LW Reversed Low ESL Chip Multilayer Ceramic Capacitors for General Purpose
LLL153C80G105ME21_ (0204, X6S:EIA, 1uF, DC4V)
_: packaging code
1.Scope
Reference Sheet
This product specification is applied to LW Reversed Low ESL Chip Multilayer Ceramic Capacitors used for General Electronic equipment.
2.MURATA Part NO. System
(Ex.)
LLL
15
(1)L/W
Dimensions
3
(2)T
Dimensions
C8
(3)Temperature
Characteristics
0G
(4)Rated
Voltage
105
(5)Nominal
Capacitance
M
(6)Capacitance
Tolerance
E21
(7)Murata’s Control
Code
D
(8)Packaging Code
3. Type & Dimensions
(1)-1 L
0.5+0.07/-0.03
(1)-2 W
1.0±0.05
(2) T
0.3±0.05
e
0.2±0.06
(Unit:mm)
g
0.07 min.
4.Rated value
(3) Temperature Characteristics
(Public STD Code):X6S(EIA)
Temp. coeff
Temp. Range
or Cap. Change
(Ref.Temp.)
(4)
Rated
Voltage
(6)
(5) Nominal
Capacitance
Capacitance
Tolerance
Specifications and Test
Methods
(Operating
Temp. Range)
-22 to 22 %
-55 to 105 °C
(25 °C)
DC 4 V
1 uF
±20 %
-55 to 105 °C
5.Package
mark
D
J
(8) Packaging
f180mm
Reel
PAPER W8P2
f330mm
Reel
PAPER W8P2
Packaging Unit
10000 pcs./Reel
50000 pcs./Reel
Product specifications in this catalog are as of Jun.9,2017,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
LLL153C80G105ME21-01
1
■
Specifications and Test Methods
No
1
Item
Rated Voltage
Shown in Rated value.
Specification
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
The rated voltage is defined as the maximum voltage
which may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage,
V
P-P
or V
O-P
, whichever is larger, should be maintained
within the rated voltage range.
2
3
4
Appearance
Dimension
Voltage proof
No defects or abnormalities.
Within the specified dimensions.
No defects or abnormalities.
Visual inspection.
Using Measuring instrument of dimension.
Measurement Point :
Test Voltage
:
Applied Time
:
Between the terminations
250% of the rated voltage
1 to 5 s
Charge/discharge current : 50mA max.
5
Insulation Resistance(I.R.)
More than 2000MΩ or 50Ω
∙
F (Whichever is smaller)
Measurement Point
:
Measurement Voltage :
Charging Time
:
Between the terminations
DC Rated Voltage
1 min
Charge/discharge current : 50mA max.
Measurement Temperature :Room Temperature
6
Capacitance
Shown in Rated value.
Measurement Temperature :Room Temperature
Capacitance
C≦10μF
(10V min.)
C≦10μF
(6.3V max.)
C＞10μF
Frequency
1.0+/-0.1kHz
1.0+/-0.1kHz
120+/-24Hz
Voltage
1.0+/-0.2Vrms
0.5+/-0.1Vrms
0.5+/-0.1Vrms
7
Dissipation Factor (D.F.)
0.120 max.
8
Temperature
Characteristics
of Capacitance
No bias
R6 : Within +/-15%
C7 : Within +/-22%
C8 : Within +/-22%
(-55°C to +85°C)
(-55°C to +125°C)
(-55°C to +105°C)
The capacitance change should be measured after 5 min.
at each specified temp. stage.
Capacitance value as a reference is the value in step 3.
· Measurement Voltage :
LLL153 D7 0E/0G 224M only : 0.25+/-0.05Vrms
LLL153 C7 0E/0G 104M only : 0.30+/-0.05Vrms
LLL152R60G105M , LLL152D80E105M only : 0.10+/-0.03Vrms
Step
1
2
3
4
5
Temperature(C)
Reference Temp.+/-2
Min.Operating Temp. +/-3
Reference Temp. +/-2
Max.Operating Temp. +/-3
Reference Temp. +/-2
No bias
Applying Voltage(VDC)
D7 : Within +22/-33% (-55°C to +125°C)
D8 : Within +22/-33% (-55°C to +105°C)
½Initial
measurement
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature,then measure.
9
Adhesive Strength
of Termination
No removal of the terminations or other defect
should occur.
Solder the capacitor on the test substrate (glass epoxy board).
Type
LLL152
LLL153/LLL18
Applied Force(N)
2
5
Holding Time
:
10+/-1s
Applied Direction : In parallel with the test substrate and vertical with
the capacitor side.
Land
Dimensions
Chip Capacitor
Land
c
Type
LLL15
LLL18
b
a
Solder Resist
a
0.2
0.3
Dimension (mm)
b
c
0.8
1.0
1.2
2.0
Fig.1
JEMCFS-01087G
2
No
10 Vibration
Item
Appearance
Capacitance
Specification
No defects or abnormalities.
Within the specified initial value.
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
Solder the capacitor on the test substrate (glass epoxy board).
