PRELIMINARY
Am42DL32x4G
Stacked Multi-Chip Package (MCP) Flash Memory and SRAM
32 Megabit (4 M x 8-Bit/2 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash
Memory and 4 Mbit (256 K x 16-Bit) Static RAM
DISTINCTIVE CHARACTERISTICS
MCP Features
■
Power supply voltage of 2.7 to 3.3 volt
■
High performance
— Flash Access time as fast as 70 ns
— SRAM access time as fast as 55 ns
SOFTWARE FEATURES
■
Data Management Software (DMS)
— AMD-supplied software manages data programming and
erasing, enabling EEPROM emulation
— Eases sector erase limitations
■
Package
— 73-Ball FBGA
■
Supports Common Flash Memory Interface (CFI)
■
Erase Suspend/Erase Resume
— Suspends erase operations to allow programming in same
bank
■
Operating Temperature
— –40°C to +85°C
■
Data# Polling and Toggle Bits
— Provides a software method of detecting the status of
program or erase cycles
Flash Memory Features
ARCHITECTURAL ADVANTAGES
■
Simultaneous Read/Write operations
— Data can be continuously read from one bank while
executing erase/program functions in other bank
— Zero latency between read and write operations
■
Unlock Bypass Program command
— Reduces overall programming time when issuing multiple
program command sequences
HARDWARE FEATURES
■
Any combination of sectors can be erased
■
Ready/Busy# output (RY/BY#)
— Hardware method for detecting program or erase cycle
completion
■
Secured Silicon (SecSi) Sector: Extra 256 Byte sector
—
Factory locked and identifiable:
16 bytes available for
secure, random factory Electronic Serial Number; verifiable
as factory locked through autoselect function.
—
Customer lockable:
Sector is one-time programmable. Once
locked, data cannot be changed
■
Hardware reset pin (RESET#)
— Hardware method of resetting the internal state machine to
reading array data
■
Zero Power Operation
— Sophisticated power management circuits reduce power
consumed during inactive periods to nearly zero
■
WP#/ACC input pin
— Write protect (WP#) function allows protection of two outermost
boot sectors, regardless of sector protect status
— Acceleration (ACC) function accelerates program timing
■
Top or bottom boot block
■
Manufactured on 0.17 µm process technology
■
Compatible with JEDEC standards
— Pinout and software compatible with single-power-supply
flash standard
■
Sector protection
— Hardware method of locking a sector, either in-system or
using programming equipment, to prevent any program or
erase operation within that sector
— Temporary Sector Unprotect allows changing data in
protected sectors in-system
PERFORMANCE CHARACTERISTICS
■
High performance
— Access time as fast as 70 ns
— Program time: 4 µs/word typical utilizing Accelerate function
SRAM Features
■
Power dissipation
— Operating: 22 mA maximum for 70 ns, 30 mA maximum for
55 ns
— Standby: 10 µA maximum
■
Ultra low power consumption (typical values)
— 2 mA active read current at 1 MHz
— 10 mA active read current at 5 MHz
— 200 nA in standby or automatic sleep mode
■
Minimum 1 million write cycles guaranteed per sector
■
20 Year data retention at 125°C
— Reliable operation for the life of the system
■
■
■
■
CE1s# and CE2s Chip Select
Power down features using CE1s# and CE2s
Data retention supply voltage: 1.5 to 3.3 volt
Byte data control: LB#s (DQ7–DQ0), UB#s (DQ15–DQ8)
This document contains information on a product under development at Advanced Micro Devices. The information
is intended to help you evaluate this product. AMD reserves the right to change or discontinue work on this proposed
product without notice.
Publication#
25822
Rev:
B
Amendment/0
Issue Date:
May 19, 2003
Refer to AMD’s Website (www.amd.com) for the latest information.
