IDT74ALVCH162373
3.3V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
INDUSTRIAL TEMPERATURE RANGE
3.3V CMOS 16-BIT TRANS-
PARENT D-TYPE LATCH
WITH 3-STATE OUTPUTS
AND BUS-HOLD
FEATURES:
• 0.5 MICRON CMOS Technology
• Typical t
SK(o)
(Output Skew) < 250ps
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
• V
CC
= 3.3V ± 0.3V, Normal Range
• V
CC
= 2.7V to 3.6V, Extended Range
• V
CC
= 2.5V ± 0.2V
• CMOS power levels (0.4μ W typ. static)
μ
• Rail-to-Rail output swing for increased noise margin
• Available in SSOP and TSSOP packages
IDT74ALVCH162373
DESCRIPTION:
This 16-bit transparent D-type latch is built using advanced dual metal CMOS
technology. The ALVCH162373 is particularly suitable for imple-menting buffer
registers, I/O ports, bidirectional bus drivers, and working registers. This device
can be used as two 8-bit latches or one16-bit latch. When the latch enable (LE)
input is high, the Q outputs follow the data (D) inputs. When LE is taken low, the
Q outputs are latched at the levels set up at the D inputs.
A buffered output-enable (OE) can be used to place the eight outputs in either
a normal logic state (high or low logic levels) or a high-impedance state. In the
high-impedance state, the outputs neither load nor drive the bus lines signifi-
cantly. The high-impedance state and the increased drive provide the capability
to drive bus lines without need for interface or pullup components.
OE
does not
affect internal operations of the latch. Old data can be retained or new data can
be enetered while the outputs are in the high-impedance state.
The ALVCH162373 has series resistors in the device output structure which
will significantly reduce line noise when used with light loads. This driver has
been designed to drive ±12mA at the designated threshold levels.
The ALVCH162373 has “bus-hold” which retains the inputs’ last state
whenever the input goes to a high impedance. This prevents floating inputs and
eliminates the need for pull-up/down resistor.
DRIVE FEATURES:
• Balanced Output Drivers: ±12mA
• Low switching noise
APPLICATIONS:
• 3.3V high speed systems
• 3.3V and lower voltage computing systems
FUNCTIONAL BLOCK DIAGRAM
1
OE
1
2
OE
24
1
LE
48
2
LE
25
C1
2
C1
1
Q
1
2
D
1
36
13
2
Q
1
1
D
1
47
1D
1D
TO 7 OTHER CHANNELS
TO 7 OTHER CHANNELS
IDT and the IDT logo are registered trademarks of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
1
© 2009 Integrated Device Technology, Inc.
JULY 2009
DSC-4575/6
IDT74ALVCH162373
3.3V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
1
LE
1
D
1
1
D
2
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
TERM
(2)
Description
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
Continuous Clamp Current,
V
I
< 0 or V
I
> V
CC
Continuous Clamp Current, V
O
< 0
Continuous Current through each
V
CC
or GND
Max
–0.5 to +4.6
–0.5 to V
CC
+0.5
–65 to +150
–50 to +50
±50
–50
±100
Unit
V
V
°C
mA
mA
mA
mA
V
TERM
(3)
T
STG
I
OUT
I
IK
I
OK
I
CC
I
SS
1
OE
1
Q
1
1
Q
2
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
GND
1
Q
3
1
Q
4
GND
1
D
3
1
D
4
V
CC
1
Q
5
1
Q
6
V
CC
1
D
5
1
D
6
GND
1
Q
7
1
Q
8
2
Q
1
2
Q
2
GND
1
D
7
1
D
8
2
D
1
2
D
2
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. V
CC
terminals.
3. All terminals except V
CC
.
CAPACITANCE
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
C
OUT
C
I/O
Parameter
(1)
Input Capacitance
Output Capacitance
I/O Port Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
V
IN
= 0V
Typ.
5
7
7
Max.
7
9
9
Unit
pF
pF
pF
GND
2
Q
3
2
Q
4
GND
2
D
3
2
D
4
NOTE:
1. As applicable to the device type.
V
CC
2
Q
5
2
Q
6
V
CC
2
D
5
2
D
6
PIN DESCRIPTION
Pin Names
xDx
xLE
xQx
xOE
Description
Data Inputs
(1)
Latch Enable Inputs
3-State Outputs
3-State Output Enable Input (Active LOW)
GND
2
Q
7
2
Q
8
2
OE
GND
2
D
7
2
D
8
2
LE
NOTE:
