal surfaceTin/Lead (Sn/Pb)
Terminal shapeJ BEND
Tantalum Surface Mount Capacitors – High Reliability
T497 Commercial Off-The-Shelf (COTS)
MnO
2
(CWR09/19/29 Style)
Overview
The KEMET T497 is designed for the COTS (Commercial
Off-The-Shelf) requirements of military, medical, and
aerospace applications. This product is a COTS version
of CWR09,19, and 29 products. The T497 Series is a
surface mount product offering various lead-frame plating
options, Weibull grading options, X-ray inspection, surge
current testing, F-Tech (an improved anode manufacturing
process) and Simulated Breakdown Voltage (SBDV)
screening options to improve long term reliability.
KEMET’s F-Tech eliminates hidden defects in the dielectric,
which continue to grow in the field, causing capacitor
failures. Based on the fundamental understanding of
degradation mechanisms in tantalum and niobium
capacitors, F-Tech incorporates multiple process
methodologies. Some minimize the oxygen and carbon
content in the anodes, which become contaminants
and can lead to the crystallization of the anodic oxide
dielectric. This process methodology reduces the
contaminants, improving quality of the dielectric. An
additional technology provides a stronger mechanical
connection point between the tantalum lead wire and
tantalum anode, enhancing robustness and product
reliability. The benefit of F-Tech is illustrated by a 2,000
hour, 85°C, 1.32 X rated voltage accelerated life test. The
F-Tech parts see no degradation while standard tantalums
have 1.5 orders of magnitude degradation in leakage
current. F-Tech is currently available for T493 (select D
and X case capacitance values in 25 V and higher rated
voltage) and T497 (select H case capacitance values in
25 V and higher rated voltage). Please contact KEMET for
details on ordering other part types with these capabilities.
KEMET’s patented Simulated Breakdown Screening (SBDS)
is a nondestructive testing technique that simulates the
breakdown voltage (BDV) of a capacitor without damage to
its dielectric or to the general population of capacitors. This
screening identifies hidden defects in the dielectric, providing
the highest level of dielectric testing. SBDS is based on the
simulation of breakdown voltage (BDV), the ultimate test of
the dielectric in a capacitor.
Low BDV indicates defects in the dielectric, and therefore, a
higher probability of failure in the field. High BDV indicates
a stronger dielectric and high-reliability performance in the
field. This new screening method allows KEMET to identify
the breakdown voltage of each individual capacitor and
provides only the strongest capacitors from each lot.
SBDS is currently available on select part types in the T493
and T497 series. Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET offers these technologies per the following options:
• F-Tech only
• SBDS only
• Combination of both F-Tech and SBDS for the ultimate
protection
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One world. One KEMET
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2011_T497 • 12/5/2017
1

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