MICROCIRCUIT DATA SHEET
MN100341-X REV 2B0
LOW POWER 8-BIT SHIFT REGISTER
General Description
The F100341 contains eight edge-trigged, D-type flipflops with individual inputs (Pn) and
outputs (Qn) for parallel operation and with serial inputs (Dn) and steering logic for
bidirectional shifting. The flip-flops accept input data a setup time before the
positive-going transistion of the clock pulse and their outputs respond a propagation
delay after the rising clock edge.
The circuit operating mode is determined by the Select inputs S0 and S1, which are
internally decoded to select either "parallel entry" "hold", "shift left" or "shift right"
as described in the Truth Table. All inputs have 50K ohms pull down resistor.
Original Creation Date: 10/04/96
Last Update Date: 05/07/04
Last Major Revision Date: 08/18/99
Industry Part Number
100341
NS Part Numbers
100341DMQB
100341FMQB
100341J-QMLV
100341W-QMLV
100341WFQMLV
Prime Die
F341
Controlling Document
SEE FEATURES SECTION
Processing
MIL-STD-883, Method 5004
Subgrp Description
1
2
3
4
5
6
7
8A
8B
9
10
11
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp (
o
C)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
Quality Conformance Inspection
MIL-STD-883, Method 5005
1
MN100341-X REV 2B0
MICROCIRCUIT DATA SHEET
Features
- 35% power reduction of the 100141
- 2000V ESD protection
- Pin/Function compatible with 100141
- Voltage compensated operating range= -4.2V to -5.7V
- Available to industrial grade temperature range
CONTROLLING DOCUMENTS:
100341DMQB
5962-9459101MXA
100341FMQB
5962-9459101MYA
100341J-QMLV
5962-9459101VXA
100341W-QMLV
5962-9459101VYA
100341WFQMLV
5962F9459101VYA
2
MN100341-X REV 2B0
MICROCIRCUIT DATA SHEET
(Absolute Maximum Ratings)
(Note 1)
Storage Temperature (Tstg)
-65C to +150C
Maximum Junction Temperature (Tj)
Ceramic
Plastic
Vee Pin Potential to Ground Pin
Input Voltage (DC)
Vee to +0.5V
Output Current (DC Output HIGH)
-50 mA
ESD
(Note 2)
>2000V
Note 1:
Note 2:
Absolute maximum ratings are those values beyond which the device may be damaged or
have its useful life impaired. Functional operation under these conditions is not
implied.
ESD testing conforms to MIL-STD-883, Method 3015.
+175C
+150C
-7.0V to +0.5V
Recommended Operating Conditions
Case Temperature (Tc)
Commercial
Industrial
Military
Supply Voltage (Vee)
0 C to +85 C
-40 C to +85C
-55C to +125C
-5.7V to -4.2V
3
MN100341-X REV 2B0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
DC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC: Vee Range: -4.2V to -5.7V, Tc=-55C to +125C, VCC=VCCA=GND
SYMBOL
IIH
PARAMETER
Input HIGH
Current
Input Low Current
Output HIGH
Voltage
Output LOW
Voltage
Output HIGH
Voltage Corner
Point High
Output LOW
Voltage Corner
Point High
Input HIGH
Voltage
Input LOW Voltage
Power Supply
Current
VEE=-4.2/-4.8V
VEE=-5.7V
CONDITIONS
VEE=-5.7V, VM=-0.87V
NOTES
PIN-
NAME
MIN
MAX
240
340
0.5
-870
-870
-1620
-1555
UNIT
uA
uA
uA
mV
mV
mV
mV
mV
mV
-1610
-1555
-1165
-1830
-168
-178
-870
-1475
-55
mV
mV
mV
mV
mA
mA
SUB-
GROUPS
1, 2
3
1, 2,
3
1, 2
3
1, 2
3
1, 2
3
1, 2
3
1, 2,
3
1, 2,
3
1, 2,
3
1, 2,
3
1, 3 INPUTS
1, 3 INPUTS
IIL
VOH
VEE=-4.2V, VM=-1.83V
VEE=-4.2V/-5.7V, VIH=-0.87V,
VIL=-1.83V, LOADING:50 Ohms to -2.0V
Vee=-4.2V/-5.7V, VIH=-0.87V,
VIL=-1.83V, LOADING:50 OHMS to -2.0V
Vee=-4.2V/-5.7V, VIH=-1.165V,
VIL=-1.475V, Loading:50 Ohms to -2.0V
Vee=-4.2V/-5.7V, VIH=-1.165V,
VIL=-1.475V, Loading:50 Ohms to -2.0V
1, 3 INPUTS
1, 3 OUTPUTS -1025
1, 3 OUTPUTS -1085
VOL
1, 3 OUTPUTS -1830
1, 3 OUTPUTS -1830
VOHC
1, 3 OUTPUTS -1035
1, 3 OUTPUTS -1085
1, 3 OUTPUTS
1, 3 OUTPUTS
1,
INPUTS
3, 7
1,
INPUTS
3, 7
1, 3 VEE
1, 3 VEE
VOLC
VIH
VIL
IEE
4
MN100341-X REV 2B0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: VEE Range: -4.2V to -5.7V, LOADING: 50 Ohms to -2.0V, VCC=VCCA=GND
SYMBOL
tpLH/tpHL(
1)
PARAMETER
Propagation Delay
CONDITIONS
VEE=-4.2/-5.7V
NOTES
PIN-
NAME
MIN
0.5
0.5
0.5
0.3
0.6
0.6
1.6
2.4
1.7
0.9
0.9
0.5
2.0
400
300
MAX
2.3
2.8
2.5
1.3
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
SUB-
GROUPS
9
10
11
9, 10,
11
9, 10,
11
9, 10,
11
9
10
11
9, 10,
11
9, 10,
11
9, 10,
11
9, 10,
11
9, 11
10
2, 4 CP to
Qn
2, 4 CP to
Qn
2, 4 CP to
Qn
tTLH/tTHL
tS(1)
tS(2)
tS(3)
Transistion Time
Setup Time
Setup Time
Setup Time
VEE=-4.2/-5.7V
VEE=-4.2/-5.7V
VEE=-4.2/-5.7V
VEE=-4.2/-5.7V
6
6
6
6
6
6
Qn
Dn to
CP
Pn to
CP
Sn to
CP
Sn to
CP
Sn to
CP
Dn to
CP
Pn to
CP
Sn to
CP
CP
CP
CP
tH(1)
tH(2)
tH(3)
tPW(H)
fmax
Hold Time
Hold Time
Hold Time
Pulse Width
Maximum Clock
Frequency
Note 1:
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
VEE=-4.2/-5.7V
VEE=-4.2/-5.7V
VEE=-4.2/-5.7V
VEE= -4.2/-5.7V
VEE= -4.2/-5.7V
6
6
6
6
6
6
Screen tested 100% on each device at +25C, +125C and -55C temperature, subgroups 1,
2, 3, 7 & 8.
For QB devices, screen tested 100% on each device at +25C temperature only, subgroup
A9. For QMLV devices, screen tested 100% on each device at +25C, +125C & -55C
temperature, subgroups A9, 10 & 11.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125 & -55C
temperature, subgroups A1, 2, 3, 7 & 8.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C temperature, subgroup
A9, and at +125C & -55C temperature, subgroups A10 & 11.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C temperature only,
subgroup A9.
Not tested at +25C, +125C & -55C temperature (DESIGN CHARACTERIZATION DATA).
Guaranteed by applying specified input condition and testing VOH/VOL.
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