OptiMOS™3PowerMOSTransistorChip
IPC302N20N3
1Description
•N-channelenhancementmode
•Foradditionalcharacteristicandmaxratingsrefertothedatasheetof
IPP110N20N3G
•AQL0.65forvisualinspectionaccordingtofailurecatalogue
•ElectrostaticDischargeSensitiveDeviceaccordingtoMIL-STD883C
•Diebond:solderedorglued
•Backsidemetallization:NiVsystem
•Frontsidemetallization:AlCusystem
•Passivation:nitride(onlyonedgestructure)
PowerMOSTransistorChip
Table1KeyPerformanceParameters
Parameter
V
(BR)DSS
R
DS(on)
Die size
Thickness
Value
200
12
1)
6.7 x 4.5
250
Unit
V
mΩ
mm
2
µm
Gate
Drain
Source
Type/OrderingCode
IPC302N20N3
Package
Chip
Marking
not defined
RelatedLinks
-
2ElectricalCharacteristicsonWaferLevel
atT
j
=25°C,unlessotherwisespecified
Table2
Parameter
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
Gate-source leakage current
Drain-source on- resistance
Reverse diode forward on-voltage
Avalanche energy, single pulse
Symbol
V
(BR)DSS
V
GS(th)
I
DSS
I
GSS
R
DS(on)
V
SD
E
AS
Values
Min.
200
2
-
-
-
-
-
Typ.
-
3
0.1
1
9.2
2)
1.0
47
4)
Max.
-
4
1
100
100
3)
1.2
-
Unit
V
V
µA
nA
mΩ
V
mJ
Note/TestCondition
V
GS
=0V,I
D
=1mA
V
DS
=V
GS
,I
D
=260µA
V
GS
=0V,V
DS
=160V
V
GS
=20V,V
DS
=0V
V
GS
=10V,I
D
=2.0A
V
GS
=0V,I
F
=1A
I
D
=30 A, R
GS
=25
Ω
1)
2)
packaged in a P-TO220-3 (see ref. product)
typicalbaredieR
DS(on)
;V
GS
=10V
3)
limited by wafer test-equipment
4)
Wafer tested. For general avalanche capability refer to the datasheet of IPP110N20N3 G
Final Data Sheet
2
Rev.2.6,2015-04-08
OptiMOS™3PowerMOSTransistorChip
IPC302N20N3
RevisionHistory
IPC302N20N3
Revision:2015-04-08,Rev.2.6
Previous Revision
Revision
2.6
Date
-
Subjects (major changes since last revision)
Release Final Version
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respecttoanyexamplesorhintsgivenherein,anytypicalvaluesstatedhereinand/oranyinformationregardingtheapplication
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failureofsuchcomponentscanreasonablybeexpectedtocausethefailureofthatlife-support,automotive,aviationand
aerospacedeviceorsystemortoaffectthesafetyoreffectivenessofthatdeviceorsystem.Lifesupportdevicesorsystemsare
intendedtobeimplantedinthehumanbodyortosupportand/ormaintainandsustainand/orprotecthumanlife.Iftheyfail,itis
reasonabletoassumethatthehealthoftheuserorotherpersonsmaybeendangered.
Final Data Sheet
4
Rev.2.6,2015-04-08