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EA2532QA10-48000M

Description
Crystals
CategoryPassive components   
File Size543KB,4 Pages
ManufacturerECLIPTEK
Websitehttp://www.ecliptek.com
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EA2532QA10-48000M Overview

Crystals

EA2532QA10-48000M Parametric

Parameter NameAttribute value
Product AttributeAttribute Value
ManufacturerECLIPTEK
Product CategoryCrystals
EA2532QA10-48.000M
REGULATORY COMPLIANCE
2011/65 +
2015/863
(Data Sheet downloaded on Jun 5, 2018)
174 SVHC
ITEM DESCRIPTION
Quartz Crystal Resonator 2.5mm x 3.2mm x 0.8mm 4 Pad Ceramic Surface Mount (SMD) 48.000MHz ±15ppm at 25°C, ±20ppm
over -40°C to +85°C 10pF Parallel Resonant
ELECTRICAL SPECIFICATIONS
Nominal Frequency
Frequency Tolerance/Stability
Aging at 25°C
Load Capacitance
Shunt Capacitance (C0)
Equivalent Series Resistance
Mode of Operation
Drive Level
Crystal Cut
Spurious Response
Storage Temperature Range
Insulation Resistance
48.000MHz
±15ppm at 25°C, ±20ppm over -40°C to +85°C
±3ppm/Year Maximum
10pF Parallel Resonant
5pF Maximum
50 Ohms Maximum
AT-Cut Fundamental
100µWatts Maximum
AT-Cut
-3dB Minimum (Measured from Fo to Fo +5000ppm)
-40°C to +150°C
500 Megaohms Minimum (Measured at 100Vdc)
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
ESD Susceptibility
Fine Leak Test
Flammability
Gross Leak Test
Mechanical Shock
Moisture Resistance
Moisture Sensitivity
Resistance to Soldering Heat
Resistance to Solvents
Solderability
Temperature Cycling
Vibration
MIL-STD-883, Method 3015, Class 1, HBM: 1500V
MIL-STD-883, Method 1014, Condition A
UL94-V0
MIL-STD-883, Method 1014, Condition C
MIL-STD-883, Method 2002, Condition B
MIL-STD-883, Method 1004
J-STD-020, MSL 1
MIL-STD-202, Method 210, Condition K
MIL-STD-202, Method 215
MIL-STD-883, Method 2003
MIL-STD-883, Method 1010, Condition B
MIL-STD-883, Method 2007, Condition A
www.ecliptek.com | Specification Subject to Change Without Notice | Revision D 10/27/2016 | Page 1 of 4
Ecliptek, LLC
5458 Louie Lane, Reno, NV 89511
1-800-ECLIPTEK or 714.433.1200
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