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T493X336K025CH6130

Description
Tantalum Capacitors - Solid SMD 33.0UF 25.0V
CategoryPassive components   
File Size1MB,26 Pages
ManufacturerKEMET
Websitehttp://www.kemet.com
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T493X336K025CH6130 Overview

Tantalum Capacitors - Solid SMD 33.0UF 25.0V

T493X336K025CH6130 Parametric

Parameter NameAttribute value
Product AttributeAttribute Value
ManufacturerKEMET
Product CategoryTantalum Capacitors - Solid SMD
Capacitance33 uF
Voltage Rating DC25 VDC
Tolerance10 %
ESR700 mOhms
Case Code - in2917
Case Code - mm7343
Height4.3 mm
Mfr Case CodeX Case
Minimum Operating Temperature- 55 C
Maximum Operating Temperature+ 125 C
Length7.3 mm
Package / Case2917 (7343 metric)
ProductTantalum Solid Surface Mounts
Termination StyleSMD/SMT
TypeMolded - Hi-Rel COTS
Width6 mm
Leakage Current8.3 uA
Dissipation Factor DF6
Unit Weight0.023071 oz
Tantalum Surface Mount Capacitors – High Reliability
T493 Commercial Off-The-Shelf (COTS)
MnO
2
(CWR11 Style)
Overview
The KEMET T493 Series is designed for the Commercial
Off-The-Shelf (COTS) requirements of military and
aerospace applications. This series is a surface mount
product offering various lead-frame plating options,
Weibull grading options, surge current testing, F-Tech (an
improved anode manufacturing process) and Simulated
Breakdown Voltage (SBDV) screening options to improve
long term reliability. Standard, low, and ultra-low ESR
options are available. All lots of this series are conditioned
with MIL–PRF–55365 Group A testing. This series is also
approved for DLA Drawing 07016 (please see part number
list specific to this drawing).
KEMET’s F-Tech eliminates hidden defects in the dielectric
which continue to grow in the field, causing capacitor
failures. Based on the fundamental understanding of
degradation mechanisms in tantalum and niobium
capacitors, F-Tech incorporates multiple process
methodologies. Some minimize the oxygen and carbon
content in the anodes which become contaminants
and can lead to the crystallization of the anodic oxide
dielectric. This process methodology reduces the
contaminants, improving quality of the dielectric. An
additional technology provides a stronger mechanical
connection point between the tantalum lead wire and
tantalum anode, enhancing robustness and product
reliability. The benefit of F-Tech is illustrated by a 2,000
hour, 85°C, 1.32 X rated voltage accelerated life test.
F-Tech parts see no degradation while standard tantalum's
have 1.5 orders of magnitude degradation in leakage
current. F-Tech is currently available for the T493 Series
(select D and X case capacitance values in 25 V and
higher rated voltage). Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET’s patented Simulated Breakdown Screening (SBDS)
is a nondestructive testing technique that simulates the
breakdown voltage (BDV) of a capacitor without damage to
its dielectric or to the general population of capacitors. This
screening identifies hidden defects in the dielectric, providing
the highest level of dielectric testing. SBDS is based on the
simulation of breakdown voltage (BDV), the ultimate test of
the dielectric in a capacitor.
Low BDV indicates defects in the dielectric, and therefore, a
higher probability of failure in the field. High BDV indicates
a stronger dielectric and high-reliability performance in the
field. This new screening method allows KEMET to identify
the breakdown voltage of each individual capacitor and
provide only the strongest capacitors from each lot.
SBDS is currently available on select part types in the T493
and T497 Series. Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET offers these technologies per the following options:
• F-Tech only
• SBDS only
• Combination of both F-Tech and SBDS for the ultimate
protection
Click image above for interactive 3D content
Open PDF in Adobe Reader for full functionality
One world. One KEMET
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
T2007_T493 • 12/5/2017
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