5962-9690002H9A datasheet, PDF

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5962-9690002H9A: DescriptionMemory Circuit, 128KX16, CMOS, CDSO68,; Categorystorage; File Size222KB，29 Pages; ManufacturerWhite Microelectronics

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5962-9690002H9A Overview

Memory Circuit, 128KX16, CMOS, CDSO68,

5962-9690002H9A Parametric

Parameter Name	Attribute value
Maker	White Microelectronics
Reach Compliance Code	unknown
Other features	ALSO CONFIGURABLE AS 128K X 16-BIT FLASH EPROM, 70 ACCESS TIME
JESD-30 code	S-CDSO-G68
JESD-609 code	e0
length	23.875 mm
memory density	2097152 bit
Memory IC Type	MEMORY CIRCUIT
memory width	16
Number of functions	1
Number of terminals	68
word count	131072 words
character code	128000
Operating mode	ASYNCHRONOUS
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
organize	128KX16
Package body material	CERAMIC, METAL-SEALED COFIRED
encapsulated code	SOP
Package shape	SQUARE
Package form	SMALL OUTLINE
Certification status	Not Qualified
Maximum seat height	3.56 mm
Maximum supply voltage (Vsup)	5.5 V
Minimum supply voltage (Vsup)	4.5 V
Nominal supply voltage (Vsup)	5 V
surface mount	YES
technology	CMOS
Temperature level	MILITARY
Terminal surface	TIN LEAD
Terminal form	GULL WING
Terminal pitch	1.27 mm
Terminal location	DUAL
width	23.88 mm
Base Number Matches	1

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REVISIONS

LTR

DESCRIPTION

Changes to V

OLS

and V

OHS

tests for device type 02.

Table I; Changed I

CC1

max limit from 250 mA to 310 mA. -sld

Table I; Changed the SRAM supply current (I

CC1

) max limit from 310

mA to 360 mA. -sld

Added case outline 9. Table I; changed the V

test condition I

from 12.0 mA to 8.0 mA . Added note to paragraph 1.2.2 and table I

regarding the 4 transistor design. -sld

Added case outline Y. Updated drawing to reflect current

requirements of MIL-PRF-38534. -sld

Added case outline B. Added note to paragraph 1.2.4. -sld

DATE (YR-MO-DA)

97-09-16

98-06-26

99-08-23

00-09-20

APPROVED

K. A. Cottongim

Raymond Monnin

03-03-14

03-11-10

Raymond Monnin

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

SHEET

PREPARED BY

Gary Zahn

CHECKED BY

Michael C. Jones

STANDARD

MICROCIRCUIT

DRAWING

THIS DRAWING IS

AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DEFENSE SUPPLY CENTER COLUMBUS

P. O. BOX 3990

COLUMBUS, OHIO 43216-5000

APPROVED BY

Kendall A. Cottongim

MICROCIRCUIT, HYBRID, MEMORY, DUAL, DIGITAL,

SINGLE 128K x 16 BIT STATIC RANDOM ACCESS

MEMORY, WITH SEPARATE DATA BUS AND SINGLE, 128K

x 16-BIT FLASH ERASABLE/PROGRAMMABLE READ ONLY

MEMORY WITH SEPARATE DATA BUS

DRAWING APPROVAL DATE

97-01-27

AMSC N/A

REVISION LEVEL

SIZE

SHEET

CAGE CODE

67268

1 OF

5962-96900

DSCC FORM 2233

APR 97

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

5962-E014-04

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a

part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in

the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the

solitation.

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.

STANDARDS

DEPARTMENT OF DEFENSE

MIL-STD-883 - Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Microcircuit Case Outlines.

HANDBOOKS

DEPARTMENT OF DEFENSE

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in

accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as

designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.

Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).

Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not

perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device

class.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38534 and herein.

3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.

3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3.

3.2.4 Timing diagram(s). The timing diagram(s) shall be as specified on figures 4, 5, 6, 7, 8 and 9.

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

SIZE

REVISION LEVEL

5962-96900

SHEET

DSCC FORM 2234

APR 97

3.2.5 Block diagram(s). The block diagram(s) shall be as specified on figure 10.

3.2.6 Output load circuit. The output load circuit shall be as specified on figure 11.

3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are

as specified in table I and shall apply over the full specified operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical

tests for each subgroup are defined in table I.

3.5 Programming procedure. The programming procedure shall be as specified by the manufacturer and shall be available

upon request.

3.6 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked

with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.

3.7 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described

herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot

sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for

those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer

and be made available to the preparing activity (DSCC-VA) upon request.

3.8 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this

drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets

the performance requirements of MIL-PRF-38534 and herein.

3.9 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of

microcircuits delivered to this drawing.

3.10 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This

reprogrammability test shall be done for the initial characterization and after any design process changes which may affect the

reprogrammability of the device. The methods and procedures may be vendor specific, but shall guarantee the number of

program/erase cycles listed in section 1.3 herein over the full military temperature range. The vendor's procedure shall be kept

under document control and shall be made available upon request of the acquiring or preparing activity.

3.11 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall

be done for initial characterization and after any design process change which may affect data retention. The methods and

procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military

temperature range. The vendor's procedure shall be kept under document control and shall be made available upon request of

the acquiring or preparing activity.

STANDARD

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

SIZE

REVISION LEVEL

5962-96900

SHEET

DSCC FORM 2234

APR 97

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