low offset voltage and drift. Laser-trimmed offset,
drift and input bias current virtually eliminate the need
for costly external trimming. The high performance
and low cost make them ideally suited to a wide range
of precision instrumentation.
The low quiescent current of the OPA177 dramati-
cally reduce warm-up drift and errors due to thermo-
V+
7
Trim
1
14kΩ
Trim
8
electric effects in input interconnections. It provides
an effective alternative to chopper-stabilized amplifi-
ers. The low noise of the OPA177 maintains accuracy.
OPA177 performance gradeouts are available. Pack-
aging options include 8-pin plastic DIP
and SO-8 surface-mount packages.
25Ω
V
O
6
30Ω
+In
3
500Ω
–In
2
500Ω
20µA
V–
4
International Airport Industrial Park • Mailing Address: PO Box 11400, Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd., Tucson, AZ 85706 • Tel: (520) 746-1111 • Twx: 910-952-1111
Plastic DIP (P), SO-8 (S) ............................................ –65°C to +125°C
Junction Temperature .................................................................... +150°C
Lead Temperature (soldering, 10s) P packages ........................... +300°C
(soldering, 3s) S package ............................... +260°C
Offset Trim
–In
+In
V–
1
2
3
4
8
7
6
5
Offset Trim
V+
V
O
No Internal Connection
PACKAGE/ORDERING INFORMATION
PACKAGE
DRAWING
NUMBER
(1)
006
006
182
TEMPERATURE
RANGE
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
PRODUCT
OPA177FP
OPA177GP
OPA177GS
PACKAGE
8-Pin Plastic DIP
8-Pin Plastic DIP
SO-8 Surface-Mount
ELECTROSTATIC
DISCHARGE SENSITIVITY
Any integrated circuit can be damaged by ESD. Burr-Brown
recommends that all integrated circuits be handled with
appropriate precautions. ESD can cause damage ranging
from subtle performance degradation to complete device
failure. Precision integrated circuits may be more suscep-
tible to damage because very small parametric changes
could cause the device not to meet published specifications.
Burr-Brown’s standard ESD test method consists of five
1000V positive and negative discharges (100pF in series
with 1.5kΩ) applied to each pin.
Failure to observe proper handling procedures could result
in small changes to the OPA177’s input bias current.
NOTE: (1) For detailed drawing and dimension table, please see end of data
sheet, or Appendix C of Burr-Brown IC Data Book.
The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes
no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change
without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant
any BURR-BROWN product for use in life support devices and/or systems.
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