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A54SX08-P3TQ144

Description
Field Programmable Gate Array, 768 CLBs, 8000 Gates, 350MHz, CMOS, PQFP144, 1.40 MM HEIGHT, MO-136, TQFP-144
CategoryProgrammable logic devices    Programmable logic   
File Size488KB,64 Pages
ManufacturerMicrosemi
Websitehttps://www.microsemi.com
Download Datasheet Parametric View All

A54SX08-P3TQ144 Overview

Field Programmable Gate Array, 768 CLBs, 8000 Gates, 350MHz, CMOS, PQFP144, 1.40 MM HEIGHT, MO-136, TQFP-144

A54SX08-P3TQ144 Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerMicrosemi
package instructionLFQFP,
Reach Compliance Codecompliant
Other featuresCAN ALSO BE OPERATED AT 5V; 12000 SYSTEM GATES ALSO AVAILABLE
maximum clock frequency350 MHz
Combined latency of CLB-Max0.6 ns
JESD-30 codeS-PQFP-G144
JESD-609 codee0
length20 mm
Humidity sensitivity level3
Configurable number of logic blocks768
Equivalent number of gates8000
Number of terminals144
Maximum operating temperature70 °C
Minimum operating temperature
organize768 CLBS, 8000 GATES
Package body materialPLASTIC/EPOXY
encapsulated codeLFQFP
Package shapeSQUARE
Package formFLATPACK, LOW PROFILE, FINE PITCH
Peak Reflow Temperature (Celsius)225
Programmable logic typeFIELD PROGRAMMABLE GATE ARRAY
Certification statusNot Qualified
Maximum seat height1.6 mm
Maximum supply voltage3.6 V
Minimum supply voltage3 V
Nominal supply voltage3.3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTIN LEAD
Terminal formGULL WING
Terminal pitch0.5 mm
Terminal locationQUAD
Maximum time at peak reflow temperature30
width20 mm
v3.2
SX Family FPGAs
u e
Leading Edge Performance
320 MHz Internal Performance
3.7 ns Clock-to-Out (Pin-to-Pin)
0.1 ns Input Setup
0.25 ns Clock Skew
Features
66 MHz PCI
CPLD and FPGA Integration
Single-Chip Solution
100% Resource Utilization with 100% Pin Locking
3.3 V and 5.0 V Operation with 5.0 V Input Tolerance
Very Low Power Consumption
Deterministic, User-Controllable Timing
Unique In-System Diagnostic and Debug Capability
with Silicon Explorer II
Boundary Scan Testing in Compliance with IEEE
Standard 1149.1 (JTAG)
Secure Programming Technology Prevents Reverse
Engineering and Design Theft
Specifications
12,000 to 48,000 System Gates
Up to 249 User-Programmable I/O Pins
Up to 1,080 Flip-Flops
0.35 µ CMOS
SX Product Profile
Device
Capacity
Typical Gates
System Gates
Logic Modules
Combinatorial Cells
Register Cells (Dedicated Flip-Flops)
Maximum User I/Os
Clocks
JTAG
PCI
Clock-to-Out
Input Setup (external)
Speed Grades
Temperature Grades
Packages (by pin count)
PLCC
PQFP
VQFP
TQFP
PBGA
FBGA
A54SX08
8,000
12,000
768
512
256
130
3
Yes
3.7 ns
0.8 ns
Std, –1, –2, –3
C, I, M
84
208
100
144, 176
144
A54SX16
16,000
24,000
1,452
924
528
175
3
Yes
3.9 ns
0.5 ns
Std, –1, –2, –3
C, I, M
208
100
176
A54SX16P
16,000
24,000
1,452
924
528
175
3
Yes
Yes
4.4 ns
0.5 ns
Std, –1, –2, –3
C, I, M
208
100
144, 176
A54SX32
32,000
48,000
2,880
1,800
1,080
249
3
Yes
4.6 ns
0.1 ns
Std, –1, –2, –3
C, I, M
208
144, 176
313, 329
June 2006
© 2006 Actel Corporation
i
See the Actel website for the latest version of the datasheet.

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