P R E L I M I N A R Y
GENERAL DESCRIPTION
Am29DL32xG Features
The Am29DL322G/323G/324G consists of 32 megabit,
3.0 volt-only flash memory devices, organized as
2,097,152 words of 16 bits each or 4,194,304 bytes of
8 bits each. Word mode data appears on DQ15–DQ0;
byte mode data appears on DQ7–DQ0. The device is
designed to be programmed in-system with the stan-
dard 3.0 volt V
CC
supply, and can also be programmed
in standard EPROM programmers.
The devices are available with access times of 85 and
70 ns. The device is offered in a 73-ball FBGA pack-
age. Standard control pins—chip enable (CE#f), write
enable (WE#), and output enable (OE#)—control nor-
mal read and write operations, and avoid bus
contention issues.
The devices requires only a
single 3.0 volt power
supply
for both read and write functions. Internally
generated and regulated voltages are provided for the
program and erase operations.
DMS (Data Management Software)
allows systems
to easily take advantage of the advanced architecture
of the simultaneous read/write product line by allowing
removal of EEPROM devices. DMS will also allow the
system software to be simplified, as it will perform all
functions necessary to modify data in file structures,
as opposed to single-byte modifications. To write or
update a particular piece of data (a phone number or
configuration data, for example), the user only needs
to state which piece of data is to be updated, and
where the updated data is located in the system. This
is a n a d va n t a g e co m p a r e d t o sys t e ms w h e r e
user-written software must keep track of the old data
location, status, logical to physical translation of the
data onto the Flash memory device (or memory de-
vices), and more. Using DMS, user-written software
does not need to interface with the Flash memory di-
rectly. Instead, the user's software accesses the Flash
memory by calling one of only six functions. AMD pro-
vides this software to simplify system design and
software integration efforts.
The device offers complete compatibility with the
JEDEC single-power-supply Flash command set
standard.
Commands are written to the command
register using standard microprocessor write timings.
Reading data out of the device is similar to reading
from other Flash or EPROM devices.
The host system can detect whether a program or
erase operation is complete by using the device
sta-
tus bits:
RY/BY# pin, DQ7 (Data# Polling) and
DQ6/DQ2 (toggle bits). After a program or erase cycle
has been completed, the device automatically returns
to reading array data.
The
sector erase architecture
allows memory sec-
tors to be erased and reprogrammed without affecting
the data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardware data protection
measures include a low
V
CC
detector that automatically inhibits write opera-
tions during power transitions. The
hardware sector
protection
feature disables both program and erase
operations in any combination of the sectors of mem-
o r y. T h i s c a n b e a c h i e v e d i n - s y s t e m o r v i a
programming equipment.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the
automatic sleep mode.
The system can also place the device into the
standby mode.
Power consumption is greatly re-
duced in both modes.
Simultaneous Read/Write Operations with
Zero Latency
The Simultaneous Read/Write architecture provides
simultaneous operation
by dividing the memory
space into two banks. The device can improve overall
system performance by allowing a host system to pro-
gram or erase in one bank, then immediately and
simultaneously read from the other bank, with zero la-
tency. This releases the system from waiting for the
completion of program or erase operations.
The Am29DL32xG device family uses multiple bank
architectures to provide flexibility for different applica-
tions. Three devices are available with the following
bank sizes:
Device
DL322
DL323
DL324
Bank 1
4
8
16
Bank 2
28
24
16
The
Secured Silicon (SecSi) Sector
is an extra 256
byte sector capable of being permanently locked by
AMD or customers. The
SecSi Sector Indicator Bit
(DQ7) is permanently set to a 1 if the part is
factory
locked,
and set to a 0 if
customer lockable.
This
way, customer lockable parts can never be used to re-
place a factory locked part.
Factory locked parts provide several options. The
SecSi Sector may store a secure, random 16 byte
ESN (Electronic Serial Number). Customer Lockable
devices are one-time programmable and one-time
lockable.
