The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 6:
Either voltage limit or current limit is sufficient to protect inputs.
Note 7:
ESD testing conforms to MIL-STD-883, Method 3015.
≥
2000V
Commercial Version
TTL-to-ECL DC Electrical Characteristics
(Note 8)
V
EE
= −
4.2V to
−
5.7V, V
CC
=
V
CCA
=
GND, T
C
=
0
°
C to
+
85
°
C, V
TTL
= +4.5V
to
+5.5V
Symbol
Parameter
Min
Typ
Max
Units
V
OH
V
OL
Output HIGH Voltage
Output LOW Voltage
Cutoff Voltage
−2000
V
OHC
V
OLC
V
IH
V
IL
I
IH
I
IL
V
FCD
I
EE
Output HIGH Voltage
Corner Point HIGH
Output LOW Voltage
Corner Point LOW
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Breakdown Test
Input LOW Current
Input Clamp Diode Voltage
V
EE
Supply Current
−159
−169
−75
−75
mA
−700
−1.2
2.0
0
−1950
mV
−1025
−1830
−955
−1705
−870
−1620
mV
mV
Conditions
V
IN
=
V
IH(Max)
or V
IL(Min)
Loading with 50Ω to
−
2V
OE or DIR LOW,
V
IN
=
V
IH(Max)
or V
IL(Min)
,
Loading with 50Ω to
−2V
−1035
−1610
5.0
0.8
70
1.0
mV
mV
V
V
µA
mA
µA
V
V
IN
=
V
IH(Min)
or V
IL(Max)
Loading with 50Ω to
−2V
Over V
TTL
, V
EE
, T
C
Range
Over V
TTL
, V
EE
, T
C
Range
V
IN
= +2.7V
V
IN
= +5.5V
V
IN
= +0.5V
I
IN
= −18
mA
LE LOW, OE and DIR HIGH
Inputs OPEN
V
EE
= −4.2V
to
−4.8V
V
EE
= −4.2V
to
−5.7V
Note 8:
The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
3
www.fairchildsemi.com
100328
Commercial Version
(Continued)
ECL-to-TTL DC Electrical Characteristics
(Note 9)
V
EE
= −
4.2V to
−
5.7V, V
CC
=
V
CCA
=
GND, T
C
=
0
°
C to
+
85
°
C, C
L
=
50 pF, V
TTL
= +4.5V
to
+5.5V
Symbol
Parameter
Min
Typ
Max
Units
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
I
OZHT
I
OZLT
I
OS
I
TTL
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Input LOW Current
3-STATE Current Output HIGH
3-STATE Current Output LOW
Output Short-Circuit Current
V
TTL
Supply Current
−700
−150
−60
74
49
67
0.50
70
−1165
−1830
2.7
2.4
3.1
2.9
0.3
0.5
−870
−1475
350
V
V
mV
mV
µA
µA
µA
µA
mA
mA
mA
mA
Conditions
I
OH
= −3
mA, V
TTL
=
4.75V
I
OH
= −3
mA, V
TTL
=
4.50V
I
OL
=
24 mA, V
TTL
=
4.50V
Guaranteed HIGH Signal for All Inputs
Guaranteed LOW Signal for All Inputs
V
IN
=
V
IH
(Max)
V
IN
=
V
IL
(Min)
V
OUT
= +2.7V
V
OUT
= +0.5V
V
OUT
=
0.0V, V
TTL
= +5.5V
TTL Outputs LOW
TTL Outputs HIGH
TTL Outputs in 3-STATE
DIP TTL-to-ECL AC Electrical Characteristics
(Note 9)
V
EE
= −
4.2V to
−
5.7V, V
TTL
= +
4.5V to
+
5.5V, V
CC
=
V
CCA
=
GND
T
C
=
0°C
T
C
=
25°C
Symbol
Parameter
Min
Max
Min
Max
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PHZ
t
PHZ
t
SET
t
HOLD
t
PW
(H)
t
TLH
t
THL
