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GVT71256DA36T-6.7

Description
Standard SRAM, 256KX36, 4.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
Categorystorage    storage   
File Size320KB,27 Pages
ManufacturerCypress Semiconductor
Download Datasheet Parametric View All

GVT71256DA36T-6.7 Overview

Standard SRAM, 256KX36, 4.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100

GVT71256DA36T-6.7 Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
Parts packaging codeQFP
package instruction14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
Contacts100
Reach Compliance Codecompliant
ECCN code3A991.B.2.A
Is SamacsysN
Maximum access time4.5 ns
Maximum clock frequency (fCLK)150 MHz
I/O typeCOMMON
JESD-30 codeR-PQFP-G100
JESD-609 codee0
length20 mm
memory density9437184 bit
Memory IC TypeSTANDARD SRAM
memory width36
Humidity sensitivity level3
Number of functions1
Number of terminals100
word count262144 words
character code256000
Operating modeSYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize256KX36
Output characteristics3-STATE
Package body materialPLASTIC/EPOXY
encapsulated codeLQFP
Encapsulate equivalent codeQFP100,.63X.87
Package shapeRECTANGULAR
Package formFLATPACK, LOW PROFILE
Parallel/SerialPARALLEL
Peak Reflow Temperature (Celsius)NOT SPECIFIED
power supply2.5/3.3,3.3 V
Certification statusNot Qualified
Maximum seat height1.6 mm
Maximum standby current0.01 A
Minimum standby current3.14 V
Maximum slew rate0.38 mA
Maximum supply voltage (Vsup)3.63 V
Minimum supply voltage (Vsup)3.135 V
Nominal supply voltage (Vsup)3.3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTin/Lead (Sn/Pb)
Terminal formGULL WING
Terminal pitch0.65 mm
Terminal locationQUAD
Maximum time at peak reflow temperatureNOT SPECIFIED
width14 mm
Base Number Matches1
PRELIMINARY
CY7C1360A1/GVT71256DA36
CY7C1362A1/GVT71512DA18
256K x 36/512K x 18 Pipelined SRAM
Features
Fast access times: 2.5 ns, 3.0 ns, and 3.5 ns
Fast clock speed: 225, 200, 166, and 150 MHz
Fast OE access times: 2.5 ns, 3.0 ns, and 3.5 ns
Optimal for depth expansion (one cycle chip deselect
to eliminate bus contention)
3.3V –5% and +10% power supply
3.3V or 2.5V I/O supply
5V tolerant inputs except I/Os
Clamp diodes to V
SS
at all inputs and outputs
Common data inputs and data outputs
Byte Write Enable and Global Write control
Multiple chip enables for depth expansion:
three chip enables for TA(GVTI)/A(CY) package version
and two chip enables for B(GVTI)/BG(CY) and
T(GVTI)/AJ(CY) package versions
Address pipeline capability
Address, data, and control registers
Internally self-timed Write Cycle
Burst control pins (interleaved or linear burst se-
quence)
Automatic power-down for portable applications
JTAG boundary scan for B(GVTI)/BG(CY) and
T(GVTI)/AJ(CY) package version
Low profile 119-bump, 14-mm x 22-mm PBGA (Ball Grid
Array) and 100-pin TQFP packages
eral circuitry and a 2-bit counter for internal burst operation. All
synchronous inputs are gated by registers controlled by a pos-
itive-edge-triggered Clock Input (CLK). The synchronous in-
puts include all addresses, all data inputs, address-pipelining
Chip Enable (CE), depth-expansion Chip Enables (CE
2
and
CE
2
), burst control inputs (ADSC, ADSP and ADV), Write En-
,
ables (BWa, BWb, BWc, BWd, and BWE), and global write
(GW). However, the CE
2
chip enable input is only available for
TA(GVTI)/A(CY) package version.
Asynchronous inputs include the Output Enable (OE) and
burst mode control (MODE). The data outputs (Q), enabled by
OE, are also asynchronous.
Addresses and chip enables are registered with either Ad-
dress Status Processor (ADSP) or Address Status Controller
(ADSC) input pins. Subsequent burst addresses can be inter-
nally generated as controlled by the Burst Advance Pin (ADV).
Address, data inputs, and write controls are registered on-chip
to initiate self-timed WRITE cycle. WRITE cycles can be one
to four bytes wide as controlled by the write control inputs.
Individual byte write allows individual byte to be written. BWa
controls DQa. BWb controls DQb. BWc controls DQc. BWd
controls DQd. BWa, BWb, BWc, and BWd can be active only
with BWE being LOW. GW being LOW causes all bytes to be
written. The x18 version only has 18 data inputs/outputs (DQa
and DQb) along with BWa and BWb (no BWc, BWd, DQc, and
DQd).
For the B(GVTI)/BG(CY) and T(GVTI)/AJ(CY) package ver-
sions, four pins are used to implement JTAG test capabilities:
Test Mode Select (TMS), Test Data-In (TDI), Test Clock (TCK),
and Test Data-Out (TDO). The JTAG circuitry is used to serially
shift data to and from the device. JTAG inputs use
LVTTL/LVCMOS levels to shift data during this testing mode of
operation. The TA package version does not offer the JTAG
capability.
The CY7C1360A1/GVT71256DA36 and CY7C1362A1/
GVT71512DA18 operate from a +3.3V power supply. All inputs
and outputs are LVTTL compatible.
Functional Description
The Cypress Synchronous Burst SRAM family employs
high-speed, low power CMOS designs using advanced tri-
ple-layer polysilicon, double-layer metal technology. Each
memory cell consists of four transistors and two high valued
resistors.
The CY7C1360A1/GVT71256DA36 and CY7C1362A1/
GVT71512DA18 SRAMs integrate 262,144x36 and
524,288x18 SRAM cells with advanced synchronous periph-
Selection Guide
7C1360A1-225
71256DA36-4.4
7C1362A1-225
71512DA18-4.4
Maximum Access Time (ns)
Maximum Operating Current (mA)
Maximum CMOS Standby Current (mA)
Commercial
2.5
570
10
7C1360A1-200
71256DA36-5
7C1362A1-200
71512DA18-5
3.0
510
10
7C1360A1-166
71256DA36-6
7C1362A1-166
71512DA18-6
3.5
425
10
7C1360A1-150
71256DA36-6.7
7C1362A1-150
71512DA18-6.7
3.5
380
10
Cypress Semiconductor Corporation
3901 North First Street
San Jose
CA 95134
408-943-2600
May 18, 2000

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