................................................................................................................... -0.6V to 6.5V
Storage temperature ............................................................................................................................... -65°C to +150°C
Ambient temperature under bias...............................................................................................................-40°C to +85°C
ESD protection on all pins........................................................................................................................................ >4 kV
† NOTICE:
Stresses above those listed under ‘Maximum ratings’ may cause permanent damage to the device. This
is a stress rating only and functional operation of the device at those or any other conditions above those indicated in
the operational listings of this specification is not implied. Exposure to maximum rating conditions for an extended
period of time may affect device reliability.
TABLE 1-1:
DC CHARACTERISTICS
Electrical Characteristics:
Industrial (I):
V
CC
= 1.6V to 5.5V
Characteristic
High-Level Input Voltage
Low-Level Input Voltage
Low-Level Output Voltage
Input Leakage Current
Output Leakage Current
Internal Capacitance
(all inputs and outputs)
Min.
V
CC X
0.7
-0.6
—
—
—
—
—
—
—
—
—
—
Max.
V
CC
+ 0.5
V
CC X
0.3
0.4
0.2
±1
±1
7
0.3
1
1
0.5
1.0
Units
V
V
V
V
µA
µA
pF
mA
mA
mA
µA
µA
I
OL
= 2.1 mA, V
CC
= 3.0V
I
OL
= 0.15 mA, V
CC
= 1.8V
V
IN
= V
SS
or V
CC
V
OUT
= V
SS
or V
CC
T
AMB
= +25°C, F
CLK
= 1 MHz,
V
CC
= 5.5V
(Note
1)
V
CC
= 1.8V, F
CLK
= 400 kHz
V
CC
= 5.5V, F
CLK
= 1 MHz
V
CC
= 5.5V, F
CLK
= 1 MHz
SCL = SDA = V
CC
= 1.8V
SCL = SDA = V
CC
= 5.5V
T
A
= -40°C to +85°C
Test Conditions
DC CHARACTERISTICS
Param.
Symbol
No.
D1
D2
D3
D4
D5
D6
D7
D8
D9
Note 1:
V
IH
V
IL
V
OL
I
LI
I
LO
C
INT
I
CCREAD
Operating Current
I
CCWRITE
Operating Current
I
CCS
Standby Current
This parameter is not tested, but is ensured by characterization.
2018 Microchip Technology Inc.
DS20005772B-page 4
24CW16X/24CW32X/24CW64X/24CW128X
TABLE 1-2:
AC CHARACTERISTICS
Electrical Characteristics:
Industrial (I):
V
CC
= 1.6V to 5.5V
Characteristic
Clock Frequency
Clock High Time
Clock Low Time
SDA and SCL Rise Time
SDA and SCL Fall Time
Min.
—
260
500
—
—
260
260
0
50
260
—
500
Max.
1000
—
—
1000
300
—
—
—
—
—
450
—
Units
kHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
T
A
= -40°C to +85°C:
Conditions
1.6V
≤
V
CC
≤
5.5V
1.6V
≤
V
CC
≤
5.5V
1.6V
≤
V
CC
≤
5.5V
1.6V
≤
V
CC
≤
5.5V
(Note
1)
1.6V
≤
V
CC
≤
5.5V
(Note
1)
1.6V
≤
V
CC
≤
5.5V
1.6V
≤
V
CC
≤
5.5V
(Note
2)
1.6V
≤
V
CC
≤
5.5V
1.6V
≤
V
CC
≤
5.5V
1.6V
≤
V
CC
≤
5.5V
1.6V
≤
V
CC
≤
5.5V
AC CHARACTERISTICS
Param.
Symbol
No.
1
2
3
4
5
6
7
8
9
10
11
12
F
CLK
T
HIGH
T
LOW
T
R
T
F
T
HD
:
STA
Start Condition Hold Time
T
SU
:
STA
Start Condition Setup Time
T
HD
:
DAT
Data Input Hold Time
T
SU
:
DAT
Data Input Setup Time
T
SU
:
STO
Stop Condition Setup Time
T
AA
T
BUF
Output Valid from Clock
Bus Free Time: Bus Time
must be Free before a New
Transmission can Start
Input Filter Spike Suppression
(SDA and SCL pins)
Write Cycle Time
(byte or page)
13
14
Note 1:
2:
3:
T
SP
T
WC
—
—
50
5
ns
ms
(Note
3)
The rise/fall times must be less than the specified maximums in order to achieve the maximum clock
frequencies specified for F
CLK
. Please refer to the I
2
C specification for applicable timings.
As a transmitter, the device must provide an internal minimum delay time to bridge the undefined region of
the falling edge of SCL to avoid unintended generation of Start or Stop conditions.
Not 100% tested. C
B
= total capacitance of one bus line in pF.
FIGURE 1-1:
BUS TIMING DATA
5
2
D4
4
SCL
7
6
3
8
9
10
SDA
In
13
11
12
SDA
Out
TABLE 1-3:
EEPROM CELL PERFORMANCE CHARACTERISTICS
Test Condition
T
A
= 25°C, 1.6V
V
CC
5.5V
T
A
= 55°C
Min.
1,000,000
200
Max.
—
—
Years
Units
Write Cycles
Operation
Write Endurance
(1)
Data
Retention
(1)
Note 1:
Performance is determined through characterization and the qualification process.
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