EEWORLDEEWORLDEEWORLD

Part Number

Search

P4C167L-12CMB

Description
ULTRA HIGH SPEED 16K X 1 STATIC CMOS RAMS
File Size192KB,10 Pages
ManufacturerPyramid Semiconductor Corporation
Websitehttp://www.pyramidsemiconductor.com/
Download Datasheet View All

P4C167L-12CMB Overview

ULTRA HIGH SPEED 16K X 1 STATIC CMOS RAMS

P4C167/P4C167L
ULTRA HIGH SPEED 16K X 1
STATIC CMOS RAMS
FEATURES
Full CMOS, 6T Cell
High Speed (Equal Access and Cycle Times)
– 10/12/15/20/25 ns (Commercial)
– 12/15/20/25/35 ns (Industrial)
– 15/20/25/35/45 ns (Military)
Low Power Operation
Single 5V±10% Power Supply
Data Retention with 2.0V Supply (P4C167L
Military)
Separate Data I/O
Three-State Output
TTL Compatible Output
Fully TTL Compatible Inputs
Standard Pinout (JEDEC Approved)
– 20-Pin 300 mil DIP
– 20-Pin 300 mil SOJ
– 20-Pin LCC
DESCRIPTION
The P4C167/L are 16,384-bit high speed static RAMs or-
ganized as 16K x 1. The CMOS memories require no clocks
or refreshing and have equal access and cycle times. The
RAMs operate from a single 5V ± 10% tolerance power
supply. Data integrity is maintained for supply voltages
down to 2.0V, typically drawing 10µA.
Access times as fast as 10 nanoseconds are available,
greatly enhancing system speeds. CMOS reduces power
consumption to low levels.
The P4C167/L are available in 20-pin 300 mil DIP, 20-pin
300 mil SOJ, and 20-pin LCC packages providing excel-
lent board level densities.
FUNCTIONAL BLOCK DIAGRAM
PIN CONFIGURATIONS
DIP (P2, C6)
SOJ (J2) SIMILAR
LCC (L9)
Document #
SRAM106
REV A
1
Revised October 2005
LIN bus and its application in automotive hierarchical network 2
Depending on the transmission conditions, message frames can be divided into six types: absolute frames, trigger frames, discrete frames, diagnostic frames, user-defined frames, and reserved frames [2...
frozenviolet Automotive Electronics
Award-winning live broadcast | Azure Sphere helps to provide stable, secure and flexible IoT solutions
With the advent of 5G and the maturity of artificial intelligence technology, the Internet of Things will usher in rapid development, bringing new opportunities and challenges to the entire industry. ...
zqy1111 Industrial Control Electronics
Accelerated life and accelerated degradation test design and data analysis issues
Accelerated life and accelerated degradation tests are important means to solve the reliability problems of high-reliability and long-life products. At present, accelerated life and accelerated degrad...
lynnyong Integrated technical exchanges
Three Trends That Will Determine the Future of Wireless Test Systems
At 7am, you wake up to classic rock music playing on your clock radio. What the hell is that? The RDS-equipped radio screen scrolls with digital text, "Wanted Dead or Alive - John Bon Jovi". While you...
cscl Test/Measurement
Date with Spring---Spring is back, everything is reviving
Spring is back, and everything is reviving. Spring in the Northeast comes later than in the south of the Yangtze River. Just like the current season, flowers are in full bloom, and plants are reviving...
RF-刘海石 Talking
How to use the purge device
[font=微软雅黑][color=#333333]The purge flow meter is mainly a constant flow system device composed of a constant current and a flow meter. It can be divided into two forms: a single meter and a panel. Es...
窗外的麻雀 Test/Measurement

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 1665  1023  2280  2790  497  34  21  46  57  11 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号