TEMPERATURE
TRANSDUCER DIE
AD590
1.0
SCOPE
This specification documents the detailed requirements for Analog Devices space qualified die including
die qualification as described for Class K in MIL-PRF-38534, Appendix C, Table C-II except as
modified herein.
The manufacturing flow described in the STANDARD DIE PRODUCTS PROGRAM brochure at
http://www.analog.com/aerospace
is to be considered a part of this specification.
This data sheet specifically details the space grade version of this product. A more detailed
operational description and a complete data sheet for commercial product grades can be found at
www.analog.com/AD590
2.0
Part Number.
The complete part number(s) of this specification follow:
Part Number
AD590-000C
AD590R000C
3.0
Die Information
3.1
Die Dimensions
Die Size
66 mil x 42 mil
Die Thickness
12 mil ± 2 mil
Bond Pad
Metalization
Al/Cu
Description
Temperature Transducer
Radiation tested Temperature Transducer
3.2
Die Picture
AD590S* PRODUCT PAGE QUICK LINKS
Last Content Update: 02/23/2017
COMPARABLE PARTS
View a parametric search of comparable parts.
DISCUSSIONS
View all AD590S EngineerZone Discussions.
DOCUMENTATION
Data Sheet
•
AD590S: Military Data Sheet
SAMPLE AND BUY
Visit the product page to see pricing options.
TECHNICAL SUPPORT
DESIGN RESOURCES
•
AD590S Material Declaration
•
PCN-PDN Information
•
Quality And Reliability
•
Symbols and Footprints
Submit a technical question or find your regional support
number.
DOCUMENT FEEDBACK
Submit feedback for this data sheet.
This page is dynamically generated by Analog Devices, Inc., and inserted into this data sheet. A dynamic change to the content on this page will not
trigger a change to either the revision number or the content of the product data sheet. This dynamic page may be frequently modified.
AD590
3.3
Absolute Maximum Ratings
1/
Forward voltage (V+ to V-)
………………………………………………
+44 V dc
Reverse voltage (V+ to V-)
……………………………………………...
-20 V dc
Breakdown voltage (case to V+ or V-)
……………………………
±200 V dc
Rated performance temperature range
………………………………
-55°C to +125°V
Storage Temperature ......................................................... -65C to +150C
Junction Temperature (T
J
)
........................................................
+150°C
Absolute Maximum Ratings Notes:
1/ Stresses above the absolute maximum rating may cause permanent damage to the
device. Extended operation at the maximum levels may degrade performance and
affect reliability.
Die Qualification
In accordance with class-K version of MIL-PRF-38534, Appendix C, Table C-II, except as
modified herein.
(a) Qual Sample Size and Qual Acceptance Criteria – 25/2
(b) Qual Sample Package – TO-99
(c)
4.0
Table I - Dice Electrical Characteristics
Parameter
Output Current
Reverse Leakage
Forward
Breakdown
Supply Rejection
Calibration Error
Conditions
Symbol
1/
I
OUT
RL
Bd
FWD
PSR
C
E
Limit
Min
200
200
Limit
Max
400
±5.0
400
±5
±0.25
Units
μA
μA
μA
μA
µA
AD590
Table II - Electrical Characteristics for Qual Samples
Parameter
Symbol
Conditions 1/ 2/ 3/
Group A
Sub-
groups
1
1
2, 3
2, 3
-10.0
Min
Limit
Max
Limit
5
5.0
10
3
Units
Ambient
Error
Absolute
Error
Calibrated
absolute
error
Nonlinearity
Repeatability
E
Nominal output current is 298.15 µA @
+25°C
M, D, P, L, R
-55°C to +125°C without external
calibration 4/
-55°C to +125°C with ambient error (E)
set to zero 4/ 6/
-55°C to +125°C 4/ 5/ 6/
Max deviation between +25°C reading
after temperature. Cycling between -
55°C and +125°C 4/ 5/
Constant +5 V; Constant +125°C 4/ 5/
+4 V ≤ Vs ≤ +5 V 4/ 5/
+5 V ≤ Vs ≤ +15 V 4/ 5/
+15 V ≤ Vs ≤ +30 V 4/ 5/
4/ 5/
±°C
E
A
Ec
NL
RPT
2, 3
1, 2, 3
1.5
0.1
Long-term
drift
Power
supply
rejection
ratio
Power
supply
voltage
range
∆E/∆T
PSRR
0.1
1
1
0.4
0.2
4
30
±°C/month
°C/V
Vs
1
V
Table II Notes:
1/ Devices supplied to this drawing meet all levels M, D, P, L, and R of irradiation. However, this
device is only tested at the R level. Pre and post irradiation values are identical unless otherwise
specified in table II.
2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low
dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the
conditions specified in MIL-STD-883, method 1019, condition A.
3/ +Vs = +5 V, -Vs= GND, -55°C
≤ T
A
≤ +125°C unless otherwise specified.
4/ This parameter is not tested post-irradiation.
5/ Guaranteed if not tested.
6/ See Figure 1
AD590
Table III
–
240 hour
Endpoint and group C Delta Limits (+25°C)
(Product is tested in accordance with Table II with the following exceptions)
Sub-
groups
1
Burn-in End-
point
5
Burn-
in
Delta
0.5
Group C Group C
endpoint
Delta
6
1
Parameter
Ambient error
Symbol
E
Units
±°C
Note: Vs across device must remain constant or PSRR error must be included
Figure 1.
One temperature trim
京公网安备 11010802033920号
EEWORLD
