10/23/2012
RELIABILITY MONITOR REPORT
FOR
FAB-101 Silicon Gate 0.18μm CMOS (S18)
MAXIM INTEGRATED
160 RIO ROBLES
SAN JOSE, CA 95134
This Report was prepared by
MAXIM INTEGRATED Reliability Engineering
Summary:
The data in the tables that follow was generated as the result of an on-going Process Reliability
Monitor. The specific products in this process monitor are:
MAX7370ATG+
MAX8957TEWI+
MAX8997EWW+
MAX77686EWE
MAX8959EWG+
MAX98095EWG
MAX8955E/DW
MAX8968EWL+
MAX98096EWF
MAX8957BEWI
MAX8971EWP+
MAX98096EWF
MAX8957EWI+T
MAX8971EWP+
The calculated failure rate for devices using this process is:
FAILURE RATE:
MTTF (YRS): 24501
QUANTITY: 762
FAILS: 1
FITS: 4.7
The parameters used to calculate this failure rate are as follows:
Cf: 60%
Ea: 0.7
Tu: 25
°C
The reliability data follows and in this section is the detailed reliability data by stress. The reliability
data section includes the latest data available. This report covers data between
10/1/2011
and
9/30/2012
.
Process Information:
Process Description:
OPERATING LIFE
DESCRIPTION
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
HIGH TEMP OP LIFE
1114
1133
1139
1143
1143
1145
1146
1149
1205
1206
1222
1223
N/A
N/A
DATE TEST
CODE VEHICLE
MAX8997EWW+T
MAX7370ATG+
MAX8959EWG+T
MAX8968EWL+CBF
MAX8971EWP+T
MAX98095EWG
MAX8959EWG+T
MAX8959EWG+T
MAX8971EWP+
MAX77686EWE+T
MAX8957BEWI+T
MAX98096EWF+
MAX8955E/DW+
MAX8959EWG+T
MAX8959EWG+T
CONDITION
135°C
135°C
135°C
135°C
135°C
135°C
135°C
135°C
135°C
135°C
135°C
135°C
135°C
135°C
135°C
READPOINT QUANTITY
1000 HRS
192
500
500
192
500
192
192
192
240
192
500
568
HRS
HRS
HRS
HRS
HRS
HRS
HRS
HRS
HRS
HRS
HRS
HRS
48
79
45
48
50
45
45
45
48
48
46
46
80
44
45
FAILS
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
1
LOT
NO.
VW3ZEA556B
VY0ZAQ001DQ
VR2ZG2144AC
VX2YBA006AQ
VAAU8A006AQ
V5AZAQ002CA
VR2ZG2238AC
VR2ZG2239AG
VADF6A005AQ
VAEC0Q003BQ
VADE0A004AQ
VAHH8Q002AQ
VAGP8A009AQ
VR2ZGQ001I
VR2ZGA231CB
FAB-101 Silicon Gate 0.18μm CMOS (S18)
1000 HRS
1000 HRS
Total:
STORAGE LIFE
DESCRIPTION
STORAGE LIFE
DATE TEST
CODE VEHICLE
1229
MAX8997EWW+T
CONDITION
150°C
READPOINT QUANTITY
500
HRS
77
FAILS
1
LOT
NO.
VW3ZDQ002B#