MCP39F511A
AC/DC Dual-Mode Power-Monitoring IC
with Calculation and Energy Accumulation
Features
• Real-Time Measurement of Input Power for AC or
DC Supplies
• AC/DC Dual-Mode Power Monitoring Accuracy
Capable of 0.1% Error Across 4000:1 Dynamic
Range
• Automatic Sensing and Switching Between AC
and DC Modes
• Built-In Calculations on Fast 16-Bit Processing
Core
- Active and Reactive Energy Accumulation
- Active, Reactive, Apparent Power
- True RMS Current, RMS Voltage
- Line Frequency, Power Factor
• 64-bit Wide Import and Export Active Energy
Accumulation Registers
• 64-bit Four Quadrant Reactive Energy
Accumulation Registers
• Automatic Saving the Energy Accumulation
Registers into EEPROM at Power Off
• Automatic Loading the Energy Accumulation
Registers from EEPROM at Power On
• Signed Active and Reactive Power Outputs
• Dedicated Zero Crossing Detection (ZCD) Pin
Output with Less than 200 µs Latency
• Dedicated PWM Output Pin with Programmable
Frequency and Duty Cycle
• Automatic Event Pin Control through Fast Voltage
Sag/Surge Detection
• Two Wire Serial Protocol with Selectable Baud
Rate Up to 115.2 kbps using Universal
Asynchronous Receiver/Transmitter (UART)
• Four Independent Registers for Minimum and
Maximum Output Quantity Tracking
• Fast Calibration Routines and Simplified
Command Protocol
• 512 Bytes User-Accessible EEPROM through
Page Read/Write Commands
• Low-Drift Internal Voltage Reference, 7 ppm/°C
Typical
• 28-lead 5x5 QFN Package
• Extended Temperature Range -40°C to +125°C
Applications
• Power Monitoring and Management for Smart
Home/City
• Industrial Lighting Power Monitoring
• Power Measurement for Renewable Energy Sys-
tem
• Intelligent Power Distribution Units
• Server Power Monitor
Description
The MCP39F511A device is a highly-integrated,
complete single-phase power-monitoring IC designed
for real-time measurement of input power for AC or DC
power supplies, making it suitable for a wide range of
consumer and industrial applications. It is capable of
detecting the input voltage in order to work as DC or AC
mode. It includes dual-channel Delta-Sigma ADCs, a
16-bit calculation engine, EEPROM and a flexible
2-wire interface. Separate AC and DC calibration
registers are provided, to ensure high-accuracy
measurements in both modes. An integrated low-drift
voltage reference with 7 ppm/°C in addition to 94.5 dB
of SINAD performance on each measurement channel
allows for better than 0.1% accurate designs across a
4000:1 dynamic range.
Package Types
MCP39F511A
5x5 QFN*
REFIN+/OUT
COMMON
B
MCLR
D
GND
DV
DD
D
GND
28 27 26 25 24 23 22
EVENT1 1
NC 2
NC 3
UART_RX 4
COMMON
A
5
OSCI 6
OSCO 7
8
NC
9 10 11 12 13 14
UART_TX
RESET
AV
DD
NC
PWM
EP
29
21 A
GND
20 AN_IN
19 V1+
18 V1-
17 I1-
16 I1+
15 EVENT2
*Includes Exposed Thermal Pad (EP);
see
Table 3-1.
2018 Microchip Technology Inc.
DR
DS20006044A-page 1
ZCD
MCP39F511A
Functional Block Diagram
OSCI
OSCO
Timing
Generation
Internal
Oscillator
SINC
3
Digital Filter
UART
Serial
Interface
16-BIT
CORE
FLASH
UART_TX
UART_RX
AV
DD
A
GND
DV
DD
D
GND
I1+
I1-
+
PGA
-
24-bit Delta-Sigma
Multi-level
Modulator ADC
PWM
V1+
V1-
+
PGA
-
24-bit Delta-Sigma
Multi-level
Modulator ADC
SINC
3
Digital Filter
EVENT1
Calculation
Engine
(CE)
EVENT2
Digital Outputs
ZCD
AN_IN
10-bit SAR
ADC
DS20006044A-page 2
2018 Microchip Technology Inc.
MCP39F511A
MCP39F511A Typical Application – Single Phase, Two-Wire Application Schematic
10
LOAD
+3.3V
0.1 µF
1 µF
0.1 µF
1 k
+
2
m
-
1 k
I1-
33 nF
1 k
V1-
33 nF
499 k
499 k
V1+
1 k
I1+
33 nF
AV
DD
DV
DD
RESET
REFIN/OUT+
0.1 µF
+3.3V
to MCU UART
UART_TX
UART_RX
MCP39F511A
to MCU UART
(OPTIONAL)
33 nF
NC
NC
NC
NC
DR
COMMON
A,B
AN_IN
OSCO
OSCI
D
GND
A
GND
EVENT1
EVENT2
N.C.
