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TK72E12N1S1X

Description
MOSFET N-Ch 120V 179A 225W UMOSVIII 130nC .0044
Categorysemiconductor    Discrete semiconductor   
File Size248KB,10 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
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MOSFET N-Ch 120V 179A 225W UMOSVIII 130nC .0044

TK72E12N1S1X Parametric

Parameter NameAttribute value
Product AttributeAttribute Value
ManufacturerToshiba Semiconductor
Product CategoryMOSFET
RoHSDetails
TechnologySi
Mounting StyleThrough Hole
Package / CaseTO-220-3
Number of Channels1 Channel
Transistor PolarityN-Channel
Vds - Drain-Source Breakdown Voltage120 V
Id - Continuous Drain Current179 A
Rds On - Drain-Source Resistance4.4 mOhms
Vgs th - Gate-Source Threshold Voltage2 V
Vgs - Gate-Source Voltage10 V
Qg - Gate Charge130 nC
Maximum Operating Temperature+ 150 C
ConfigurationSingle
Pd - Power Dissipation255 W
Channel ModeEnhancement
Height15.1 mm
Length10.16 mm
Transistor Type1 N-Channel
Width4.45 mm
Fall Time37 ns
Rise Time33 ns
Factory Pack Quantity50
Typical Turn-Off Delay Time120 ns
Typical Turn-On Delay Time64 ns
Unit Weight0.211644 oz
TK72E12N1
MOSFETs
Silicon N-channel MOS (U-MOS-H)
TK72E12N1
1. Applications
Switching Voltage Regulators
2. Features
(1)
(2)
(3)
Low drain-source on-resistance: R
DS(ON)
= 3.6 mΩ (typ.) (V
GS
= 10 V)
Low leakage current: I
DSS
= 10
µA
(max) (V
DS
= 120 V)
Enhancement mode: V
th
= 2.0 to 4.0 V (V
DS
= 10 V, I
D
= 1.0 mA)
3. Packaging and Internal Circuit
1: Gate
2: Drain (heatsink)
3: Source
TO-220
25
4. Absolute Maximum Ratings (Note) (T
a
= 25
unless otherwise specified)
Characteristics
Drain-source voltage
Gate-source voltage
Drain current (DC)
Drain current (DC)
Drain current (pulsed)
Power dissipation
Single-pulse avalanche energy
Avalanche current
Channel temperature
Storage temperature
(t = 1 ms)
(T
c
= 25)
(Note 4)
(Silicon limit)
(Note 1), (Note 2)
(Note 1), (Note 3)
(Note 1)
Symbol
V
DSS
V
GSS
I
D
I
D
I
DP
P
D
E
AS
I
AR
T
ch
T
stg
Rating
120
±20
179
72
360
255
256
72
150
-55 to 150
W
mJ
A
A
Unit
V
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Start of commercial production
1
2012-07
2014-06-30
Rev.4.0
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