PRELIMINARY
Integrated
Circuit
Systems, Inc.
ICS844031I-01
F
EMTO
C
LOCKS
™ C
RYSTAL
-
TO
- LVDS
C
LOCK
G
ENERATOR
F
EATURES
•
(1) Differential LVDS output
•
Crystal oscillator interface, 18pF parallel resonant crystal
(19.6MHz - 27.2MHz)
•
Output frequency range: 245MHz - 340MHz
•
VCO range: 490MHz - 680MHz
•
RMS phase jitter @ 312.5MHz, using a 25MHz crystal
(1.875MHz - 20MHz): 0.49ps (typical)
•
3.3V or 2.5V operating supply
•
-40°C to 85°C ambient operating temperature
G
ENERAL
D
ESCRIPTION
The ICS844031I-01 is an Ethernet Clock
Generator and a member of the HiPerClocks
TM
HiPerClockS™
family of high performance devices from ICS. The
ICS844031I-01 uses an 18pF parallel resonant
crystal over the range of 19.6MHz - 27.2MHz. For
Ethernet applications, a 25MHz crystal is used to generate
312.5MHz. The ICS844031I-01 has excellent <1ps phase jitter
performance, over the 1.875MHz - 20MHz integration range.
The ICS844031I-01 is packaged in a small 8-pin TSSOP,
making it ideal for use in systems with limited board space.
ICS
C
OMMON
C
ONFIGURATION
T
ABLE
Inputs
Crystal Frequency (MHz)
25
M
25
N
2
Multiplication
Value M/N
12.5
Output Frequency
(MHz)
312.5
B
LOCK
D
IAGRAM
OE
Pullup
P
IN
A
SSIGNMENT
V
DDA
GND
XTAL_OUT
XTAL_IN
1
2
3
4
8
7
6
5
V
DD
Q
nQ
OE
XTAL_IN
OSC
XTAL_OUT
Phase
Detector
VCO
490MHz - 680MHz
N = ÷2
(fixed)
Q
nQ
ICS844031I-01
8-Lead TSSOP
4.40mm x 3.0mm x 0.925mm
package body
G Package
Top View
M = ÷25
(fixed)
The Preliminary Information presented herein represents a product in prototyping or pre-production. The noted characteristics are based on initial
product characterization. Integrated Circuit Systems, Incorporated (ICS) reserves the right to change any circuitry or specifications without notice.
844031AGI-01
www.icst.com/products/hiperclocks.html
REV. B JULY 6, 2005
1
PRELIMINARY
Integrated
Circuit
Systems, Inc.
ICS844031I-01
F
EMTO
C
LOCKS
™ C
RYSTAL
-
TO
- LVDS
C
LOCK
G
ENERATOR
Type
Power
Power
Input
Input
Output
Power
Pullup
Description
Analog supply pin.
Power supply ground.
Cr ystal oscillator interface. XTAL_IN is the input,
XTAL_OUT is the output.
Output enable pin. When HIGH, Q0/nQ0 output is active.
When LOW, the Q0/nQ0 output is in a high impedance state.
LVCMOS/LVTTL interface levels.
Differential clock outputs. LVDS interface levels.
Core supply pin.
T
ABLE
1. P
IN
D
ESCRIPTIONS
Number
1
2
3, 4
5
6, 7
8
Name
V
DDA
GND
XTAL_OUT, XTAL_IN
OE
nQ, Q
V
DD
NOTE:
Pullup
refers to internal input resistors. See Table 2, Pin Characteristics, for typical values.
T
ABLE
2. P
IN
C
HARACTERISTICS
Symbol
C
IN
R
PULLUP
Parameter
Input Capacitance
Input Pullup Resistor
Test Conditions
Minimum
Typical
4
51
Maximum
Units
pF
kΩ
844031AGI-01
www.icst.com/products/hiperclocks.html
2
REV. B JULY 6, 2005
PRELIMINARY
Integrated
Circuit
Systems, Inc.