1. These pins have "Bus-Hold". All other pins are standard inputs, outputs, or I/Os.
SSOP/ TSSOP
TOP VIEW
FUNCTION TABLE
(EACH 8-BIT SECTION)
(1)
Inputs
xOE
L
L
H
L
xLE
H
H
X
L
xDx
H
L
X
X
Outputs
xQx
H
L
Z
Q
o(2)
NOTES:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High Impedance
2. Output level before the indicated steady-state input conditions were established.
2
IDT74ALVCH162373
3.3V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Operating Condition: T
A
= –40°C to +85°C
Symbol
V
IH
Parameter
Input HIGH Voltage Level
V
CC
= 2.3V to 2.7V
V
CC
= 2.7V to 3.6V
V
IL
I
IH
I
IL
I
OZH
I
OZL
V
IK
V
H
I
CCL
I
CCH
I
CCZ
ΔI
CC
Input LOW Voltage Level
Input HIGH Current
Input LOW Current
High Impedance Output Current
(3-State Output pins)
Clamp Diode Voltage
Input Hysteresis
Quiescent Power Supply Current
V
CC
= 2.3V, I
IN
= –18mA
V
CC
= 3.3V
V
CC
= 3.6V
V
IN
= GND or V
CC
One input at V
CC
- 0.6V, other inputs at V
CC
or GND
V
CC
= 2.3V to 2.7V
V
CC
= 2.7V to 3.6V
V
CC
= 3.6V
V
CC
= 3.6V
V
CC
= 3.6V
V
I
= V
CC
V
I
= GND
V
O
= V
CC
V
O
= GND
Test Conditions
Min.
1.7
2
—
—
—
—
—
—
—
—
—
Typ.
(1)
—
—
—
—
—
—
—
—
–0.7
100
0.1
Max.
—
—
0.7
0.8
±5
±5
±10
±10
–1.2
—
40
V
mV
µA
µA
µA
µA
V
Unit
V
Quiescent Power Supply Current
Variation
—
—
750
µA
NOTE:
1. Typical values are at V
CC
= 3.3V, +25°C ambient.
BUS-HOLD CHARACTERISTICS
Symbol
I
BHH
I
BHL
I
BHH
I
BHL
I
BHHO
I
BHLO
NOTES:
1. Pins with Bus-Hold are identified in the pin description.
2. Typical values are at V
CC
= 3.3V, +25°C ambient.
Parameter
(1)
Bus-Hold Input Sustain Current
Bus-Hold Input Sustain Current
Bus-Hold Input Overdrive Current
V
CC
= 3V
V
CC
= 2.3V
V
CC
= 3.6V
Test Conditions
V
I
= 2V
V
I
= 0.8V
V
I
= 1.7V
V
I
= 0.7V
V
I
= 0 to 3.6V
Min.
– 75
75
– 45
45
—
Typ.
(2)
—
—
—
—
—
Max.
—
—
—
—
±500
Unit
µA
µA
µA
3
IDT74ALVCH162373
3.3V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
INDUSTRIAL TEMPERATURE RANGE
OUTPUT DRIVE CHARACTERISTICS
Symbol
V
OH
Parameter
Output HIGH Voltage
V
CC
= 2.3V
V
CC
= 2.7V
V
CC
= 3V
V
OL
Output LOW Voltage
V
CC
= 2.3V to 3.6V
V
CC
= 2.3V
V
CC
= 2.7V
V
CC
= 3V
Test Conditions
(1)
V
CC
= 2.3V to 3.6V
I
OH
= – 0.1mA
I
OH
= – 4mA
I
OH
= – 6mA
I
OH
= – 4mA
I
OH
= – 8mA
I
OH
= – 6mA
I
OH
= – 12mA
I
OL
= 0.1mA
I
OL
= 4mA
I
OL
= 6mA
I
OL
= 4mA
I
OL
= 8mA
I
OL
= 6mA
I
OL
= 12mA
Min.
V
CC
– 0.2
1.9
1.7
2.2
2
2.4
2
—
—
—
—
—
—
—
Max.
—
—
—
—
—
—
—
0.2
0.4
0.55
0.4
0.6
0.55
0.8
V
Unit
V
NOTE:
1. V
IH
and V
IL
must be within the min. or max. range shown in the DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE table for the appropriate V
CC
range.
T
A
= – 40°C to + 85°C.
