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A40MX02-VQG80

Description
FPGA - Field Programmable Gate Array MX
CategoryProgrammable logic devices    Programmable logic   
File Size7MB,142 Pages
ManufacturerMicrosemi
Websitehttps://www.microsemi.com
Environmental Compliance
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A40MX02-VQG80 Overview

FPGA - Field Programmable Gate Array MX

A40MX02-VQG80 Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
MakerMicrosemi
package instructionTQFP,
Reach Compliance Codecompliant
Other featuresALSO OPERATES AT 5V SUPPLY
maximum clock frequency80 MHz
Combined latency of CLB-Max2.7 ns
JESD-30 codeS-PQFP-G80
JESD-609 codee3
length14 mm
Humidity sensitivity level3
Configurable number of logic blocks295
Equivalent number of gates3000
Number of terminals80
Maximum operating temperature70 °C
Minimum operating temperature
organize295 CLBS, 3000 GATES
Package body materialPLASTIC/EPOXY
encapsulated codeTQFP
Package shapeSQUARE
Package formFLATPACK, THIN PROFILE
Peak Reflow Temperature (Celsius)260
Programmable logic typeFIELD PROGRAMMABLE GATE ARRAY
Certification statusNot Qualified
Maximum seat height1.2 mm
Maximum supply voltage3.6 V
Minimum supply voltage3 V
Nominal supply voltage3.3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceMatte Tin (Sn)
Terminal formGULL WING
Terminal pitch0.65 mm
Terminal locationQUAD
Maximum time at peak reflow temperature40
width14 mm
Base Number Matches1
Revision 11
40MX and 42MX FPGA Families
Features
High Capacity
Single-Chip ASIC Alternative
3,000 to 54,000 System Gates
Up to 2.5 kbits Configurable Dual-Port SRAM
Fast Wide-Decode Circuitry
Up to 202 User-Programmable I/O Pins
5.6 ns Clock-to-Out
250 MHz Performance
5 ns Dual-Port SRAM Access
100 MHz FIFOs
7.5 ns 35-Bit Address Decode
HiRel Features
Commercial, Industrial, Automotive,
Temperature Plastic Packages
and
Military
Commercial, Military Temperature, and MIL-STD-883
Ceramic Packages
QML Certification
Ceramic Devices Available to DSCC SMD
Mixed-Voltage Operation (5.0V or 3.3V for core and
I/Os), with PCI-Compliant I/Os
Up to 100% Resource Utilization and 100% Pin Locking
Deterministic, User-Controllable Timing
Unique In-System Diagnostic and Verification Capability
with Silicon Explorer II
Low Power Consumption
IEEE Standard 1149.1 (JTAG) Boundary Scan Testing
Ease of Integration
High Performance
Product Profile
Device
Capacity
System Gates
SRAM Bits
Logic Modules
Sequential
Combinatorial
Decode
Clock-to-Out
SRAM Modules
(64x4 or 32x8)
Dedicated Flip-Flops
Maximum Flip-Flops
Clocks
User I/O (maximum)
PCI
Boundary Scan Test (BST)
Packages (by pin count)
PLCC
PQFP
VQFP
TQFP
CQFP
PBGA
A40MX02
3,000
295
9.5 ns
147
1
57
44, 68
100
80
A40MX04
6,000
547
9.5 ns
273
1
69
44, 68, 84
100
80
A42MX09
14,000
348
336
5.6 ns
348
516
2
104
84
100, 160
100
176
A42MX16
24,000
624
608
6.1 ns
624
928
2
140
84
100, 160, 208
100
176
A42MX24
36,000
954
912
24
6.1 ns
954
1,410
2
176
Yes
Yes
84
160, 208
176
A42MX36
54,000
2,560
1,230
1,184
24
6.3 ns
10
1,230
1,822
6
202
Yes
Yes
208, 240
208, 256
272
May 2012
© 2012 Microsemi Corporation
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