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2SC2229-Y(SHP,F,M)

Description
TRANS NPN 50MA 150V TO226-3
Categorysemiconductor    Discrete semiconductor   
File Size139KB,5 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Environmental Compliance
Download Datasheet Parametric View All

2SC2229-Y(SHP,F,M) Overview

TRANS NPN 50MA 150V TO226-3

2SC2229-Y(SHP,F,M) Parametric

Parameter NameAttribute value
Transistor typeNPN
Current - Collector (Ic) (Maximum)50mA
Voltage - collector-emitter breakdown (maximum)150V
Vce saturation value (maximum value) when different Ib,Ic500mV @ 1mA,10mA
Current - collector cutoff (maximum)100nA(ICBO)
DC current gain (hFE) at different Ic, Vce (minimum value)70 @ 10mA,5V
Power - Max800mW
Frequency - Transition120MHz
Operating temperature150°C(TJ)
Installation typeThrough hole
Package/casingTO-226-3, TO-92-3 long body
Supplier device packagingTO-92MOD
2SC2229
TOSHIBA Transistor
Silicon NPN Triple Diffused Type (PCT Process)
2SC2229
Black and White TV Video Output Applications
High-Voltage Switching Applications
Driver Stage Audio Amplifier Applications
Unit: mm
High breakdown voltage: V
CEO
= 150 V (min)
Low output capacitance: C
ob
= 5.0 pF (max)
High transition frequency: f
T
= 120 MHz (typ.)
Absolute Maximum Ratings
(Ta = 25°C)
Characteristics
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
Collector power dissipation
Junction temperature
Storage temperature range
Symbol
V
CBO
V
CEO
V
EBO
I
C
I
B
P
C
T
j
T
stg
Rating
200
150
5
50
20
800
150
−55
to 150
Unit
V
V
V
mA
mA
mW
°C
°C
JEDEC
JEITA
TOSHIBA
TO-92MOD
2-5J1A
Weight: 0.36 g (typ.)
Note1: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in temperature, etc.) may cause this product to
decrease in the reliability significantly even if the operating conditions (i.e. operating
temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
1
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