5962R9665106V9A datasheet, PDF

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5962R9665106V9A: DescriptionTRIPLE 2-CHANNEL, SGL ENDED MULTIPLEXER, UUC14; CategoryThe signal circuit; File Size164KB，29 Pages; ManufacturerRenesas Electronics Corporation; Websitehttps://www.renesas.com/

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5962R9665106V9A Overview

TRIPLE 2-CHANNEL, SGL ENDED MULTIPLEXER, UUC14

5962R9665106V9A Parametric

Parameter Name	Attribute value
Maker	Renesas Electronics Corporation
Parts packaging code	DIE
package instruction	DIE,
Contacts	14
Reach Compliance Code	unknown
Analog Integrated Circuits - Other Types	SINGLE-ENDED MULTIPLEXER
JESD-30 code	R-XUUC-N14
JESD-609 code	e0
Number of channels	2
Number of functions	3
Number of terminals	14
Maximum on-state resistance (Ron)	1300 Ω
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
Package body material	UNSPECIFIED
encapsulated code	DIE
Package shape	RECTANGULAR
Package form	UNCASED CHIP
Certification status	Not Qualified
Filter level	MIL-PRF-38535 Class V
Maximum supply voltage (Vsup)	18 V
Minimum supply voltage (Vsup)	3 V
Nominal supply voltage (Vsup)	5 V
surface mount	YES
Maximum disconnect time	720 ns
Maximum connection time	720 ns
technology	CMOS
Temperature level	MILITARY
Terminal surface	TIN LEAD
Terminal form	NO LEAD
Terminal location	UPPER
total dose	100k Rad(Si) V
Base Number Matches	1

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REVISIONS

LTR

DESCRIPTION

Changes in accordance with NOR 5962-R013-98.

DATE (YR-MO-DA)

97-12-17

APPROVED

Raymond Monnin

Incorporate revision A. Update boilerplate to MIL-PRF-38535

requirements. Editorial changes throughout. – LTG

04-02-02

Thomas M. Hess

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

SHEET

PREPARED BY

Rick O. Officer

STANDARD

MICROCIRCUIT

DRAWING

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

CHECKED BY

Monica L. Poelking

APPROVED BY

Monica L. Poelking

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216

http://www.dscc.dla.mil

DRAWING APPROVAL DATE

95-12-27

MICROCIRCUIT, DIGITAL, RADIATION

HARDENED CMOS, ANALOG MULTIPLEXER/

DEMULTIPLEXER, MONOLITHIC SILICON

AMSC N/A

REVISION LEVEL

SIZE

CAGE CODE

SHEET

67268

1 OF

5962-96651

DSCC FORM 2233

APR 97

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

5962-E131-04

1.3 Absolute maximum ratings. 1/ 2/ 3/

Supply voltage range (V

) ........................................................................................

Input voltage range ...................................................................................................

DC input current, any one input .................................................................................

Device dissipation per output transistor .....................................................................

Storage temperature range (T

STG

)..............................................................................

Lead temperature (soldering, 10 seconds) ................................................................

Thermal resistance, junction-to-case (θ

Case E ....................................................................................................................

Case X ....................................................................................................................

Thermal resistance, junction-to-ambient (θ

Case E ....................................................................................................................

Case X ....................................................................................................................

Junction temperature (T

)...........................................................................................

Maximum power dissipation at T

= +125°C (P

): 4/

Case E ....................................................................................................................

Case X ....................................................................................................................

1.4 Recommended operating conditions.

Supply voltage range (V

) ........................................................................................

Case operating temperature range (T

) .....................................................................

Input voltage (V

) ......................................................................................................

Output voltage (V

OUT

) .................................................................................................

Radiation features:

Total dose .............................................................................................................

Single event phenomenon (SEP) effective

linear energy threshold, no upsets or latchup (see 4.4.4.5) ................................

Dose rate upset (20 ns pulse) ...............................................................................

Dose rate latch-up ................................................................................................

Dose rate survivability ..........................................................................................

Neutron irradiated..................................................................................................

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a

part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in

the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the

solicitation.

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

Unless otherwise specified, all voltages are referenced to V

The limits for the parameters specified herein shall apply over the full specified V

range and case temperature range of

-55°C to +125°C unless otherwise noted.

If device power exceeds package dissipation capability, provide heat sinking or derate linearly (the derating is

based on

) at the following rate:

Case E ....................................................................................................................... 13.7 mW/°C

Case X ....................................................................................................................... 8.8 mW/°C

Guaranteed by design or process but not tested.

Device types 04, 05, and 06 only.

3.0 V dc to +18 V dc

-55°C to +125°C

0 V to V

1 x 10 Rads (Si)

> 75 MeV/(cm /mg) 5/

> 5 x 10 Rads(Si)/s 5/

> 2 x 10 Rads(Si)/s 5/

> 5 x 10 Rads(Si)/s 5/

> 1 x 10 neutrons/cm 6/

-0.5 V dc to +20 V dc

-0.5 V dc to + 20.5 V dc

±10

100 mW

-65°C to +150°C

+265°C

24°C/W

29°C/W

73°C/W

114°C/W

+175°C

0.68 W

0.44 W

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

DSCC FORM 2234

APR 97

SIZE

REVISION LEVEL

5962-96651

SHEET

STANDARDS

DEPARTMENT OF DEFENSE

MIL-STD-883 -

MIL-STD-1835 -

HANDBOOKS

DEPARTMENT OF DEFENSE

MIL-HDBK-103 -

MIL-HDBK-780 -

List of Standard Microcircuit Drawings.

Standard Microcircuit Drawings.

Test Method Standard Microcircuits.

Interface Standard Electronic Component Case Outlines.

(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.1.1 Microcircuit die. For the requirements for microcircuit die, see appendix A to this document.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Truth tables. The truth tables shall be as specified on figure 2.

3.2.4 Radiation test connections. The radiation test connections shall be as specified in table III herein.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full

case operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space

limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the

RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.

Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

DSCC FORM 2234

APR 97

SIZE

REVISION LEVEL

5962-96651

SHEET

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