Leave Floating
Connect on PCB
+3.3V
MCP9700A
ZCD
PWM
4 MHz
22 pF
22 pF
(OPTIONAL)
0.47
µ F
470
MCP1754
+3.3V
0.01 µF
L
N
D
GND
470 µF
A
GND
Note 1:
The MCP39F511A demonstration board uses a switching power supply, however a low-cost
capacitive-based supply, as shown here, is sufficient for many applications.
2:
The external sensing components shown here, a 2 m shunt, two 499 k and 1 k resistors for the
1000:1 voltage divider, are specifically chosen to match the default values for the calibration registers
defined in
Section 6.0 “Register Descriptions”.
By choosing low-tolerance components of these
values (for instance 1% tolerance), measurement accuracy in the 2-3% range can be achieved with
zero calibration (AC only, offset calibration may be needed in DC mode). See
Section 9.0
“MCP39F511A Calibration”
for more information.
2018 Microchip Technology Inc.
DS20006044A-page 3
MCP39F511A
1.0
ELECTRICAL
CHARACTERISTICS
† Notice:
Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at those or any other conditions above those
indicated in the operation listings of this specification is
not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
Absolute Maximum Ratings †
DV
DD
.................................................................. -0.3 to +4.5V
AV
DD
.................................................................. -0.3 to +4.0V
Digital inputs and outputs w.r.t. A
GND
............... -0.3V to +4.0V
Analog Inputs (I+,I-,V+,V-) w.r.t. A
GND
............... ....-2V to +2V
V
REF
input w.r.t. A
GND
........................ ....-0.6V to AV
DD
+0.6V
Maximum Current out of D
GND
pin..............................300 mA
Maximum Current into DV
DD
pin.................................250 mA
Maximum Output Current Sunk by Digital IO ................25 mA
Maximum Current Sourced by Digital IO.......................25 mA
Storage temperature .....................................-65°C to +150°C
Ambient temperature with power applied......-40°C to +125°C
Soldering temperature of leads (10 seconds) ............. +300°C
ESD on the analog inputs (HBM,MM) .................4.0 kV, 200V
ESD on all other pins (HBM,MM) ........................4.0 kV, 200V
1.1
Specifications
ELECTRICAL CHARACTERISTICS
TABLE 1-1:
Electrical Specifications:
Unless otherwise indicated, all parameters apply at AV
DD,
DV
DD
= +2.7 to +3.6V, T
A
= -40°C to +125°C,
MCLK = 4 MHz, PGA GAIN = 1.
Characteristic
Power Measurement
Active Power
(Note
1)
Reactive Power
(Note
1)
Apparent Power
(Note
1)
Current RMS
(Note
1)
Voltage RMS
(Note
1)
Sym.
P
Q
S
I
RMS
V
RMS
Min.
—
—
—
—
—
Typ.
±0.1
±0.1
±0.1
±0.1
±0.1
Max.
—
—
—
—
—
Units
%
%
%
%
%
Test Conditions
4000:1 Dynamic range on
current channel
(Note
2)
4000:1 Dynamic range on
current channel
(Note
2)
4000:1 Dynamic range on
current channel
(Note
2)
4000:1 Dynamic range on
current channel
(Note
2)
4000:1 (DC mode),
20:1 (AC mode) Dynamic
range on voltage channel
(Note
2, 8)
Power Factor
(Note
1)
Line Frequency
(Note
1)
Auto-Calibration Time
Note 1:
2:
3:
4:
5:
6:
7:
8:
LF
t
CAL
—
—
—
±0.1
±0.1
2
N
x (1/f
LINE
)
—
—
—
%
%
ms
Note 3
Calibration, Calculation and Event Detection Times
Calculated from reading the register values with no averaging, single computation cycle with accumulation interval of 4
line cycles.
Specification by design and characterization; not production tested.
