128GB (x72, ECC, 3DS 4H Stack, 2 Package Ranks x 4 Logic
Ranks) 288-Pin DDR4 LRDIMM
Features
DDR4 3DS SDRAM LRDIMM
MTA144ASQ16G72LSZ – 128GB
Features
• DDR4 functionality and operations supported as
defined in the component data sheet
• 288-pin, command/address/control registered, data
buffered, load-reduced dual in-line memory module
(LRDIMM)
• Fast data transfer rates: PC4-3200, PC4-2933, or
PC4-2666
• 128GB (16 Gig x 72)
• V
DD
= 1.20V (NOM)
• V
PP
= 2.5V (NOM)
• V
DDSPD
= 2.5V (NOM)
• Supports ECC error detection and correction
• Nominal and dynamic on-die termination (ODT) for
data, strobe, and mask signals
• Low-power auto self refresh (LPASR)
• On-die internal, adjustable, V
REFDQ
generation
• 2 package ranks x 4 logic ranks
• On-board I
2
C temperature sensor with integrated
serial presence-detect (SPD) EEPROM
• 32Gb, 3DS 4-high die stack x4 package, Master/Slave
control logic. Each die with 16 internal banks;
4 groups of 4 banks each
• Fixed burst chop (BC) of 4 and burst length (BL) of 8
via the mode register set (MRS)
• Selectable BC4 or BL8 on-the-fly (OTF)
• Gold edge contacts
• Halogen-free
• Fly-by topology
• Multiplexed command and address bus
• Terminated control, command and address bus
Table 1: Key Timing Parameters
Data Rate (MT/s)
CL =
Speed
Grade
-3S2
-2S9
PC4-
3200
2933
28 –
26
3200
–
t
RCD
t
RP
t
RC
Figure 1: 288-Pin LRDIMM (MO-309, R/C-B1)
Module height: 31.25mm (1.23in)
Options
• Operating temperature
– Commercial (0°C
≤
T
OPER
≤
95°C)
• Package
– 288-pin DIMM (halogen-free)
• Frequency/CAS latency
– 0.62ns @ CL = 26 (DDR4-3200)
– 0.682ns @ CL = 24 (DDR4-2933)
– 0.75ns @ CL = 22 (DDR4-2666)
Marking
None
Z
-3S2
-2S9
-2S6
25
–
2933
24
–
2933
24
2666
2666
22
2666
2666
22
2400
2400
20
2400
2400
20
18
16
14
1600
1600
(ns)
13.75
14.32
(ns)
13.75
14.32
(ns)
45.75
46.32
2133 2133 1866
2133 2133 1866
CMTD-341111752-10426
asq144c16gx72lsz.pdf - Rev. C 3/18 EN
1
Products and specifications discussed herein are subject to change by Micron without notice.
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
128GB (x72, ECC, 3DS 4H Stack, 2 Package Ranks x 4 Logic
Ranks) 288-Pin DDR4 LRDIMM
Features
Table 1: Key Timing Parameters (Continued)
Data Rate (MT/s)
CL =
Speed
Grade
-2S6
-2S3
PC4-
2666
2400
28 –
26
–
–
t
RCD
t
RP
t
RC
25
–
–
24
–
–
24
2666
–
22
2666
–
22
2400
–
20
2400
2400
20
–
18
16
14
1600
1600
(ns)
14.25
15
(ns)
14.25
15
(ns)
46.25
47
2133 2133 1866
2133 1866
Table 2: Addressing
Parameter
Row address
Column address
Device bank group address
Device bank address per group
Device configuration
Logic rank address
Package rank address
128GB
128K A[16:0]
1K A[9:0]
4 BG[1:0]
4 BA[1:0]
32Gb (128 Meg x 4 x 16 banks x4 ranks)
2 C[1:0]
2 CS_n[1:0]
Table 3: Part Numbers and Timing Parameters – 128GB Modules
Base device: MT40A8G4,
1
32Gb DDR4 4H 3DS M/S DRAM
Module
Part Number
2
Density
Configuration
MTA144ASQ16G72LSZ-3S2__
MTA144ASQ16G72LSZ-2S9__
MTA144ASQ16G72LSZ-2S6__
Notes:
128GB
128GB
128GB
16 Gig x 72
16 Gig x 72
16 Gig x 72
Module
Bandwidth
25.6 GB/s
23.47 GB/s
21.3 GB/s
Memory Clock/
Data Rate
0.62ns/3200 MT/s
0.682ns/2933 MT/s
0.75ns/2666 MT/s
Clock Cycles
(CL-
t
RCD-
t
RP)
26-22-22
24-21-21
22-19-19
1. The data sheet for the base device can be found at micron.com.
2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions.
