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A42MX09-2PLG84MX39

Description
Field Programmable Gate Array, 684-Cell, CMOS, PQCC84,
CategoryProgrammable logic devices    Programmable logic   
File Size3MB,115 Pages
ManufacturerMicrosemi
Websitehttps://www.microsemi.com
Environmental Compliance
Download Datasheet Parametric View All

A42MX09-2PLG84MX39 Overview

Field Programmable Gate Array, 684-Cell, CMOS, PQCC84,

A42MX09-2PLG84MX39 Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
package instructionQCCJ, LDCC84,1.2SQ
Reach Compliance Codecompliant
JESD-30 codeS-PQCC-J84
Humidity sensitivity level3
Number of entries104
Number of logical units684
Output times104
Number of terminals84
Maximum operating temperature125 °C
Minimum operating temperature-55 °C
Package body materialPLASTIC/EPOXY
encapsulated codeQCCJ
Encapsulate equivalent codeLDCC84,1.2SQ
Package shapeSQUARE
Package formCHIP CARRIER
power supply3.3,3.3/5,5 V
Programmable logic typeFIELD PROGRAMMABLE GATE ARRAY
Certification statusNot Qualified
surface mountYES
technologyCMOS
Temperature levelMILITARY
Terminal formJ BEND
Terminal pitch1.27 mm
Terminal locationQUAD
Base Number Matches1
5.1
40MX and 42MX FPGA Families
Fe a t ur es
High C apaci t y
Single-Chip ASIC Alternative
3,000 to 54,000 System Gates
Up to 2.5 kbits Configurable Dual-Port SRAM
Fast Wide-Decode Circuitry
Up to 202 User-Programmable I/O Pins
5.6 ns Clock-to-Out
250 MHz Performance
5 ns Dual-Port SRAM Access
100 MHz FIFOs
7.5 ns 35-Bit Address Decode
• Commercial, Military Temperature and MIL-STD-883
Ceramic Packages
• QML Certification
• Ceramic Devices Available to DSCC SMD
E ase of Int egr at io n
• Mixed Voltage Operation (5.0V or 3.3V I/O)
• Synthesis-Friendly Architecture to Support ASIC Design
Methodologies
• Up to 100% Resource Utilization and 100% Pin Fixing
• Deterministic, User-Controllable Timing
• Unique In-System Diagnostic and Verification Capability
with Silicon Explorer II
• Low Power Consumption
• IEEE Standard 1149.1 (JTAG) Boundary Scan Testing
• 5.0V and 3.3V Programmable PCI-Compliant I/O
High P er f or m ance
HiR el Feat ur es
• Commercial, Industrial, and Military Temperature Plastic
Packages
Pr od uc t P r o f i l e
Device
Capacity
A40MX02
A40MX04
A42MX09
A42MX16
A42MX24
A42MX36
System Gates
SRAM Bits
Logic Modules
3,000
N/A
295
9.5 ns
N/A
147
1
57
No
No
44, 68
100
80
6,000
N/A
547
9.5 ns
N/A
273
1
69
No
No
44, 68, 84
100
80
14,000
N/A
348
336
N/A
5.6 ns
N/A
348
516
2
104
No
No
84
100, 160
100
176
24,000
N/A
624
608
N/A
6.1 ns
N/A
624
928
2
140
No
No
84
100, 160, 208
100
176
36,000
N/A
954
912
24
6.1 ns
N/A
954
1,410
2
176
Yes
Yes
84
160, 208
176
54,000
2,560
1,230
1,184
24
6.3 ns
10
1,230
1,822
6
202
Yes
Yes
208, 240
208, 256
272
Sequential
Combinatorial
Decode
Clock-to-Out
SRAM Modules
(64x4 or 32x8)
Dedicated Flip-Flops
Maximum Flip-Flops
Clocks
User I/O
(Maximum)
PCI
Boundary Scan Test (BST)
Packages
(by pin count)
PLCC
PQFP
VQFP
TQFP
CQFP
PBGA
O c t o be r 2 0 0 3
1
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