ICS844031I-01
F
EMTO
C
LOCKS
™ C
RYSTAL
-
TO
- LVDS
C
LOCK
G
ENERATOR
4.6V
-0.5V to V
DD
+ 0.5 V
10mA
15mA
101.7°C/W (0 mps)
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions be-
yond those listed in the
DC Characteristics
or
AC Character-
A
BSOLUTE
M
AXIMUM
R
ATINGS
Supply Voltage, V
DD
Inputs, V
I
Outputs, I
O
(LVDS)
Continuous Current
Surge Current
Package Thermal Impedance,
θ
JA
Storage Temperature, T
STG
istics
is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
T
ABLE
3A. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= V
DDA
= 3.3V±5%, T
A
= -40°C
TO
85°C
Symbol
V
DD
V
DDA
I
DD
I
DDA
Parameter
Core Supply Voltage
Analog Supply Voltage
Power Supply Current
Analog Supply Current
Test Conditions
Minimum
3.135
3.135
Typical
3.3
3.3
TBD
TBD
Maximum
3.465
3.465
Units
V
V
mA
mA
T
ABLE
3B. P
OWER
S
UPPLY
DC C
HARACTERISTICS
,
V
DD
= V
DDA
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
V
DD
V
DDA
I
DD
I
DDA
Parameter
Core Supply Voltage
Analog Supply Voltage
Power Supply Current
Analog Supply Current
Test Conditions
Minimum
2.375
2.375
Typical
2.5
2.5
TBD
TBD
Maximum
2.625
2.625
Units
V
V
mA
mA
T
ABLE
3C. LVCMOS/LVTTL DC C
HARACTERISTICS
,
V
DD
= V
DDA
= 3.3V±5%
OR
2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
V
IH
V
IL
I
IH
I
IL
Parameter
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
OE
OE
Test Conditions
V
DD
= 3.3V
V
DD
= 2.5V
V
DD
= 3.3V
V
DD
= 2.5V
V
DD
= V
IN
= 3.465V or 2.625V
V
DD
= 3.465V or 2.625V, V
IN
= 0V
-150
Minimum
2
1.7
-0.3
-0.3
Typical
Maximum
V
DD
+ 0.3
V
DD
+ 0.3
0.8
0.7
5
Units
V
V
V
V
µA
µA
T
ABLE
3D. LVDS DC C
HARACTERISTICS
,
V
DD
= V
DDA
= 3.3V±5%, T
A
= -40°C
TO
85°C
Symbol
V
OD
Δ
V
OD
V
OS
Δ
V
OS
844031AGI-01
Parameter
Differential Output Voltage
V
OD
Magnitude Change
Offset Voltage
V
OS
Magnitude Change
Test Conditions
Minimum
Typical
350
40
1.25
50
Maximum
Units
mV
mV
V
mV
NOTE: Please refer to Parameter Measurement Information for output information.
www.icst.com/products/hiperclocks.html
3
REV. B JULY 6, 2005
PRELIMINARY
Integrated
Circuit
Systems, Inc.
ICS844031I-01
F
EMTO
C
LOCKS
™ C
RYSTAL
-
TO
- LVDS
C
LOCK
G
ENERATOR
Test Conditions
Minimum
Typical
350
50
1.2
40
Maximum
Units
mV
mV
V
mV
T
ABLE
3E. LVDS DC C
HARACTERISTICS
,
V
DD
= V
DDA
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
V
OD
Δ
V
OD
V
OS
Δ
V
OS
Parameter
Differential Output Voltage
V
OD
Magnitude Change
Offset Voltage
V
OS
Magnitude Change
NOTE: Please refer to Parameter Measurement Information for output information.
T
ABLE
4. C
RYSTAL
C
HARACTERISTICS
Parameter
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
Drive Level
19.6
Test Conditions
Minimum
Typical
Fundamental
27.2
50
7
1
MH z
Ω
pF
mW
Maximum
Units
T
ABLE
5A. AC C
HARACTERISTICS
,
V
DD
= V
DDA
= 3.3V±5%, T
A
= -40°C
TO
85°C
Symbol
f
OUT
Parameter
Output Frequency
RMS Phase Jitter ( Random);
NOTE 1
Output Rise/Fall Time
Test Conditions
312.5MHz @ Integration Range:
1.875MHz - 20MHz
20% to 80%
Minimum
245
0.49
300
50
Typical
Maximum
340
Units
MHz
ps
ps
%
t
jit(Ø)
t
R
/ t
F
odc
Output Duty Cycle
NOTE 1: Please refer to the Phase Noise Plots following this section.
T
ABLE
5B. AC C
HARACTERISTICS
,
V
DD
= V
DDA
= 2.5V±5%, T
A
= -40°C
TO
85°C
Symbol
f
OUT
Parameter
Output Frequency
RMS Phase Jitter ( Random);
NOTE 1
Output Rise/Fall Time
Test Conditions
312.5MHz @ Integration Range:
1.875MHz - 20MHz
20% to 80%
Minimum
245
0.70
300
50
Typical
Maximum
340
Units
MHz
ps
ps
%
t
jit(Ø)
t
R
/ t
F
odc
Output Duty Cycle
NOTE 1: Please refer to the Phase Noise Plots following this section.
844031AGI-01
www.icst.com/products/hiperclocks.html
4
REV. B JULY 6, 2005
PRELIMINARY
Integrated
Circuit
Systems, Inc.
ICS844031I-01
F
EMTO
C
LOCKS
™ C
RYSTAL
-
TO
- LVDS
C
LOCK
G
ENERATOR
T
YPICAL
P
HASE
N
OISE AT
312.5MH
Z
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
-140
-150
-160
-170
-180
-190
100
1k
10k
➤
Ethernet Filter
312.5MHz
RMS Phase Jitter (Random)
1.875MHz to 20MHz = 0.49ps (typical)
0
N
OISE
P
OWER
dBc
Hz
Raw Phase Noise Data
➤
➤
Phase Noise Result by adding
an Ethernet Filter to raw data
100k
1M
10M
100M
O
FFSET
F
REQUENCY
(H
Z
)
844031AGI-01
www.icst.com/products/hiperclocks.html
5
REV. B JULY 6, 2005
MCU
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