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RN1407T5LFT

Description
Bipolar Transistors - Pre-Biased NPN 50V 0.1A TRANSISTOR LOG
Categorysemiconductor    Discrete semiconductor   
File Size356KB,7 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Environmental Compliance
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Bipolar Transistors - Pre-Biased NPN 50V 0.1A TRANSISTOR LOG

RN1407T5LFT Parametric

Parameter NameAttribute value
Product AttributeAttribute Value
ManufacturerToshiba Semiconductor
Product CategoryBipolar Transistors - Pre-Biased
RoHSDetails
ConfigurationSingle
Transistor PolarityNPN
Typical Input Resistor10 kOhms
Typical Resistor Ratio0.213
Mounting StyleSMD/SMT
Collector- Emitter Voltage VCEO Max50 V
Continuous Collector Current100 mA
Peak DC Collector Current100 mA
Minimum Operating Temperature- 55 C
Maximum Operating Temperature+ 150 C
PackagingReel
DC Current Gain hFE Max80
Factory Pack Quantity3000
RN1407½RN1409
TOSHIBA Transistor
Silicon NPN Epitaxial Type (PCT Process)
RN1407, RN1408, RN1409
Switching, Inverter Circuit, Interface Circuit
and Driver Circuit Applications
With built-in bias resistors
Simplified circuit design
Reduce a quantity of parts and manufacturing process
Complementary to RN2407 to RN2409
Unit: mm
Equivalent Circuit and Bias Resistor Values
Type No.
RN1407
RN1408
RN1409
R1 (kΩ)
10
22
47
R2 (kΩ)
47
47
22
Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Collector-base voltage
Collector-emitter voltage
RN1407 to 1409
RN1407 to 1409
RN1407
Emitter-base voltage
RN1408
RN1409
Collector current
Collector power dissipation
Junction temperature
Storage temperature range
RN1407 to 1409
RN1407 to 1409
RN1407 to 1409
RN1407 to 1409
I
C
P
C
T
j
T
stg
V
EBO
Symbol
V
CBO
V
CEO
Rating
50
50
6
7
15
100
200
150
−55
to 150
JEDEC
TO-236MOD
JEITA
SC-59
TOSHIBA
2-3F1A
Weight: 0.012g (typ.)
Unit
V
V
V
mA
mW
°C
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Start of commercial production
1985-05
1
2014-03-01

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