Consult factory for current revision codes. Example: MTA144ASQ16G72LSZ-3S2E1.
CMTD-341111752-10426
asq144c16gx72lsz.pdf - Rev. C 3/18 EN
2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
128GB (x72, ECC, 3DS 4H Stack, 2 Package Ranks x 4 Logic
Ranks) 288-Pin DDR4 LRDIMM
Important Notes and Warnings
Important Notes and Warnings
Micron Technology, Inc. ("Micron") reserves the right to make changes to information published in this document,
including without limitation specifications and product descriptions. This document supersedes and replaces all
information supplied prior to the publication hereof. You may not rely on any information set forth in this docu-
ment if you obtain the product described herein from any unauthorized distributor or other source not authorized
by Micron.
Automotive Applications.
Products are not designed or intended for use in automotive applications unless specifi-
cally designated by Micron as automotive-grade by their respective data sheets. Distributor and customer/distrib-
utor shall assume the sole risk and liability for and shall indemnify and hold Micron harmless against all claims,
costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of
product liability, personal injury, death, or property damage resulting directly or indirectly from any use of non-
automotive-grade products in automotive applications. Customer/distributor shall ensure that the terms and con-
ditions of sale between customer/distributor and any customer of distributor/customer (1) state that Micron
products are not designed or intended for use in automotive applications unless specifically designated by Micron
as automotive-grade by their respective data sheets and (2) require such customer of distributor/customer to in-
demnify and hold Micron harmless against all claims, costs, damages, and expenses and reasonable attorneys'
fees arising out of, directly or indirectly, any claim of product liability, personal injury, death, or property damage
resulting from any use of non-automotive-grade products in automotive applications.
Critical Applications.
Products are not authorized for use in applications in which failure of the Micron compo-
nent could result, directly or indirectly in death, personal injury, or severe property or environmental damage
("Critical Applications"). Customer must protect against death, personal injury, and severe property and environ-
mental damage by incorporating safety design measures into customer's applications to ensure that failure of the
Micron component will not result in such harms. Should customer or distributor purchase, use, or sell any Micron
component for any critical application, customer and distributor shall indemnify and hold harmless Micron and
its subsidiaries, subcontractors, and affiliates and the directors, officers, and employees of each against all claims,
costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of
product liability, personal injury, or death arising in any way out of such critical application, whether or not Mi-
cron or its subsidiaries, subcontractors, or affiliates were negligent in the design, manufacture, or warning of the
Micron product.
Customer Responsibility.
Customers are responsible for the design, manufacture, and operation of their systems,
applications, and products using Micron products. ALL SEMICONDUCTOR PRODUCTS HAVE INHERENT FAIL-
URE RATES AND LIMITED USEFUL LIVES. IT IS THE CUSTOMER'S SOLE RESPONSIBILITY TO DETERMINE
WHETHER THE MICRON PRODUCT IS SUITABLE AND FIT FOR THE CUSTOMER'S SYSTEM, APPLICATION, OR
PRODUCT. Customers must ensure that adequate design, manufacturing, and operating safeguards are included
in customer's applications and products to eliminate the risk that personal injury, death, or severe property or en-
vironmental damages will result from failure of any semiconductor component.
Limited Warranty.
In no event shall Micron be liable for any indirect, incidental, punitive, special or consequential
damages (including without limitation lost profits, lost savings, business interruption, costs related to the removal
or replacement of any products or rework charges) whether or not such damages are based on tort, warranty,
breach of contract or other legal theory, unless explicitly stated in a written agreement executed by Micron's duly
authorized representative.