2
Am42DL32x4G
May 19, 2003
P R E L I M I N A R Y
TABLE OF CONTENTS
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 5
MCP Block Diagram. . . . . . . . . . . . . . . . . . . . . . . . 5
Flash Memory Block Diagram. . . . . . . . . . . . . . . . 6
Connection Diagram . . . . . . . . . . . . . . . . . . . . . . . 7
Special Handling Instructions for FBGA Package .................... 7
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 9
Device Bus Operations . . . . . . . . . . . . . . . . . . . . 10
Table 2. Device Bus Operations—Flash Byte Mode, CIOf = V
SS
....12
Figure 6. Toggle Bit Algorithm........................................................ 34
DQ2: Toggle Bit II ................................................................... 35
Reading Toggle Bits DQ6/DQ2 ............................................... 35
DQ5: Exceeded Timing Limits ................................................ 35
DQ3: Sector Erase Timer ....................................................... 35
Table 18. Write Operation Status ................................................... 36
Requirements for Reading Array Data ................................... 13
Writing Commands/Command Sequences ............................ 13
Accelerated Program Operation ............................................. 13
Autoselect Functions .............................................................. 13
Simultaneous Read/Write Operations with Zero Latency ....... 13
Automatic Sleep Mode ........................................................... 14
RESET#: Hardware Reset Pin ............................................... 14
Output Disable Mode .............................................................. 14
Table 3. Device Bank Division ........................................................14
Table 4. Top Boot Sector Addresses .............................................15
Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . 37
Industrial (I) Devices ............................................................... 37
V
CC
f/V
CC
s Supply Voltage ....................................................... 37
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 38
CMOS Compatible .................................................................. 38
SRAM DC and Operating Characteristics. . . . . . 39
Zero-Power Flash ................................................................. 40
Figure 9. I
CC1
Current vs. Time (Showing Active and Automatic Sleep
Currents) ........................................................................................ 40
Figure 10. Typical I
CC1
vs. Frequency............................................ 40
Test Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Figure 11. Test Setup.................................................................... 41
Table 19. Test Specifications ......................................................... 41
Sector/Sector Block Protection and Unprotection .................. 19
Table 8. Top Boot Sector/Sector Block Addresses
for Protection/Unprotection .............................................................19
Table 9. Bottom Boot Sector/Sector Block Addresses
for Protection/Unprotection .............................................................20
Key To Switching Waveforms . . . . . . . . . . . . . . . 41
Figure 12. Input Waveforms and Measurement Levels ................. 41
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 42
SRAM CE#s Timing ................................................................ 42
Figure 13. Timing Diagram for Alternating Between SRAM to Flash ..
42
Write Protect (WP#) ................................................................ 20
Temporary Sector/Sector Block Unprotect ............................. 20
Figure 1. Temporary Sector Unprotect Operation........................... 21
Figure 1. In-System Sector/Sector Block Protect and Unprotect
Algorithms ....................................................................................... 22
Flash Read-Only Operations ................................................. 43
Figure 14. Read Operation Timings............................................... 43
Hardware Reset (RESET#) .................................................... 44
Figure 15. Reset Timings ............................................................... 44
SecSi (Secured Silicon) Sector Flash Memory Region .......... 23
Factory Locked: SecSi Sector Programmed and Protected At the
Factory .................................................................................... 23
Customer Lockable: SecSi Sector NOT Programmed or
Protected At the Factory ......................................................... 23
Figure 2. SecSi Sector Protect Verify.............................................. 23
Flash Word/Byte Configuration (CIOf) .................................... 45
Figure 16. CIOf Timings for Read Operations................................ 45
Figure 17. CIOf Timings for Write Operations................................ 45
Flash Erase and Program Operations .................................... 46
Figure 18. Program Operation Timings..........................................
Figure 19. Accelerated Program Timing Diagram..........................
Figure 20. Chip/Sector Erase Operation Timings ..........................
Figure 21. Back-to-back Read/Write Cycle Timings ......................
Figure 22. Data# Polling Timings (During Embedded Algorithms).
Figure 23. Toggle Bit Timings (During Embedded Algorithms)......
Figure 24. DQ2 vs. DQ6.................................................................