OPERATING CHARACTERISTICS, T
A
= 25°C
V
CC
= 2.5V ± 0.2V
Symbol
C
PD
C
PD
Parameter
Power Dissipation Capacitance Outputs enabled
Power Dissipation Capacitance Outputs disabled
Test Conditions
C
L
= 0pF, f = 10Mhz
Typical
19
4
V
CC
= 3.3V ± 0.3V
Typical
22
5
Unit
pF
SWITCHING CHARACTERISTICS
(1)
V
CC
= 2.5V ± 0.2V
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
SU
t
H
t
W
t
SK(O)
Parameter
Propagation Delay
xDx to xQx
Propagation Delay
xLE to xQx
Output Enable Time
xOE to xQx
Output Disable Time
xOE to xQx
Setup Time, data before LE↓
Hold Time, data after LE↓
Pulse Duration, LE HIGH or LOW
Output Skew
(2)
2
1.5
3.3
—
—
—
—
—
2
1.5
3.3
—
—
—
—
—
2
1.5
3.3
—
—
—
—
500
ns
ns
ns
ps
1.5
5.6
1.5
5.5
1.5
4.5
ns
1.5
6.5
1.5
6
1.5
5
ns
2
5.6
2
5
2
4
ns
Min.
1.5
Max.
5.3
V
CC
= 2.7V
Min.
1.5
Max.
4.5
V
CC
= 3.3V ± 0.3V
Min.
1.5
Max.
4
Unit
ns
NOTES:
1. See TEST CIRCUITS AND WAVEFORMS. T
A
= – 40°C to + 85°C.
2. Skew between any two outputs of the same package and switching in the same direction.
4
IDT74ALVCH162373
3.3V CMOS 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
TEST CONDITIONS
Symbol
V
LOAD
V
IH
V
T
V
LZ
V
HZ
C
L
V
CC(1)
= 3.3V±0.3V V
CC(1)
= 2.7V
6
2.7
1.5
300
300
50
6
2.7
1.5
300
300
50
V
CC(2)
= 2.5V±0.2V
2 x Vcc
Vcc
Vcc / 2
150
150
30
Unit
V
V
V
mV
mV
pF
SAME PHASE
INPUT TRANSITION
t
PLH
OUTPUT
t
PLH
OPPOSITE PHASE
INPUT TRANSITION
t
PHL
t
PHL
V
IH
V
T
0V
V
OH
V
T
V
OL
V
IH
V
T
0V
ALVC Link
Propagation Delay
ENABLE
CONTROL
INPUT
t
PZL
V
LOAD/2
OUTPUT
SWITCH
V
T
NORMALLY
CLOSED
LOW
t
PHZ
t
PZH
OUTPUT
SWITCH
NORMALLY
V
OPEN
T
HIGH
0V
DIS-
ABLE
t
PLZ
V
CC
500Ω
Pulse
Generator
(1, 2)
V
LOAD
Open
GND
V
IH
V
T
0V
V
LOAD/2
V
LZ
V
OL
V
OH
V
HZ
0V
ALVC Link
V
IN
D.U.T.
R
T
V
OUT
500Ω
C
L
ALVC Link
Test Circuit for All Outputs
DEFINITIONS:
C
L
= Load capacitance: includes jig and probe capacitance.
R
T
= Termination resistance: should be equal to Z
OUT
of the Pulse Generator.
NOTES:
1. Pulse Generator for All Pulses: Rate
≤
1.0MHz; t
F
≤
2.5ns; t
R
≤
2.5ns.
2. Pulse Generator for All Pulses: Rate
≤
1.0MHz; t
F
≤
2ns; t
R
≤
2ns.
Enable and Disable Times
NOTE:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS
CONTROL
SYNCHRONOUS
CONTROL
SWITCH POSITION
Test
Open Drain
Disable Low
Enable Low
Disable High
Enable High
All Other Tests
Switch
V
LOAD
GND
Open
t
SU
t
H
t
REM
t
SU
t
H
V
IH
V
T
0V
V
IH
V
T
0V
V
IH
V
T
0V
V
IH
V
T
0V
ALVC Link
INPUT
t
PLH1
t
PHL1
V
IH
V
T
0V
V
OH
V
T
V
OL
V
OH
V
T
V
OL
Set-up, Hold, and Release Times
OUTPUT 1
LOW-HIGH-LOW
PULSE
t
W
HIGH-LOW-HIGH
PULSE
V
T
t
SK
(x)
t
SK
(x)
OUTPUT 2
t
PLH2
t
PHL2
V
T
ALVC Link
Pulse Width
ALVC Link
t
SK
(x)
= t
PLH2
-
t
PLH1
or
t
PHL2
-
t
PHL1
Output Skew - t
SK
(
X
)
NOTES:
1. For t
SK
(o) OUTPUT1 and OUTPUT2 are any two outputs.
2. For t
SK
(b) OUTPUT1 and OUTPUT2 are in the same bank.
5
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