Operating Temperature Range .........................-40°C to +125°C
Storage Temperature Range .............................-65°C to +150°C
Lead Temperature (soldering, 10s) .................................+300°C
Soldering Temperature (reflow) .......................................+260°C
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(V
CC
= full range, T
A
= -40°C to +125°C, unless otherwise specified. Typical values are at T
A
= +25°C.) (Note 1)
PARAMETER
Operating Voltage Range
SYMBOL
V
CC
V
CC
= 5.5V, no load
V
CC
Supply Current
I
CC
V
CC
= 3.6V, no load
V
CC
= 2.5V, no load
V
CC
= 1.8V, no load
V
CC
Reset Threshold
(See Reset Thresholds table)
Reset Threshold Tempco
V
CC
to Reset Delay
T
A
= +25°C
V
TH
T
A
= -40°C to +125°C
∆V
TH
/°C
V
CC
falling at 10mV/µs from V
TH
+ 100mV
to V
TH
- 100mV
D1
D2
Reset Timeout Period
MAX6381–MAX6389
(See Reset Timeout table)
D3
t
RP
D5
D6
D4
D7
MR
timeout period
Reset Timeout Period
MAX6390
t
RP
V
CC
timeout period
V
IL
V
TH
< 4V
MR
Input Voltage
V
IH
V
IL
V
IH
V
TH
> 4V
0.7 x
V
CC
0.8
2.4
D4
D7
D4
D7
1
20
140
280
560
1120
1200
140
150
1120
1200
V
TH
-
1.5%
V
TH
-
2.5%
CONDITIONS
MIN
1.0
7
6
4
3
V
TH
V
TH
60
35
2
40
280
560
1120
2240
2400
280
300
2240
2400
0.3 x
V
CC
V
ms
ms
TYP
MAX
5.5
13
11
7
6
V
TH
+
1.5%
V
V
TH
+
2.5%
ppm/°C
µs
µA
UNITS
V
2
SC70/µDFN, Single/Dual Low-Voltage,
Low-Power µP Reset Circuits
ELECTRICAL CHARACTERISTICS (continued)
(V
CC
= full range, T
A
= -40°C to +125°C, unless otherwise specified. Typical values are at T
A
= +25°C.) (Note 1)
PARAMETER
MR
Minimum Input Pulse Width
MR
Glitch Rejection
MR
to Reset Delay
MR
Internal Pullup Resistance
MAX6381–MAX6389
MAX6390
T
A
= +25°C
RESET IN Input Threshold
V
THRST
T
A
= 0°C to +85°C
T
A
= -40°C to +125°C
RESET IN to RESET Delay
RESET IN Input Leakage Current
Open-Drain
RESET
Output
Voltage
Open-Drain
RESET
Output
Leakage Current
I
RESET IN
V
CC
≥
4.5V, I
SINK
= 3.2mA, reset asserted
V
OL
V
CC
≥
2.5V, I
SINK
= 1.2mA, reset asserted
V
CC
≥
1.0V, I
SINK
= 80µA, reset asserted
I
LKG
V
CC
> V
TH
,
RESET
not asserted
V
CC
≥
4.5V, I
SINK
= 3.2mA, reset asserted
V
OL
Push-Pull
RESET
Output Voltage
V
OH
V
CC
≥
2.5V, I
SINK
= 1.2mA, reset asserted
V
CC
≥
1.0V, I
SINK
= 80µA, reset asserted
V
CC
≥
4.5V, I
SOURCE
= 800µA, reset not
asserted
V
CC
≥
2.5V, I
SOURCE
= 500µA, reset not
asserted
V
CC
≥
4.5V, I
SOURCE
= 800µA, reset asserted
V
CC
≥
2.5V, I
SOURCE
= 500µA, reset asserted
V
OH
V
CC
≥
1.8V, I
SOURCE
= 150µA, reset asserted
Push-Pull RESET Output Voltage
V
CC
≥
1.0V, I
SOURCE
= 1µA, reset asserted
V
CC
≥
4.5V, I
SINK
= 3.2mA, reset not
asserted
V
OL
V
CC
≥
2.5V, I
SINK
= 1.2mA, reset not
asserted
0.8 x
V
CC
0.8 x
V
CC
0.8 x
V
CC
0.8 x
V
CC
0.8 x
V
CC
0.8 x
V
CC
0.4
0.3
V
RESETIN
falling at 4mV/µs from
V
THRST
+ 40mV to V
THRST
- 40mV
-50
32
500
1.245
1.232
1.219
4.5
±1
+50
0.4
0.3
0.3
1.0
0.4
0.3
0.3
V
µA
V
SYMBOL
CONDITIONS
MIN
1
100
200
63
1560
1.27
100
3000
1.295
1.308
1.321
µs
nA
V
TYP
MAX
UNITS
µs
ns
ns
kΩ
Ω
MAX6381–MAX6390
V
Note 1:
Specifications over temperature are guaranteed by design, not production tested.
