SCOPE:
IMPROVED, QUAD, SPST ANALOG SWITCHES
Generic Number
DG411A(x)/883B
DG412A(x)/883B
DG413A(x)/883B
Device Type
01
02
03
Case Outline(s).
The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
K
L
Z
Mil-Std-1835
GDIP1-T16 or CDIP2-T16
CDFP4-F16
CQCC1-N20
Case Outline
Package Code
16 LEAD CERDIP
J16
16 LEAD FLATPACK
F16
20-Pin Ceramic LCC
L20
Absolute Maximum Ratings
Voltage Referenced to V
-
V
+
to V
-
.............................................................................................................................. 44V
GND ................................................................................................................................... 25V
V
L
...................................................................................................... (GND-0.3V) to V
+
+0.3V)
Digital Inputs, V
S
, V
D
1/ ........................................................................ .(V
-
-2V) to (V
+
+2V)
or 30mA whichever occurs first.
Continuous Current, Any terminal .................................................................................. 30mA
Peak Current, S or D (Pulsed at 1ms, 10% duty cycle max) ......................................... 100mA
Lead Temperature (soldering, 10 seconds) ...............................................................…..... +300°C
Storage Temperature ........................................................................................... -65°C to +150°C
Continuous Power Dissipation .........................................................................…….... T
A
=+70°C
16 lead CERDIP(derate 10.0mW/°C above +70°C) ...............................................…….. 800mW
16 lead FLATPACK(derate 6.1mW/°C above +70°C) .........................................…….... 485mW
20 lead LCC (derate 9.1 mW/°C above +70°C) ..................................................……..... 727mW
Junction Temperature T
J
....................................................................................………. +150°C
Thermal Resistance, Junction to Case,
ΘJC:
Case Outline 16 lead CERDIP...............................................................……..... 50°C/W
Case Outline 16 lead FLATPACK .........................................................……... 65°C/W
Case Outline 20 lead LCC .....................................................................…….... 20°C/W
Thermal Resistance, Junction to Ambient,
ΘJA:
Case Outline 16 lead CERDIP.............................................................……..... 100°C/W
Case Outline 16 lead FLATPACK .......................................................……... 165°C/W
Case Outline 20 lead LCC ...................................................................…….... 110°C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) ........................................................………... -55°C to
+125°C
Positive Supply Voltage (V
+
) ...............................................................................………... +15V
Negative Supply Voltage (V
-
) ..............................................................................……….... -15V
V
INL
(max) .............................................................................................................………... 0.8V
V
INH
(min) .............................................................................................................……….... 2.4V
Logic Supply Voltage (V
L
) ....................................................................................……….. +5V
1/ Signals on S, D or IN exceeding V
+
or V
-
are clamped by internal diodes. Limit forward current to
maximum current ratings.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of DG411/412/413A /883B
19-0048
Page 2 of
Rev. D
7
TEST
Symbol
CONDITIONS
-55
°C
<=T
A
<= +125°C
V
+
=+15V, V
-
=-15V, GND=0V
V
INH
=2.4V, V
INL
=0.8V, V
L
=5V
Unless otherwise specified
VD=±10V, Figure 2
VD=±10V, Figure 2
C
L
=1.0nF, V
GEN
=0V, R
GEN
=0Ω
Figure 4
Group A
Subgroup
Device
type
Limits
Min
2/
Limits
Max
2/
Units
DYNAMIC
Turn-On Time
Turn-Off Time
Charge Injection 3/
t
ON
t
OFF
Q
9
10,11
9
10,11
9
All
All
All
175
220
145
160
10
ns
ns
pC
TABLE 1. ELECTRICAL TESTS:
SINGLE SUPPLY
Group A
Subgroup
Device
type
TEST
Symbol
CONDITIONS
-55
°C
<=T
A
<= +125°C
V
+
=+15V, V
-
=-15V, GND=0V
V
INH
=2.4V, V
INL
=0.8V, V
L
=5V
Unless otherwise specified
Limits
Min
2/
Limits
Max
2/
Units
SWITCH
Analog-Signal
Range
Drain-Source ON
Resistance
SUPPLY
Positive Supply
Current
Negative Supply
Current
Logic Supply
Current
Ground Current
DYNAMIC
Turn-On Time
Turn-Off Time
Charge Injection 3/
V
ANALOG
1,2,3
All
All
0
12
80
100
V
Ω
r
DS(ON)
I+
I-
I
L
I
GND
3/
V
+
=+10.8V,
I
S
=-10mA, V
D
=3.8V
All channels on or off,
V
+
=+13.2, V
IN
=0V or 5V
All channels on or off,
V
+
=+13.2V, V
IN
=0V or 5V
All channels on or off,
V
L
=5.25V, V
IN
=0V or 5V
All channels on or off,
V
L
=5.25V, V
IN
=0V or 5V
V
S
=8V, Figure 2
V
S
=8V, Figure 2
C
L
=1.0nF, V
GEN
=0V, R
GEN
=0Ω
Figure 8
1
2,3
1
2,3
1
2,3
1
2,3
1
2,3
9
10,11
9
10,11
9
All
All
All
All
-1.0
-5.0
-1.0
-5.0
-1.0
-5.0
-1.0
-5.0
1.0
5.0
1.0
5.0
1.0
5.0
1.0
5.0
250
315
125
140
10
µA
µA
µA
µA
t
ON
t
OFF
Q
All
All
All
ns
ns
pC
NOTE 2: This data sheet uses the algebraic convention, where the most negative value is a minimum and the most
positive value is a maximum.
NOTE 3: Guaranteed by design.
NOTE 4:
∆
r
ON
=∆
r
ON
(max)-∆
r
ON
(min). On-resistance match between channels and flatness are guarantee only
with specified voltages. Flatness is defined as the difference between the maximum and minimum value
of on-resistance as measured at the extremes of the specified analog signal range.
----------------------------
Electrical Characteristics of DG411/412/413A /883B
19-0048
Page 4 of
Rev. D
7
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
1
1*, 2, 3, 9
1, 2, 3, 9,10,11
1
Interim Electric Parameters
Method 5004
Final Electrical Parameters
Method 5005
Group A Test Requirements
Method 5005
Group C and D End-Point Electrical Parameters
Method 5005
*
PDA applies to Subgroup 1 only.
----------------------------
Electrical Characteristics of DG411/412/413A /883B
19-0048
Page 6 of
Rev. D
7
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