CMTD-341111752-10426
asq144c16gx72lsz.pdf - Rev. C 3/18 EN
3
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
128GB (x72, ECC, 3DS 4H Stack, 2 Package Ranks x 4 Logic
Ranks) 288-Pin DDR4 LRDIMM
Pin Assignments
Pin Assignments
Table 4: Pin Assignments
288-Pin DDR4 LRDIMM Front
Pin
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
Symbol
NC
V
SS
DQ4
V
SS
DQ0
V
SS
DQS9_t
DQS09_c
V
SS
DQ6
V
SS
DQ2
V
SS
DQ12
V
SS
DQ8
V
SS
DQS10_t
DQS10_c
V
SS
DQ14
V
SS
DQ10
V
SS
DQ20
V
SS
DQ16
V
SS
DQS11_t
DQS11_c
V
SS
DQ22
V
SS
DQ18
V
SS
DQ28
Pin
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
Symbol
V
SS
DQ24
V
SS
DQS12_t
DQS12-c
V
SS
DQ30
V
SS
DQ26
V
SS
CB4
V
SS
CB0
V
SS
DQS17_t
DQS17_c
V
SS
CB6
V
SS
CB2
V
SS
RESET_n
V
DD
CKE0
V
DD
ACT_n
BG0
V
DD
A9
V
DD
A8
A6
V
DD
A3
A1
Pin
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
102
103
104
105
106
107
108
Symbol
V
DD
CK0_t
CK0_c
V
DD
V
TT
EVENT_n
A0
V
DD
BA0
RAS_n/
A16
V
DD
CS0_n
V
DD
CAS_n/
A15
ODT0
V
DD
CS1_n
V
DD
ODT1
V
DD
CS2_n
C0
V
SS
DQ36
V
SS
DQ32
V
SS
DQS13_t
DQS13_c
V
SS
DQ38
V
ss
DQ34
V
SS
DQ44
V
SS
DQ40
Pin
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
Symbol
V
ss
DQS14_t
DQS14_c
V
SS
DQ46
V
SS
DQ42
V
SS
DQ52
V
SS
DQ48
V
SS
DQS15_t
DQS15_c
V
SS
DQ54
V
SS
DQ50
V
SS
DQ60
V
SS
DQ56
V
SS
DQS16_t
DQS16_c
V
SS
DQ62
V
SS
DQ58
V
SS
SA0
SA1
SCL
V
PP
V
PP
NC
Pin
145
146
147
148
149
150
151
152
153
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
Symbol
NC
V
REFCA
V
SS
DQ5
V
SS
DQ1
V
SS
DQS0_c
DQS0_t
V
SS
DQ7
V
SS
DQ3
V
SS
DQ13
V
SS
DQ9
V
SS
DQS1_c
DQS1_t
V
SS
DQ15
V
SS
DQ11
V
SS
DQ21
V
SS
DQ17
V
SS
DQS2_c
DQS2_t
V
SS
DQ23
V
SS
DQ19
V
SS
288-Pin DDR4 LRDIMM Back
Pin
181
182
183
184
185
186
187
188
189
190
191
192
193
194
195
196
197
198
199
200
201
202
203
204
205
206
207
208
209
210
211
212
213
214
215
216
Symbol
DQ29
V
SS
DQ25
V
SS
DQS3_c
DQS3_t
V
SS
DQ31
V
SS
DQ27
V
SS
CB5
V
SS
CB1
V
SS
DQS8_c
DQS8_t
V
SS
CB7
V
SS
CB3
V
SS
CKE1
V
DD
NC
V
DD
BG1
ALERT_n
V
DD
A11
A7
V
DD
A5
A4
V
DD
A2
Pin
217
218
219
220
221
222
223
224
225
226
227
228
229
230
231
232
233
234
235
236
237
238
239
240
241
242
243
244
245
246
247
248
249
250
251
252
Symbol
V
DD
CK1_t
CK1_c
V
DD
V
TT
PARITY
V
DD
BA1
A10_AP
V
DD
NC
WE_n/
A14
V
DD
NC
V
DD
A13
V
DD
A17
NF
C2
V
DD
CS3_n
C1
SA2
V
SS
DQ37
V
SS
DQ33
V
SS
DQS4_c
DQS4_t
V
SS
DQ39
V
SS
DQ35
V
SS
DQ45
V
SS
Pin
253
254
255
256
257
258
259
260
261
262
263
264
265
266
267
268
269
270
271
272
273
274
275
276
277
278
279
280
281
282
283
284
285
286
287
288
Symbol
DQ41
V
SS
DQS5_c
DQS5_t
V
SS
DQ47
V
SS
DQ43
V
SS
DQ53
V
SS
DQ49
V
SS
DQS6_c
DQS6_t
V
SS
DQ55
V
SS
DQ51
V
SS
DQ61
V
SS
DQ57
V
SS
DQS7_c
DQS7_t
V
SS
DQ63
V
SS
DQ59
V
SS
V
DDSPD
SDA
V
PP
V
PP
V
PP
A12_BC_n 101
CMTD-341111752-10426
asq144c16gx72lsz.pdf - Rev. C 3/18 EN
4
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
128GB (x72, ECC, 3DS 4H Stack, 2 Package Ranks x 4 Logic
Ranks) 288-Pin DDR4 LRDIMM
Pin Descriptions
Pin Descriptions
The pin description table below is a comprehensive list of all possible pins for DDR4
modules. All pins listed may not be supported on this module. See Functional Block Di-
agram for pins specific to this module.