OE to E
n
(Cutoff to HIGH)
OE to E
n
(HIGH to Cutoff)
DIR to E
n
(HIGH to Cutoff)
T
n
to LE
T
n
to LE
Pulse Width LE
Transition Time
20% to 80%, 80% to 20%
T
N
to E
n
(Transparent)
LE to E
n
1.1
1.7
1.3
1.5
1.6
1.1
1.1
2.1
0.6
1.6
3.5
3.6
4.2
4.5
4.3
1.1
1.7
1.5
1.6
1.6
1.1
1.1
2.1
0.6
1.6
3.6
3.7
4.4
4.5
4.3
T
C
=
85°C
Min
1.1
1.9
1.7
1.6
1.7
1.1
1.1
2.1
0.6
1.6
Max
3.8
3.9
4.8
4.6
4.5
ns
ns
ns
ns
ns
ns
ns
ns
ns
Figures 1, 2
Figures 1, 2
Figures 1, 2
Figures 1, 2
Figures 1, 2
Figures 1, 2
Figures 1, 2
Figures 1, 2
Figures 1, 2
Units
Conditions
Note 9:
The specified limits represent the “worst” case value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
www.fairchildsemi.com
4
100328
Commercial Version
(Continued)
DIP ECL-to-TTL AC Electrical Characteristics
V
EE
= −
4.2V to
−
5.7V, V
TTL
= +
4.5V to
+
5.5V, V
CC
=
V
CCA
=
GND, C
L
=
50 pF
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PHZ
t
PLZ
t
SET
t
HOLD
t
PW
(H)
OE to T
n
(Enable Time)
OE to T
n
(Disable Time)
DIR to T
n
(Disable Time)
E
n
to LE
E
n
to LE
Pulse Width LE
3.4
3.8
3.2
3.0
2.7
2.8
1.1
2.1
4.1
8.45
9.2
8.95
7.7
8.2
7.45
3.7
4.0
3.3
3.4
2.8
3.1
1.1
2.1
4.1
8.95
9.2
8.95
8.7
8.7
7.95
4.0
4.3
3.5
4.1
3.1
4.0
1.1
2.6
4.1
9.7
9.95
9.2
9.95
8.95
9.2
ns
ns
ns
ns
ns
ns
Figures 3, 5
Figures 3, 5
Figures 3, 6
Figures 3, 6
Figures 3, 4
Figures 3, 7
E
n
to T
n
(Transparent)
LE to T
n
3.1
7.2
3.1
7.2
3.3
7.7
ns
Figures 3, 4
Parameter
T
C
=
0°C
Min
2.3
Max
5.6
T
C
=
25°C
Min
2.4
Max
5.6
T
C
=
85°C
Min
2.6
Max
5.9
ns
Figures 3, 4
Units
Conditions
SOIC and PLCC TTL-to-ECL AC Electrical Characteristics
V
EE
= −
4.2V to
−
5.7V, V
TTL
= +4.5V
to
+5.5V
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PHZ
t
PHZ
t
SET
t
HOLD
t
PW
(H)
t
TLH
t
THL
t
OSHL
OE to E
n
(Cutoff to HIGH)
OE to E
n
(HIGH to Cutoff)
DIR to E
n
(HIGH to Cutoff)
T
n
to LE
T
n
to LE
Pulse Width LE
Transition Time
20% to 80%, 80% to 20%
Maximum Skew Common Edge
Output-to-Output Variation
Data to Output Path
t
OSLH
Maximum Skew Common Edge
Output-to-Output Variation
Data to Output Path
t
OST
Maximum Skew Opposite Edge
Output-to-Output Variation
Data to Output Path
t
PS
Maximum Skew
Pin (Signal) Transition Variation
Data to Output Path
Note 10:
Output-to-Output Skew is defined as the absolute value of the difference between the actual propagation delay for any outputs within the same
packaged device. The specifications apply to any outputs switching in the same direction either HIGH-to-LOW (t
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