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RJH65T14DPQ-A0#T0

Description
IGBT Transistor IGBT for IH 650V 50A TO247
Categorysemiconductor    Discrete semiconductor    The transistor    IGBT transistor   
File Size291KB,11 Pages
ManufacturerRenesas Electronics Corporation
Websitehttps://www.renesas.com/
Environmental Compliance
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RJH65T14DPQ-A0#T0 Overview

IGBT Transistor IGBT for IH 650V 50A TO247

RJH65T14DPQ-A0#T0 Parametric

Parameter NameAttribute value
MakerRenesas Electronics Corporation
Product CategoryIGBT transistor
Package/boxTO-247A-3
Installation styleThrough Hole
ConfigurationSingle
Collector-emitter maximum voltage VCEO650 V
Collector-emitter saturation voltage1.45 V
Gate/emitter maximum voltage+/- 30 V
Continuous collector current at 25 C100 A
Pd-power dissipation250 W
Minimum operating temperature- 55 C
Maximum operating temperature+ 175 C
EncapsulationTube
Collector maximum continuous current Ic100 A
Gate-emitter leakage current+/- 1 uA
Factory packaging quantity1
unit weight6 g
Data Sheet
RJH65T14DPQ-A0
650V - 50A - IGBT
Application: Induction Heating
Microwave Oven
Features
Optimized for current resonance application
Low collector to emitter saturation voltage
V
CE(sat)
= 1.45 V typ. (at I
C
= 50 A, V
GE
= 15 V, Ta = 25
C)
Built in fast recovery diode in one package
Trench gate and thin wafer technology
R07DS1256EJ0110
Rev.1.10
Aug 31, 2018
Outline
RENESAS Package code: PRSS0003ZH-A
(Package name: TO-247A)
C
4
G
1. Gate
2. Collector
3. Emitter
4. Collector
E
1 2
3
Absolute Maximum Ratings
(Tc = 25
C)
Item
Collector to emitter voltage
Gate to emitter voltage
Collector current
Tc = 25
C
Tc = 100
C
Collector peak current
Collector to emitter diode Tc = 25
C
Forward current
Tc = 100
C
Collector to emitter diode forward peak current
Collector dissipation
Junction to case thermal impedance (IGBT)
Junction to case thermal impedance (Diode)
Junction temperature
Storage temperature
Note:
Symbol
V
CES
V
GES
I
C Note1
I
C Note1
i
C
(peak)
Note1
I
DF
I
DF
i
DF
(peak)
Note2
P
C
j-c
Note3
j-cd
Note3
Tj
Note4
Tstg
Ratings
650
30
100
50
180
40
20
100
250
0.6
1.33
175
–55 to +150
Unit
V
V
A
A
A
A
A
A
W
C/W
C/W
°C
°C
Continuous heavy condition (e.g. high temperature/voltage/current or high variation of temperature) may affect a
reliability even if it are within the absolute maximum ratings. Please consider derating condition for appropriate
reliability in reference Renesas Semiconductor Reliability Handbook (Recommendation for Handling and Usage
of Semiconductor Devices) and individual reliability data.
R07DS1256EJ0110 Rev.1.10
Aug 31, 2018
Page 1 of 9

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