Table 5: Pin Descriptions
Symbol
Ax
Type
Input
Description
Address inputs:
Provide the row address for ACTIVATE commands and the column address for
READ/WRITE commands in order to select one location out of the memory array in the respec-
tive bank (A10/AP, A12/BC_n, WE_n/A14, CAS_n/A15, and RAS_n/A16 have additional functions;
see individual entries in this table). The address inputs also provide the op-code during the
MODE REGISTER SET command. A17 is only defined for x4 SDRAM.
Auto precharge:
A10 is sampled during READ and WRITE commands to determine whether an
auto precharge should be performed on the accessed bank after a READ or WRITE operation
(HIGH = auto precharge; LOW = no auto precharge). A10 is sampled during a PRECHARGE com-
mand to determine whether the precharge applies to one bank (A10 LOW) or all banks (A10
HIGH). If only one bank is to be precharged, the bank is selected by the bank group and bank
addresses.
Burst chop:
A12/BC_n is sampled during READ and WRITE commands to determine if burst
chop (on-the-fly) will be performed (HIGH = no burst chop; LOW = burst chopped). See Com-
mand Truth Table in the DDR4 component data sheet.
Command input:
ACT_n defines the ACTIVATE command being entered along with CS_n. The
input into RAS_n/A16, CAS_n/A15, and WE_n/A14 are considered as row address A16, A15, and
A14. See Command Truth Table.
Bank address inputs:
Define the bank (with a bank group) to which an ACTIVATE, READ,
WRITE, or PRECHARGE command is being applied. Also determine which mode register is to be
accessed during a MODE REGISTER SET command.
Bank group address inputs:
Define the bank group to which a REFRESH, ACTIVATE, READ,
WRITE, or PRECHARGE command is being applied. Also determine which mode register is to be
accessed during a MODE REGISTER SET command. BG[1:0] are used in the x4 and x8 configura-
tions. x16-based SDRAM only has BG0.
Chip ID:
These inputs are used only when devices are stacked; that is, 2H, 4H, and 8H stacks for
x4 and x8 configurations using through-silicon vias (TSVs). These pins are not used in the x16
configuration. Some DDR4 modules support a traditional DDP package, which uses CS1_n,
CKE1, and ODT1 to control the second die. All other stack configurations, such as a 4H or 8H,
are assumed to be single-load (master/slave) type configurations where C0, C1, and C2 are used
as chip ID selects in conjunction with a single CS_n, CKE, and ODT. Chip ID is considered part of
the command code.
Clock:
Differential clock inputs. All address, command, and control input signals are sampled
on the crossing of the positive edge of CK_t and the negative edge of CK_c.
Clock enable:
CKE HIGH activates and CKE LOW deactivates the internal clock signals, device
input buffers, and output drivers. Taking CKE LOW provides PRECHARGE POWER-DOWN and
SELF REFRESH operations (all banks idle), or active power-down (row active in any bank). CKE is
asynchronous for self refresh exit. After V
REFCA
has become stable during the power-on and ini-
tialization sequence, it must be maintained during all operations (including SELF REFRESH). CKE
must be maintained HIGH throughout read and write accesses. Input buffers (excluding CK_t,
CK_c, ODT, RESET_n, and CKE) are disabled during power-down. Input buffers (excluding CKE
and RESET_n) are disabled during self refresh.
Chip select:
All commands are masked when CS_n is registered HIGH. CS_n provides external
rank selection on systems with multiple ranks. CS_n is considered part of the command code
(CS2_n and CS3_n are not used on UDIMMs).
A10/AP
Input
A12/BC_n
Input
ACT_n
Input
BAx
Input
BGx
Input
C0, C1, C2
(RDIMM/LRDIMM on-
ly)
Input
CKx_t
CKx_c
CKEx
Input
Input
CSx_n
Input
CMTD-341111752-10426
asq144c16gx72lsz.pdf - Rev. C 3/18 EN
5
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.