EEWORLDEEWORLDEEWORLD

Part Number

Search

NRSH122M35V10X23F

Description
CAPACITOR, ALUMINUM ELECTROLYTIC, NON SOLID, POLARIZED, 35 V, 390 uF, THROUGH HOLE MOUNT
CategoryPassive components   
File Size70KB,3 Pages
ManufacturerNIC
Websitehttps://www.niccomp.com
Download Datasheet Parametric View All

NRSH122M35V10X23F Overview

CAPACITOR, ALUMINUM ELECTROLYTIC, NON SOLID, POLARIZED, 35 V, 390 uF, THROUGH HOLE MOUNT

NRSH122M35V10X23F Parametric

Parameter NameAttribute value
negative deviation20 %
Minimum operating temperature-40 Cel
Maximum operating temperature105 Cel
positive deviation20 %
Rated DC voltage urdc35 V
Processing package descriptionRADIAL LEAD, ROHS COMPLIANT
each_compliYes
EU RoHS regulationsYes
China RoHS regulationsYes
stateActive
Capacitor typeALUMINUM ELECTROLYTIC CAPACITOR
capacitance390 µF
dielectric materialsALUMINUM
esr__mohm_29
jesd_609_codee3
leakage_current__ma_.1365
Manufacturer SeriesNRSH
Installation featuresTHROUGH HOLE MOUNT
packaging shapeCYLINDRICAL PACKAGE
Package SizeRadial
cking_methodAMMO PACK
polarityPOLARIZED
ipple_current__ma_1500
seriesNRSH
tangent angle0.12
terminal coatingMATTE TIN
Terminal spacing3.5 mm
Terminal shapeWIRE
diameter8 mm
length20 mm
Miniature Aluminum Electrolytic Capacitors
HIGH TEMPERATURE, EXTENDED LOAD LIFE, RADIAL LEADS, POLARIZED
FEATURES
• IMPROVED ENDURANCE AT HIGH TEMPERATURE
(up to 10,000HRS @ 105°C)
• LOW IMPEDANCE & HIGH RIPPLE CURRENT RATINGS
includes all homogeneous materials
• NEW REDUCED SIZES
NRSH Series
RoHS
Compliant
CHARACTERISTICS
Rated Voltage Range
Capacitance Range
Operating Temperature Range
Capacitance Tolerance
Maximum Leakage Current
After 2 minutes
W.V. (Vdc)
S.V. (Vdc)
C < 1,000µF
C = 1,200µF
C = 1,500µF
C = 2,200µF
C = 2,700µF
Max. Tan
δ
at 120Hz/20°C
C = 3,300µF
C = 3,900µF
C = 4,700µF
C = 5,600µF
C = 6,800µF
C = 8,200µF
Z-25°C/Z+20°C
Low Temperature Stability
Impedance Ratio @ 120Hz
Z-40°C/Z+20°C
Duration
Capacitance
Load Life Test
@ 105°C
Tan
δ
LC
*See Part Number System for Details
6.3 ~ 50VDC
27 ~ 8,200µF
-40°C ~ +105°C
±20% (M)
0.01CV or 3µA whichever is greater
6.3
10
16
25
35
50
8
13
20
32
44
63
0.22
0.19
0.16
0.14
0.12
0.10
0.22
0.19
0.16
0.14
0.12
-
0.22
0.19
0.16
0.14
0.12
-
0.24
0.21
0.18
0.16
0.14
-
0.24
0.21
0.18
0.16
-
-
0.26
0.23
0.20
0.18
-
-
0.26
0.23
0.20
-
-
-
0.28
0.25
0.22
-
-
-
0.30
0.27
-
-
-
-
0.32
0.29
-
-
-
-
0.36
-
-
-
-
-
2
2
2
2
2
2
3
3
3
3
3
3
φ
D = 6.3: 6,000 hours,
φ
D = 8: 8,000 hours,
φ
D = 10>: 10,000 hours
Within ±25% of initial measured value
Less than 200% of specified value
Less than specified value
PART NUMBER SYSTEM
NRSH 561 M 35V 10X20 F
.
RoHS Compliant
Case Size (Dφ x L)
Working Voltage (Vdc)
Tolerance Code (M=20%)
Capacitance Code: First 2 characters
significant, third character is multiplier
Series
®
NIC COMPONENTS CORP.
www.niccomp.com
www.lowESR.com
www.RFpassives.com
www.SMTmagnetics.com
77
C implementation of incremental pid algorithm in msp430 microcontroller
#include  #include  struct _pid {    int pv; /*integer that contains the process value*/    int sp; /*integer that contains the set point*/    float integral;    float pgain;    float igain;    float ...
灞波儿奔 Microcontroller MCU
How to emulate ROM generated by ISE
The simulation of Xilinx's ROM in modelsim fails, and it says that the .mif file cannot be read!!!...
vbeau FPGA/CPLD
【Video】HPS access FPGA experiment
[media=swf,500,375]http://player.youku.com/player.php/sid/XNzI3NjE0MjEy/v.swf[/media]...
chenzhufly FPGA/CPLD
How do I view global static variables (local variables seem simple) when debugging in VS2005? View memory? How do I calculate the address of global static variables in memory?
How do I view global static variables (local variables seem simple) when debugging in VS2005? Look at the memory? How do I calculate the address of global static variables in memory? Look at the MAP f...
filter Embedded System
FPGA embedded system design.part1.rar
FPGA embedded system design.part1.rar...
zxopenljx FPGA/CPLD
How to improve interview success rate?
We have worked for many years, met countless people and companies. How to improve the success rate of interviews? I believe everyone has experience. Let's share our experience for those who come after...
eeleader Talking about work

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 1367  2009  2471  521  2540  28  41  50  11  52 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号