N = Value in the Accumulation Interval Parameter register. The default value of this register is 2 or T
CAL
= 80 ms for
50 Hz line.
Applies to Voltage Sag and Voltage Surge events only.
Applies to all gains. Offset and gain errors depend on the PGA gain setting. See
Section 2.0 “Typical Performance
Curves”
for typical performance.
V
IN
= 1.2 V
PP
= 424 mV
RMS
@ 50/60 Hz. This parameter is established by characterization and is not 100% tested.
Variation applies to internal clock and UART only. All calculated output quantities can be temperature compensated to
the performance listed in the respective specification.
The internal ADC clock frequency is affected by the amplitude of the AC signal applied on the voltage channel,
decreasing the overall accuracy if the amplitude is low. In DC mode, the internal ADC clock frequency is constant.
DS20006044A-page 4
2018 Microchip Technology Inc.
MCP39F511A
TABLE 1-1:
ELECTRICAL CHARACTERISTICS (CONTINUED)
Electrical Specifications:
Unless otherwise indicated, all parameters apply at AV
DD,
DV
DD
= +2.7 to +3.6V, T
A
= -40°C to +125°C,
MCLK = 4 MHz, PGA GAIN = 1.
Characteristic
Minimum Time
for Voltage Surge/Sag
Detection
Analog Input
Absolute Voltage
Analog Input
Leakage Current
Differential Input
Voltage Range
Offset Error
Offset Error Drift
Gain Error
Gain Error Drift
Differential Input
Impedance
Sym.
t
AC_SASU
Min.
—
Typ.
5, see
Section 7.2
Max.
—
Units
ms
Test Conditions
Note 4
24-Bit Delta-Sigma ADC Performance
V
IN
A
IN
(I1+ – I1-),
(V1+ – V1-)
V
OS
GE
Z
IN
-1
—
-600/GAIN
-1
—
-4
—
232
142
72
38
36
33
Signal-to-Noise
and Distortion Ratio
Total Harmonic Distortion
Signal-to-Noise Ratio
Spurious Free
Dynamic Range
Crosstalk
AC Power
Supply Rejection Ratio
DC Power
Supply Rejection Ratio
DC Common
Mode Rejection Ratio
Resolution
Note 1:
2:
3:
4:
5:
6:
7:
8:
—
1
—
—
0.5
—
1
—
—
—
—
—
—
94.5
-106.5
95
111
-122
-73
+1
—
+600/GAIN
+1
—
+4
—
—
—
—
—
—
—
—
-103
—
—
—
—
V
nA
mV
mV
V/°C
%
ppm/°C
k
k
k
k
k
k
dB
dBc
dB
dB
dB
dB
AV
DD
and
DV
DD
= 3.3V + 0.6V
PP
,
100 Hz, 120 Hz, 1 kHz
AV
DD
and DV
DD
= 3.0 to
3.6V
V
CM
varies
from -1V to +1V
G=1
G=2
G=4
G=8
G = 16
G = 32
Note 6
Note 6
Note 6
Note 6
Note 5
V
REF
= 1.2V,
proportional to V
REF
SINAD
THD
SNR
SFDR
CTALK
AC PSRR
92
—
92
—
—
—
DC PSRR
DC CMRR
—
—
-73
-105
—
—
dB
dB
10-Bit SAR ADC Performance for Temperature Measurement
N
R
—
10
—
bits
Calculated from reading the register values with no averaging, single computation cycle with accumulation interval of 4
line cycles.
Specification by design and characterization; not production tested.
N = Value in the Accumulation Interval Parameter register. The default value of this register is 2 or T
CAL
= 80 ms for
50 Hz line.
Applies to Voltage Sag and Voltage Surge events only.
Applies to all gains. Offset and gain errors depend on the PGA gain setting. See
Section 2.0 “Typical Performance
Curves”
for typical performance.
V
IN
= 1.2 V
PP
= 424 mV
RMS
@ 50/60 Hz. This parameter is established by characterization and is not 100% tested.
Variation applies to internal clock and UART only. All calculated output quantities can be temperature compensated to
the performance listed in the respective specification.
The internal ADC clock frequency is affected by the amplitude of the AC signal applied on the voltage channel,
decreasing the overall accuracy if the amplitude is low. In DC mode, the internal ADC clock frequency is constant.
2018 Microchip Technology Inc.
DS20006044A-page 5
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