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MT58V512V36PF-6

Description
Cache SRAM, 512KX36, 3.5ns, CMOS, PBGA165, 13 X 15 MM, FBGA-165
Categorystorage    storage   
File Size535KB,34 Pages
ManufacturerCypress Semiconductor
Download Datasheet Parametric View All

MT58V512V36PF-6 Overview

Cache SRAM, 512KX36, 3.5ns, CMOS, PBGA165, 13 X 15 MM, FBGA-165

MT58V512V36PF-6 Parametric

Parameter NameAttribute value
Is it lead-free?Contains lead
Is it Rohs certified?incompatible
MakerCypress Semiconductor
Parts packaging codeBGA
package instructionTBGA,
Contacts165
Reach Compliance Codecompliant
ECCN code3A991.B.2.A
Is SamacsysN
Maximum access time3.5 ns
Other featuresPIPELINED ARCHITECTURE
JESD-30 codeR-PBGA-B165
JESD-609 codee0
length15 mm
memory density18874368 bit
Memory IC TypeCACHE SRAM
memory width36
Humidity sensitivity level3
Number of functions1
Number of terminals165
word count524288 words
character code512000
Operating modeSYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize512KX36
Package body materialPLASTIC/EPOXY
encapsulated codeTBGA
Package shapeRECTANGULAR
Package formGRID ARRAY, THIN PROFILE
Parallel/SerialPARALLEL
Peak Reflow Temperature (Celsius)220
Certification statusNot Qualified
Maximum seat height1.2 mm
Maximum supply voltage (Vsup)2.625 V
Minimum supply voltage (Vsup)2.375 V
Nominal supply voltage (Vsup)2.5 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTIN LEAD
Terminal formBALL
Terminal pitch1 mm
Terminal locationBOTTOM
Maximum time at peak reflow temperatureNOT SPECIFIED
width13 mm
Base Number Matches1
18Mb: 1 MEG x 18, 512K x 32/36
PIPELINED, SCD SYNCBURST SRAM
18Mb
SRAM
Features
SYNCBURST
MT58L1MY18P, MT58V1MV18P,
MT58L512Y32P, MT58V512V32P,
MT58L512Y36P, MT58V512V36P
3.3V V
DD
, 3.3V or 2.5V I/O; 2.5V V
DD
, 2.5V I/O
• Fast clock and OE# access times
• Single 3.3V ±5 percent or 2.5V ±5 percent power
supply
• Separate 3.3V ±5 percent or 2.5V ±5 percent isolated
output buffer supply (V
DD
Q)
• SNOOZE MODE for reduced-power standby
• Single-cycle deselect (Pentium
®
BSRAM-
compatible)
• Common data inputs and data outputs
• Individual byte write control and global write
• Three chip enables for simple depth expansion and
address pipelining
• Clock-controlled and registered addresses, data
I/Os, and control signals
• Internally self-timed WRITE cycle
• Burst control (interleaved or linear burst)
• Low capacitive bus loading
Figure 1: 100-Pin TQFP
JEDEC-Standard MS-026 BHA (LQFP)
Figure 2: 165-Ball FBGA
JEDEC-Standard MS-216 (Var. CAB-1)
Options
• Timing (Access/Cycle/MHz)
3.1ns/5ns/200 MHz
3.5ns/6ns/166 MHz
4.2ns/7.5ns/133 MHz
5ns/10ns/100 MHz
• Configurations
3.3V V
DD
, 3.3V or 2.5V I/O
1 Meg x 18
512K x 32
512K x 36
2.5V V
DD
, 2.5V I/O
1 Meg x 18
512K x 32
512K x 36
• Packages
100-pin TQFP
165-ball, 13mm x 15mm FBGA
• Operating Temperature Range
Commercial (0ºC
£
T
A
£
+70ºC)
Industrial (-40ºC
£
T
A
£
+85ºC)
NOTE:
TQFP
Marking
-5
-6
-7.5
-10
MT58L1MY18P
MT58L512Y32P
MT58L512Y36P
MT58V1MV18P
MT58V512V32P
MT58V512V36P
T
F
1
None
IT
2
Part Number Example:
MT58L512Y36PT-10
General Description
The Micron
®
SyncBurst™ SRAM family employs
high-speed, low-power CMOS designs that are fabri-
cated using an advanced CMOS process.
Micron’s 18Mb SyncBurst SRAMs integrate a 1 Meg x
18, 512K x 32, or 512K x 36 SRAM core with advanced
synchronous peripheral circuitry and a 2-bit burst
counter. All synchronous inputs pass through registers
controlled by a positive-edge-triggered single-clock
input (CLK). The synchronous inputs include all
addresses, all data inputs, active LOW chip enable
(CE#), two additional chip enables for easy depth
expansion (CE2, CE2#), burst control inputs (ADSC#,
1
©2003 Micron Technology, Inc.
1. A Part Marking Guide for the FBGA devices can be found on
Micron’s Web site—http://www.micron.com/numberguide.
2. Contact factory for availability of Industrial Temperature
devices.
18Mb: 1 Meg x 18, 512K x 32/36, Pipelined, SCD SyncBurst SRAM
MT58L1MY18P1_16_D.fm – Rev. D, Pub 2/03
PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.
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