X5R Dielectric
General Specifications
GENERAL DESCRIPTION
• General Purpose Dielectric for Ceramic Capacitors
• EIA Class II Dielectric
• Temperature variation of capacitance is within ±15%
from -55°C to +85°C
•
Well suited for decoupling and filtering applications
•
Available in High Capacitance values (up to 100μF)
PART NUMBER (SEE PAGE 4 FOR COMPLETE PART NUMBER EXPLANATION)
1210
4
D
Dielectric
D = X5R
107
Capacitance
Code (In pF)
2 Sig. Digits +
Number of
Zeros
M
Capacitance
Tolerance
K = ±10%
M = ± 20%
A
Failure
Rate
A = N/A
T
Terminations
T = Plated Ni
and Sn
2
Packaging
2 = 7” Reel
4 = 13” Reel
U = 4mm TR
A
Special
Code
A = Std.
Size
Voltage
(L” x W”)
4 = 4V
0101**
6 = 6.3V
0201
Z = 10V
0402
Y = 16V
0603
3 = 25V
0805
D = 35V
1206
5 = 50V
1210
1 = 100V
1812
**EIA 01005
(01005)
NOTE: Contact factory for availability of Tolerance Options for Specific Part Numbers.
Contact factory for non-specified capacitance values.
TYPICAL ELECTRICAL CHARACTERISTICS
Insulation Resistance (Ohm-Farads)
20
15
10
10,000
Insulation Resistance vs Temperature
% Capacitance
0
-5
-10
-15
-20
-60
-40
-20
0
+20
+40
+60
+80
1,000
100
0
Temperature °C
20
40
60
80
100
120
Temperature °C
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or
available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
121818
25
X5R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Dissipation Factor
X5R Specification Limits
-55ºC to +85ºC
Within specified tolerance
≤ 2.5% for ≥ 50V DC rating
≤ 12.5% for 25V, 35V DC rating
≤ 12.5% Max. for 16V DC rating and lower
Contact Factory for DF by PN
10,000MΩ or 500MΩ - µF,
whichever is less
No breakdown or visual defects
No defects
≤ ±12%
Meets Initial Values (As Above)
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered with
fresh solder
No defects, <25% leaching of either end terminal
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Store in a test chamber set at 85ºC ± 2ºC/ 85%
± 5% relative humidity for 1000 hours (+48, -0)
with rated voltage applied.
Remove from chamber and stabilize at room
temperature and humidity for
24 ± 2 hours before measuring.
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +85ºC ± 2º
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
Dip device in eutectic solder at 260ºC for
60seconds. Store at room temperature for 24 ±
2hours before measuring electrical properties.
Dip device in eutectic solder at 230 ± 5ºC for 5.0
± 0.5 seconds
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10 µF, 0.5Vrms @ 120Hz
Charge device with rated voltage for 120 ± 5
secs @ room temp/humidity
Charge device with 250% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Deflection: 2mm
Test Time: 30 seconds
Insulation Resistance
Dielectric Strength
Appearance
Resistance to
Flexure
Stresses
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Solderability
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Thermal Shock
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Load Life
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Load
Humidity
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Resistance to
Solder Heat
Repeat for 5 cycles and measure after 24 ± 2
hours at room temperature
Charge device with 1.5X rated voltage in test
chamber set at 85ºC ± 2ºC for 1000 hours
(+48, -0).
Note: Contact factory for *optional specification
part numbers that are tested at < 1.5X rated
voltage.
Remove from test chamber and stabilize at
room temperature for 24 ± 2 hours
26
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or
available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
042418
Embedded System
京公网安备 11010802033920号
EEWORLD