47
47
48
49
49
50
50
Hardware Data Protection ...................................................... 24
Low V
CC
Write Inhibit .............................................................. 24
Write Pulse “Glitch” Protection ............................................... 24
Logical Inhibit .......................................................................... 24
Power-Up Write Inhibit ............................................................ 24
Common Flash Memory Interface (CFI) . . . . . . . 24
Command Definitions . . . . . . . . . . . . . . . . . . . . . 27
Reading Array Data ................................................................ 27
Reset Command ..................................................................... 27
Autoselect Command Sequence ............................................ 27
Enter SecSi Sector/Exit SecSi Sector Command Sequence .. 28
Byte/Word Program Command Sequence ............................. 28
Unlock Bypass Command Sequence ..................................... 28
Figure 3. Program Operation .......................................................... 29
Temporary Sector/Sector Block Unprotect ............................. 51
Figure 25. Temporary Sector/Sector Block Unprotect
Timing Diagram.............................................................................. 51
Figure 26. Sector/Sector Block Protect and Unprotect
Timing Diagram.............................................................................. 52
Alternate CE#f Controlled Erase and Program Operations .... 53
Figure 27. Flash Alternate CE#f Controlled Write (Erase/Program)
Operation Timings.......................................................................... 54
SRAM Read Cycle .................................................................. 55
Figure 28. SRAM Read Cycle—Address Controlled...................... 55
Figure 29. SRAM Read Cycle ........................................................ 56
Chip Erase Command Sequence ........................................... 29
Sector Erase Command Sequence ........................................ 29
Erase Suspend/Erase Resume Commands ........................... 30
Figure 4. Erase Operation............................................................... 30
Table 15. Autoselect Device IDs (Word Mode) ...............................31
Table 17. Autoselect Device IDs (Byte Mode) ................................32
SRAM Write Cycle .................................................................. 57
Figure 30. SRAM Write Cycle—WE# Control ................................ 57
Figure 31. SRAM Write Cycle—CE1#s Control ............................. 58
Figure 32. SRAM Write Cycle—UB#s and LB#s Control............... 59
Write Operation Status . . . . . . . . . . . . . . . . . . . . 33
DQ7: Data# Polling ................................................................. 33
Figure 5. Data# Polling Algorithm ................................................... 33
DQ6: Toggle Bit I .................................................................... 34
May 19, 2003
Flash Latchup Characteristics. . . . . . . . . . . . . . .
Package Pin Capacitance . . . . . . . . . . . . . . . . . .
Flash Data Retention . . . . . . . . . . . . . . . . . . . . . .
SRAM Data Retention . . . . . . . . . . . . . . . . . . . . . .
60
60
60
61
Am42DL32x4G
3
P R E L I M I N A R Y
Figure 33. CE1#s Controlled Data Retention Mode........................ 61
Figure 34. CE2s Controlled Data Retention Mode.......................... 61
FLB073—73-Ball Fine-Pitch Grid Array 8 x 11.6 mm ............. 62
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 63
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 62
4
Am42DL32x4G
May 19, 2003
P R E L I M I N A R Y
PRODUCT SELECTOR GUIDE
Part Number
Standard Voltage
Speed
Range: V
CC
=
Options
2.7–3.3 V
Max Access Time (ns)
CE# Access (ns)
OE# Access (ns)
Flash Memory
71
70
70
30
70
70
70
30
85
85
85
40
71
55
55
25
Am42DL32x4G
SRAM
70
70
70
35
85
85
85
35
MCP BLOCK DIAGRAM
V
CC
f
A20 to A0
A20 to A0
A–1
WP#/ACC
RESET#
CE#f
CIOf
V
SS
RY/BY#
32 M Bit
Flash Memory
DQ15/A-1 to DQ0
DQ15/A-1 to DQ0
V
CC
s/V
CCQ
V
SS
/V
SSQ
A0 toto A0
A17 A19
LB#s
UB#s
WE#
OE#
CE1#s
CE2s
4 M Bit
Static RAM
DQ15/A-1 to DQ0
May 19, 2003
Am42DL32x4G
5
Embedded System
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