[color=#000][font=Helvetica, Arial, sans-serif]I urgently need to make a peak holding circuit solution with a pulse width of about 5 nanoseconds. As shown in the figure. I checked a lot of information...
Why have so many articles been written recently to thank President Xi for his visit to Mongolia? Today's "Focus Interview" is also President Xi's speech in Mongolia....
I was recently debugging a program with IAR and found the following problem: [table=98%] [tr][td]const char mm[6]={0xff,0xff,0xff,0xff,0xff,0xff}; --------- char *ptr; ptr=mm; The error message is: Er...
Core saturation is equivalent to an air-core coil on the primary side of the transformer (equivalent to a short circuit). The current will be very large and will continue to rise until the transformer...
[i=s] This post was last edited by paulhyde on 2014-9-15 09:00 [/i] The problem of fir filter in FPGA. The filter I set is a low-pass filter, the sampling frequency is 10M, the cut-off frequency is 50...
At present, the development of wireless power supply technology for electric vehicles (EVs) is becoming more and more active. In 2012, Volvo of Sweden established Volvo Technology Japan in Tokyo as...[Details]
When the WDP500-2A plane grating monochromator is used to test the emission wavelength of a high-power laser diode at different currents, the matching of the laser diode has the disadvantages of lo...[Details]
Automotive applications are particularly sensitive to EMI events, which are unavoidable in a noisy electrical environment consisting of a central battery, bundled wiring harnesses, various inductiv...[Details]
In order to highlight the concept of "energy saving and environmental protection" of intelligent buildings, solar street lights are designed for intelligent communities. The inclination and capacit...[Details]
Although it is relatively easy to check the stability of a simple amplifier at lower frequencies, it may be much more difficult to evaluate the stability of a more complex circuit. This artic...[Details]
From the PIC16F946 datasheet, we know that there are two ways to write values to the LCD for display:
1. Directly write the value to LCDDATA1~LCDDATA23
2. Use disconnect t...[Details]
0 Introduction
With the rise and continuous improvement of the solid-state lighting industry, light-emitting diodes (LEDs) have become an alternative lighting technology and are gr...[Details]
With the rapid development of wireless
digital communication
, more challenges have been raised for integrated circuit design and testing. In the product design stage, in order to ensure
t...[Details]
Analysis of the three core aspects of digital TV transmission standards
According to the differences in regionality, transmission method and modulation method, the transmission method needs to...[Details]
The launch of Shenzhou IX is imminent, and Tiangong is welcoming visitors again. Yesterday, Professor Fu Qiang, Vice President of the Institute of Science and Industrial Technology of Harbin Instit...[Details]
Fruit planting is an important part of China's agricultural development, and fruit tree pest control operations are becoming more and more important. At present, the overall level of pesticide applica...[Details]
Every time I go home and walk up the stairs, I am always scared. The corridor lights are often broken, and no one changes the bulbs, or they are not smart enough and need to be operated manually. E...[Details]
Nowadays, more and more people have digital cameras. The convenience and speed of digital cameras have gradually replaced film cameras and become the main tool for people's daily photography. The n...[Details]
The capacity of a battery depends on the amount of charge and discharge, in addition to some factors of the battery itself. Obviously, if the charge and discharge of the battery can be recorded all...[Details]
HL201A is a special thick film driver integrated circuit with a capacity of less than 75AGTR developed by Xi'an Power Electronics Technology Research Institute. The article explains the pin arrange...[Details]
ADI Reference Circuit
京公网安备 11010802033920号
EEWORLD
