SMD AEC-Q200 Compliant Thick Film Chip Resistor
Type CRGCQ Series
Key Features
Small size and
light weight
Suitable for
both wave and
reflow
soldering
techniques
Supplied on
tape
AEC-Q200
Compliant
7 different
package sizes
Terminal finish
matte Sn over
Ni
TE Connectivity is pleased to introduce our AEC-Q200 compliant thick film Chip
resistor, suitable for auto placement in volume and for most applications.
Available in seven different packages and supplied on tape and reel for
automatic insertion processes. Standard values
–
E24 Series
Characteristics
–
Electrical
Type
Power Rating @ 70°C
Jumper Rated current
Max. Jumper Current
Max. Working Voltage
Max. Overload Voltage
Dielectric Withstand V.
Jumper resistance
Temperature Range
Ambient Temperature
CRGCQ0402
0.0625W
1A
2A
50V
100V
100V
CRGCQ0603 CRGCQ0805
0.1W
0.125W
1A
2A
2A
5A
75V
150V
150V
300V
300V
500V
<50mΩ
-55°C ~ +155°C
70°C
CRGCQ1206
0.25W
2A
10A
200V
400V
500V
Type
Power Rating @ 70°C
Jumper Rated current
Max. Jumper Current
Max. Working Voltage
Max. Overload Voltage
Dielectric Withstand V.
Jumper resistance
Temperature Range
Ambient Temperature
CRGCQ1210
0.5W
2A
10A
200V
500V
500V
CRGCQ2010
CRGCQ2512
0.75W
1W
2A
2A
10A
10A
200V
200V
500V
500V
500V
500V
<50mΩ
-55°C ~ +155°C
70°C
1773204-3 CIS WR 03/2018
Dimensions in
millimetres unless
otherwise specified
Dimensions Shown for
reference purposes only.
Specifications subject to
change
For Email, phone or live chat,
go to: www.te.com/help
SMD AEC-Q200 Compliant Thick Film Chip Resistor
Power derating curve
Power rating based on continuous load operation in ambient temperature of
70°C. For resistors operated in ambient temperatures above 70°C, power
rating must be derated in accordance with this curve.
Dimensions:
Type
CRGCQ0402
CRGCQ0603
CRGCQ0805
CRGCQ1206
CRGCQ1210
CRGCQ2010
CRGCQ2512
L
1.00±0.10
1.60±0.10
2.00±0.15
3.10±0.15
3.10±0.10
5.00±0.10
6.35±0.10
Dimension (mm)
W
H
A
0.50±0.05
0.35±0.05
0.20±0.10
0.80±0.10
0.45±0.10
0.30±0.20
1.25+0.15
0.55±0.10
0.40±0.20
-0.10
1.55+0.15
0.55±0.10
0.45±0.20
-0.10
2.60±0.20
0.55±0.10
0.50±0.25
2.50±0.20
0.55±0.10
0.60±0.25
3.20±0.20
0.55±0.10
0.60±0.25
B
0.25±0.10
0.30±0.20
0.40±0.20
0.45±0.20
0.50±0.20
0.50±0.20
0.50±0.20
1773204-3 CIS WR 03/2018
Dimensions in
millimetres unless
otherwise specified
Dimensions Shown for
reference purposes only.
Specifications subject to
change
For Email, phone or live chat,
go to: www.te.com/help
SMD AEC-Q200 Compliant Thick Film Chip Resistor
Marking:
E24 series 0603
–
2512 3 Digits
–
first two digits denote significant figures of
resistance and third digit denotes number of zeros thereafter. EG
222
=
2K2
Marking for E96 Series 0805
–
2512 4 digits
–
First three digits denote significant
figures of resistance and fourth digit denotes number of zeros thereafter. EG.
1000
For oh i
alues elo
=
100R
R letter R de otes de i al poi t. EG
1R80
0402 size chips are not marked
0603 E96 3 digit marking.
=
R8 / .8Ω
1773204-3 CIS WR 03/2018
Dimensions in
millimetres unless
otherwise specified
Dimensions Shown for
reference purposes only.
Specifications subject to
change
For Email, phone or live chat,
go to: www.te.com/help
SMD AEC-Q200 Compliant Thick Film Chip Resistor
Marking for E96 series 0603 size with no marking code marked as
per E24 values.
Performance Specification
Characteristics
Limits
± %: ± . %+ . Ω Max.
±5%:
± . %+ . Ω Max.
Ω≤ R ≤ Ω:
±400PPM/°C
Ω<R≤
Ω:
±200PPM/°C
R>
Ω:
±100PPM/°C
± %: ± . %+ . Ω
Max
±5%: ± . %+ . Ω
Max
± . %+ . 5Ω
Max
95% coverage Min.
± . %+ . 5Ω Max
%: ±
5%: ±
.5%+ . Ω Max.
. %+ . Ω Max.
Test Methods
125°C, 35% power, at RCWV or Max.
Working Voltage whichever less,1,000
hours
.5 hours ON , .5hours OFF ,
Measurement at 24±2 hours after test
conclusion.
(MIL-STD-202 Method 108)
Measure between -55°C ~+125°C
Load life
Temperature
coefficient
Short-time
overload
Terminal
Bending
Solderability
Soldering heat
Moisture
Resistance
Biased Humidity
%: ±
5%: ±
. %+ . Ω Max.
. %+ . Ω Max.
Dielectric
Withstand
Voltage
No evidence of flashover,
mechanical damage,
arcing or insulation
breakdown
Temperature
cycling
%: ±
5%: ±
.5%+ . Ω Max.
. %+ . Ω Max
ESD
± . %+ . 5Ω Max
Sulfuration test
%: ± . %+ . Ω Max.
5%: ± 5. %+ . Ω Max.
2.5x Rated voltage or Max. Overload
Voltage whichever is lower for 5
seconds, then check the resistance.
Bending Distance 3mm, Duration:
60s±5s,
then check the resistance
245±3°C; 2~3s
260±5°C; 10±1s
25°C~65°C,90~100%RH, 2.5Hr; 65°C
90~100%RH, 3Hr; 65°C~25°C
80~100%RH, 2.5Hr, 10 cycles,
Measurement at 24 hours
after test conclusion
(MIL-STD-202 Method 106)
10% rated power, 85℃/85%RH, 1000Hr.
Measurement at 24 hours after test
conclusion.
(MIL-STD-202 Method 103)
Resistor shall be clamped in the trough
of 90° metallic V-block and shall be
tested at AC potential respectively
specified in the given list of each
product type for 60~70s.
-55±3°C 30min ~normal temperature
10min-15min~155±2°C 30min~normal
temperature 10min-15min1000 cycles.
Measurement at 24 hours after test
conclusion.
(JESD22 Method JA-104)
With the electrometer in direct contact
with the discharge tip, verify the voltage
setting at levels of ±500V, ±1KV, ±2KV,
±4KV, ±8KV,
The electrometer reading shall be
within ±10% for voltages from 500V to
≦800V.
(AEC-Q200-002)
H2S 3~5PPM 50°C±2°C 91%~93% RH
1000H
1773204-3 CIS WR 03/2018
Dimensions in
millimetres unless
otherwise specified
Dimensions Shown for
reference purposes only.
Specifications subject to
change
For Email, phone or live chat,
go to: www.te.com/help
Embedded System
京公网安备 11010802033920号
EEWORLD