(Refer to No.9)
Kind of Vibration
Total amplitude
:
:
A simple harmonic motion
10Hz to 55Hz to 10Hz (1min)
1.5mm
D.F.
Within the specified initial value.
This motion should be applied for a period of 2h in each 3 mutually
perpendicular directions(total of 6h).
11 Solderability
75% of the terminations is to be soldered evenly and
continuously.
Test Method
Preheat
Solder
Solder Temp.
Immersion time
:
:
:
:
:
Solder bath method
Solution of rosin ethanol 25(mass)%
80℃ to 120℃ for 10s to 30s
Sn-3.0Ag-0.5Cu
245+/-5℃
2+/-0.5s
Flux :
13 Temperature
Sudden Change
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate (glass epoxy board).
(Refer to No.9)
Perform the 5 cycles according to the four heat treatments
Capacitance
Change
Within +/-12.5%
shown in the following table.
Step
1
Temp.(C)
Min.Operating Temp.+0/-3
Room Temp
Max.Operating Temp.+3/-0
Room Temp
Time
(min)
30+/-3
2 to 3
30+/-3
2 to 3
D.F.
Within the specified initial value.
2
3
4
I.R.
Within the specified initial value.
Exposure Time
:
24+/-2h
Voltage proof No defects.
· Initial measurement
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature,then measure.
14
High
Temperature
High
Humidity
(Steady)
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate (glass epoxy board).
(Refer to No.9)
Test Temperature
:
:
:
:
40+/-2℃
90%RH to 95%RH
500+/-12h
DC Rated Voltage
Capacitance
Change
D.F.
Within +/-12.5%
Test Humidity
Test Time
Applied Voltage
0.2 max.
Charge/discharge current : 50mA max.
· Initial measurement
I.R.
More than 500MΩ or 12.5Ω
∙
F (Whichever is smaller)
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature,then measure.
· Measurement after test
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature,then measure.
15 Durability
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate (glass epoxy board).
(Refer to No.9)
Test Temperature
:
:
:
Max. Operating Temp. +/-3℃
1000+/-12h
150% of the rated voltage
Capacitance
Change
Within +/-12.5%
Test Time
Applied Voltage
Charge/discharge current : 50mA max.
D.F.
0.2 max.
· Initial measurement
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature,then measure.
· Measurement after test
I.R.
More than 1000MΩ or 25Ω
∙
F (Whichever is smaller)
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature,then measure.
JEMCFS-01087G
3
Package
LLL/LLR Type
1.Tape Carrier Packaging(Packaging Code:E/D/L/F/J/K)
1.1 Minimum Quantity(pcs./reel)
φ180mm reel
Paper Tape
Plastic Tape
Code:E/D
Code:L
20000
10000
10000
4000
4000
4000
3000
4000
4000
3000
φ330mm reel
Paper Tape
Plastic Tape
Code:F/J
Code:K
50000
50000
50000
10000
10000
10000
10000
10000
10000
10000
Type
LLL15
LLL1U
LLL18/LLR18
LLL21
5
6
9
5
7
M
2
3
LLL31
JEMCFP-01893D
4
Package
LLL/LLR Type
1.2 Dimensions of Tape
(2)GRMMD/GRM03/GRM15(W8P2
CODE:D/E/J/F)
(1)LLL15/LLL1U
φ1.5
-0
+0.1
*1
3.5±0.05
1.75±0.1
*1,2：2.0±0.05
(in mm)
4.0±0.1
*1,2：
Ａ
8.0±0.3
Ａ
Ｂ
0.05 max.
*2
t
Type
2
LLL15
LLL1U
3
4
L
0.5 +0.07/-0.03
0.5±0.05
0.6±0.05
Dimensions(Chip)
W
1.0±0.05
T
0.2 +0.02/-0.04
0.3±0.05
0.4±0.05
A *3
0.65
0.75
*3 Nominal value
B *3
t
0.8 max.
0.9 max.
1.15
(2)LLL18/LLR18/LLL21/LLL31
(in mm)
2.0±0.1
φ1.5
+0.1
-0
1.75±0.1
4.0±0.1
4.0±0.1
0.2±0.1
3.5±0.05
Ａ
Ｂ
8.0±0.3
1.7 max.
Type
L
0.8±0.1
5
0.8±0.15
1.25±0.1
Dimensions(Chip)
W
1.6±0.1
1.6±0.2
1.6±0.15
2.0±0.1
LLL18
T
0.5 +0/-0.15
0.5 +0.05/-0.1
0.5±0.1
0.5 +0.05/-0.1
0.5 +0/-0.15
0.6±0.1
0.85±0.1
0.5 +0/-0.15
0.7±0.1
1.15±0.1
A *3
1.05±0.10
1.10±0.10
1.05±0.10
1.45±0.20
B *3
1.85±0.10
1.95±0.10
1.85±0.10
2.25±0.20
LLR18
LLL21
6
9
5
7
M
LLR31
1.6±0.15
3.2±0.15
1.90±0.20
*3 Nominal value
3.50±0.20
JEMCFP-01893D
5
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